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公开(公告)号：US20240319108A1
公开(公告)日：2024-09-26
申请号：US18679435
申请日：2024-05-30
Applicant: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
Inventor： Xiaoyun Fan , Ruixiang Hu , Yuanqiao Fu , Wu CHEN , Chongxi Wang , Jiebin Huang , Jingyu Hu , Yanming Wang , Yuan Wang , Guotao Xie
CPC classification number: G01N21/89 , G01N21/95 , G01N2201/1087
Abstract: This application provides a cell detection method, device and system as well as a processor and a controller. The cell detection method may include: obtaining target detection data of a target cell; and determining a detection result of the target cell based on the target detection data and standard data. The cell detection method improves the detection efficiency and detection effect of the cells.
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公开(公告)号：US20240044863A1
公开(公告)日：2024-02-08
申请号：US18365867
申请日：2023-08-04
Applicant: Applied Materials, Inc.
Inventor： Christopher Bencher
IPC: G01N33/483 , G01N21/17
CPC classification number: G01N33/4833 , G01N21/17 , G01N2021/1787 , G01N2201/1087
Abstract: An imaging system for capturing spatial images of biological tissue samples may include an imaging chamber configured to hold a biological tissue sample placed in the imaging system; a light source configured to illuminate the biological tissue sample to activate one or more fluorophores in the biological tissue sample; a Time Delay and Integration (TDI) imager comprising a plurality of partitions, where the plurality of partitions may be configured to capture images at a plurality of different depths in the biological tissue sample simultaneously during a scan by the TDI imager; and a controller configured to cause the TDI imager to scan the biological tissue sample.
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公开(公告)号：US20230271199A1
公开(公告)日：2023-08-31
申请号：US18313639
申请日：2023-05-08
Applicant: SpinChip Diagnostics AS
Inventor： Ole Christian TRONRUD , Rolf Jahren , Sebastian Stenmark , Stig Morten Borch
CPC classification number: B04B13/00 , B01L3/502715 , B01L3/50273 , B04B5/02 , G01N21/07 , G01N35/00069 , G01N35/04 , B01L2200/0647 , B01L2200/143 , B01L2300/0803 , B01L2400/0409 , G01N2035/0491 , G01N2201/06113 , G01N2201/1087
Abstract: Provided are methods and apparatuses for controlling a position of a target point on a processing result relative to a focus point of a focusing sensor system for determining properties of the processing result. The method includes the steps of determining an initial focus point of the focusing sensor system, controlling rotation of the cartridge and disc, checking whether the initial focus point of the focusing sensor system corresponds to the target point on the processing result, comparing (x, y) target positions in captured images with the initial focus point of the focusing sensor system, adjusting rotation of the cartridge and disc such that the focus point of the focusing sensor system corresponds to the target point on the processing result, and detecting and examining signals received from the focusing sensor system for determining properties of the processing result.
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公开(公告)号：US20180024067A1
公开(公告)日：2018-01-25
申请号：US15665095
申请日：2017-07-31
Applicant: The Regents of the University of California , The Board of Trustees of the Leland Stanford Junior University
Inventor： Carl D. Meinhart , Brian Piorek , Seung Joon Lee , Martin Moskovits , Sanjoy Banerjee , Juan Santiago
CPC classification number: G01N21/658 , G01N21/0332 , G01N21/05 , G01N33/0057 , G01N2021/0346 , G01N2201/06113 , G01N2201/1087 , Y10S977/902
Abstract: Provided are methods, devices and systems that utilize free-surface fluidics and SERS for analyte detection with high sensitivity and specificity. The molecules can be airborne agents, including but not limited to explosives, narcotics, hazardous chemicals, or other chemical species. The free-surface fluidic architecture is created using an open microchannel, and exhibits a large surface to volume ratio. The free-surface fluidic interface can filter interferent molecules, while concentrating airborne analyte molecules. The microchannel flow enables controlled aggregation of SERS-active probe particles in the flow, thereby enhancing the detector's sensitivity.
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公开(公告)号：US20150355016A1
公开(公告)日：2015-12-10
申请号：US14730762
申请日：2015-06-04
Applicant: SAMCO INC.
Inventor： Kiyoshi HASEGAWA , Hiroshi KAWAMURA , Peter WOOD
CPC classification number: G01J1/0238 , G01J1/4257 , G01N21/55 , G01N2021/8427 , G01N2201/025 , G01N2201/1087
Abstract: The present invention provides a light beam measuring instrument that can securely receive light reflected by a sample. The light beam measuring instrument 1 includes an optical axis tilting mechanism 13 that includes a first tilting mechanism 131 and a second tilting mechanism 132. From the optical axis A1 of irradiation light beam emitted from a light beam source 112, the first tilting mechanism 131 tilts the optical axis A1 about the first tilting axis T1. The second tilting mechanism 132 tilts the optical axis A1 about the second tilting axis T2. The light beam measuring instrument 1 can receive the light reflected by the semiconductor chip C by means of operation of the optical axis tilting mechanism 13 even if the light reflected by the semiconductor chip C is tilted. Accordingly, this apparatus can securely perform measurement or inspection using the light beam.
Abstract translation: 本发明提供了一种可以安全地接收由样品反射的光的光束测量仪器。 光束测量仪1包括光轴倾斜机构13，其包括第一倾斜机构131和第二倾斜机构132.从光束源112发射的照射光束的光轴A1，第一倾斜机构131倾斜 围绕第一倾斜轴线T1的光轴A1。 第二倾斜机构132围绕第二倾斜轴T2倾斜光轴A1。 即使由半导体芯片C反射的光倾斜，光束测量仪器1也可以通过光轴倾斜机构13的操作来接收由半导体芯片C反射的光。 因此，该装置可以可靠地执行使用光束的测量或检查。
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Patent Agency Ranking
公开(公告)号：US09097676B2
公开(公告)日：2015-08-04
申请号：US13872778
申请日：2013-04-29
Applicant: The Regents of the University of California , The Board of Trustees of the Leland Stanford Junior University
Inventor： Carl D. Meinhart , Brian Piorek , Seung Joon Lee , Martin Moskovits , Sanjoy Banerjee , Juan Santiago
CPC classification number: G01N21/658 , G01N21/0332 , G01N21/05 , G01N33/0057 , G01N2021/0346 , G01N2201/06113 , G01N2201/1087 , Y10S977/902
Abstract: Provided are methods, devices and systems that utilize free-surface fluidics and SERS for analyte detection with high sensitivity and specificity. The molecules can be airborne agents, including but not limited to explosives, narcotics, hazardous chemicals, or other chemical species. The free-surface fluidic architecture is created using an open microchannel, and exhibits a large surface to volume ratio. The free-surface fluidic interface can filter interferent molecules, while concentrating airborne analyte molecules. The microchannel flow enables controlled aggregation of SERS-active probe particles in the flow, thereby enhancing the detector's sensitivity.
Abstract translation: 提供了利用自由表面流体学和SERS用于具有高灵敏度和特异性的分析物检测的方法，装置和系统。 分子可以是空气传播剂，包括但不限于爆炸物，麻醉剂，危险化学品或其他化学物质。 自由表面流体结构使用开放的微通道产生，并且表现出大的表面与体积比。 自由表面流体界面可以过滤干扰分子，同时浓缩空气中的分析物。 微通道流动使SERS活性探针颗粒在流动中受控聚集，从而提高检测器的灵敏度。
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公开(公告)号：US20130121884A1
公开(公告)日：2013-05-16
申请号：US13564698
申请日：2012-08-01
Applicant: Carl Meinhart , Brian Piorek , Seung Joon Lee , Martin Moskovits , Sanjoy Banerjee , Juan Santiago
Inventor： Carl Meinhart , Brian Piorek , Seung Joon Lee , Martin Moskovits , Sanjoy Banerjee , Juan Santiago
IPC: G01N21/65
CPC classification number: G01N21/658 , G01N21/0332 , G01N21/05 , G01N33/0057 , G01N2021/0346 , G01N2201/06113 , G01N2201/1087 , Y10S977/902
Abstract: Provided are methods, devices and systems that utilize free-surface fluidics and SERS for analyte detection with high sensitivity and specificity. The molecules can be airborne agents, including but not limited to explosives, narcotics, hazardous chemicals, or other chemical species. The free-surface fluidic architecture is created using an open microchannel, and exhibits a large surface to volume ratio. The free-surface fluidic interface can filter interferent molecules, while concentrating airborne analyte molecules. The microchannel flow enables controlled aggregation of SERS-active probe particles in the flow, thereby enhancing the detector's sensitivity.
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公开(公告)号：US20120148451A1
公开(公告)日：2012-06-14
申请号：US13217616
申请日：2011-08-25
Applicant: Carl Meinhart , Brian Piorek , Seung Joon Lee , Martin Moskovits , Sanjoy Banerjee , Juan Santiago
Inventor： Carl Meinhart , Brian Piorek , Seung Joon Lee , Martin Moskovits , Sanjoy Banerjee , Juan Santiago
IPC: G01N21/65
CPC classification number: G01N21/658 , G01N21/0332 , G01N21/05 , G01N33/0057 , G01N2021/0346 , G01N2201/06113 , G01N2201/1087 , Y10S977/902
Abstract: Provided are methods, devices and systems that utilize free-surface fluidics and SERS for analyte detection with high sensitivity and specificity. The molecules can be airborne agents, including but not limited to explosives, narcotics, hazardous chemicals, or other chemical species. The free-surface fluidic architecture is created using an open microchannel, and exhibits a large surface to volume ratio. The free-surface fluidic interface can filter interferent molecules, while concentrating airborne analyte molecules. The microchannel flow enables controlled aggregation of SERS-active probe particles in the flow, thereby enhancing the detector's sensitivity.
Abstract translation: 提供了利用自由表面流体学和SERS用于具有高灵敏度和特异性的分析物检测的方法，装置和系统。 分子可以是空气传播剂，包括但不限于爆炸物，麻醉剂，危险化学品或其他化学物质。 自由表面流体结构使用开放的微通道产生，并且表现出大的表面与体积比。 自由表面流体界面可以过滤干扰分子，同时浓缩空气中的分析物。 微通道流动使SERS活性探针颗粒在流动中受控聚集，从而提高检测器的灵敏度。
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公开(公告)号：US20120038908A1
公开(公告)日：2012-02-16
申请号：US13209688
申请日：2011-08-15
Applicant: Jeffrey Beckstead , Patrick Treado , Matthew Nelson
Inventor： Jeffrey Beckstead , Patrick Treado , Matthew Nelson
CPC classification number: G01J3/02 , G01J3/0208 , G01J3/0218 , G01J3/0272 , G01J3/28 , G01J3/44 , G01J3/443 , G01N21/35 , G01N21/6402 , G01N21/6456 , G01N21/65 , G01N21/658 , G01N21/718 , G01N2021/6423 , G01N2201/0221 , G01N2201/06113 , G01N2201/08 , G01N2201/101 , G01N2201/1087
Abstract: A system and method for locating and identifying unknown samples. A targeting mode may be utilized to scan regions of interest for potential unknown materials. This targeting mode may interrogate regions of interest using SWIR and/or fluorescence spectroscopic and imaging techniques. Unknown samples detected in regions of interest may be further interrogated using a combination of Raman and LIBS techniques to identify the unknown samples. Structured illumination may be used to interrogate an unknown sample. Data sets generated during interrogation may be compared to a reference database comprising a plurality of reference data sets, each associated with a known material. The system and method may be used to identify a variety of materials including: biological, chemical, explosive, hazardous, concealment, and non-hazardous materials.
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公开(公告)号：US20040086171A1
公开(公告)日：2004-05-06
申请号：US10661633
申请日：2003-09-15
Inventor： Chung-Sam Jun , Sun-Yong Choi , Kwang-Soo Kim , Joo-Woo Kim , Jeong-Hyun Choi , Dong-Jin Park
IPC: G06K009/00
CPC classification number: H01L21/67253 , G01N21/9503 , G01N21/95607 , G01N2021/0162 , G01N2021/0187 , G01N2021/1736 , G01N2021/1772 , G01N2021/8411 , G01N2021/8896 , G01N2021/95615 , G01N2201/103 , G01N2201/1087
Abstract: An automated and integrated substrate inspecting apparatus for performing an EBR/EEW inspection, a defect inspection of patterns and reticle error inspection of a substrate includes a first stage for supporting a substrate; a first image acquisition unit for acquiring a first image of a peripheral portion of the substrate supported by the first stage; a second stage for supporting the substrate; a second image acquisition unit for acquiring a second image of the substrate supported by the second stage; a transfer robot for transferring the substrate between the first stage and the second stage; and a data processing unit, connected to the first image acquisition unit and the second image acquisition unit, for inspecting results of an edge bead removal process and an edge exposure process performed on the substrate using the first image, and for inspecting for defects of patterns formed on the substrate using the second image.
Abstract translation: 用于执行EBR / EEW检查的自动化和一体化的基板检查装置，对基板的图案和掩模版错误检查的缺陷检查包括用于支撑基板的第一阶段; 第一图像获取单元，用于获取由所述第一平台支撑的所述基板的周边部分的第一图像; 用于支撑衬底的第二阶段; 第二图像获取单元，用于获取由第二平台支撑的基板的第二图像; 用于在第一阶段和第二阶段之间转移衬底的传送机器人; 以及数据处理单元，连接到第一图像获取单元和第二图像获取单元，用于检查使用第一图像在基板上执行的边缘珠去除处理和边缘曝光处理的结果，并且用于检查图案的缺陷 使用第二图像在基板上形成。
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