Abstract:
A method of fabricating miniature quadrupole electrostatic mass filter has been previously described. The electrodes are metallised cylinders, mounted in grooves etched in oxidised silicon substrates, which are held apart at the correct spacing by cylindrical spacer rods. This invention concerns an ion source mounted on extensions of the spacer rods, which project beyond the mass filter. The ion source consists of a cold-cathode electron emitter, which emits electrons with energies sufficient to cause impact ionisation, and electrostatic optics suitable for coupling the ion flux into the mass filter. Methods of constructing a single self-aligned electron source and a similar dual source are described. Arrangements for mounting the electron source and the ion coupling lens so that the electron and ion beams travel at right angles to one another for efficient separation are described. A method of fabricating a self-aligned one-dimensional einzel electrostatic lens from metallised cylinders mounted in the silicon substrates using etched grooves is described. A method of fabricating a-self-aligned two-dimensional einzel lens from metal plates is also described.
Abstract:
In accordance with the invention, the ion source of a time-of-flight mass spectrometer includes an electron gun having an electron source and at least one electrode for conditioning the flow of electrons, followed by at least one microchannel wafer for generating a pulsed secondary electron beam containing a greater number of electrons from a pulsed primary electron beam. The secondary electron beam enters a gas ionization area of an ion gun which produces a flow of ions which is then passed through the flight tube in order to be analyzed by an ion detector. This provides a high-performance ion source which is compact, sensitive and easy to integrate.
Abstract:
A photoelectron spectrometer includes a target, an electron gun, a crystal plate, a spectrum-analyzer and a detector. The target and the sample to be inspected are aligned with a reference line. The electron gun is positioned on the coaxially line with respect to the reference axis. The crystal plate is arranged in a circular region with respect to the reference axis, so that X-ray beams emitted from the target are omnidirectionally irradiated to the sample surface in an electron shower form. The sensitivity of the photoelectron spectrometer is increased.
Abstract:
In an Auger electron spectrometer for use in analyzing a surface of an object by the use of Auger electrons resulting from impingement of an electron beam, an electron gun comprises an electron beam source for generating the electron beam and an electron lens system for guiding the electron beam towards the surface. The electron lens system comprises a combination of a condenser lens and a permanent magnet member nearer to the surface than the condenser lens. The permanent magnet member may comprise either a plurality of permanent magnet pieces radially and azimuthally spaced apart from one another or a single permanent magnet piece. An ion gun may be disposed in the vicinity of the electron gun to generate an ion beam oblique to the electron beam and substantially concurrent with the electron beam on the surface. Magnetic pole pieces may be attached to each permanent magnet piece and bypassed to control a magnetic field generated by each permanent magnet piece. Each permanent magnet piece may be coated with a combination of a nonmagnetic film and a magnetic film. Anyway, the electron gun can be disposed in an inner cylindrical space of an inner cylindrical electrode member when the electron spectrometer is of a cylindrical mirror type.
Abstract:
An ionization source is disclosed for use with mass spectrometers and electron capture species detectors having an ionization light source excited so as to illuminate a fluid sample which flows past the light source whereby electrons are photoelectrically generated by a light source. Means are also provided to accelerate the photoelectrons and to extract heavy ions generated by the accelerated photoelectrons from the fluid sample. Further means are provided to focus the extracted heavy ions so that they may be detected. Also included is a means to maintain a vacuum between the light source and the sample and the detector.
Abstract:
An electron source for electron-induced dissociation in an RF-free electromagnetostatic cell for use installation in a tandem mass spectrometer is provided. An electromagnetostatic electron-induced dissociation cell may include at least one magnet having an opening disposed therein and having a longitudinal axis extending through the opening, the magnet having magnetic flux lines associated therewith, and an electron emitter having an electron emissive surface comprising a sheet, the emitter disposed about the axis at a location relative to the magnet where the electron emissive surface is substantially perpendicular to the magnetic flux lines at the electron emissive surface.
Abstract:
The present relates to a high brightness electron gun for mass spectrometry and spectroscopy. The electron gun comprises a nano emission ionization (NEI) electron source, an electrostatic lens system and a control system. The nano emission ionization (NEI) electron source comprises a cathode having a substrate on which are mounted nano-components and an anode. The control system controls the high brightness electron gun, the beam regime and the beam physical proprieties.
Abstract:
본 발명은 자외선 다이오드와 CEM모듈을 이용한 질량분석기의 이온화원 획득장치에 관한 것으로, CEM모듈을 사용하되 자외선 다이오드에서 방출하는 자외선 광자를 CEM모듈 입구에 조사하여 초기 전자방출을 유도함으로서, 출구에는 증폭된 대량의 전자빔을 획득하고, 저온 저전력으로 방출시간이 정확히 조절되는 전자빔을 생산하도록 하는데 그 목적이 있다. 본 발명은 자외선 다이오드와 CEM모듈을 이용한 질량분석기의 이온화원 획득장치에 있어서, 공급된 전원에 의해 자외선을 방출하는 자외선 다이오드; 자외선 다이오드로부터 자외선 광자들의 초기 전자방출을 유도 및 증폭하여 출구에서 대량 전자빔을 획득하는 전자증배관; 전자증배관을 통해 증폭된 전자빔을 집적하는 전자 집적렌즈; 전자 집적렌즈를 통해 주입된 전자빔에 의해 기체시료 분자들을 이온화하는 이온트랩 질량분리기; 및 상기 이온트랩 질량분리기로부터 분리된 이온을 질량스펙트럼에 의해 검출하는 이온검출기;를 포함하여 이루어지되, 전자증배관은 CEM모듈인 것을 특징으로 한다.
Abstract:
An electron source includes a first electrode, a second electrode, a thermionic element interposed between and electrically isolated from the first electrode and the second electrode, and a guard electrode interposed between and electrically isolated from the first electrode and the second electrode. The thermionic element and the guard electrode may be at substantially the same voltage. Another electron source includes a first electrode, a second electrode, a thermionic element interposed between and electrically isolated from the first electrode and the second electrode, and a thermal expansion component interposed between and electrically isolated from the first electrode and the second electrode. The thermal expansion component may be heated to cause expansion. The heating may be cycled to cause alternating expansion and contraction.
Abstract:
A photoemissive ion mobility spectrometer is disclosed for of chlorinated hydrocarbons and nitro-organic materials. Backside illumination of a thin gold film by pulsed laser radiation, pulsed ultraviolet xenon flashlamp, or like UV source, is used to produce bursts of low energy photo-emitted electrons. These swarms of thermalized electrons are directly attached by electronegative analytes or by reactant molecules, followed by charge transfer to the more electronegative analyte. Total internal reflection is incorporated for the backside illumination using optical elements such as a fused silica prism. The spectrometer allows for the direct vaporization of adsorbed explosive molecules from surfaces followed by direct injection into the photoemissive ion mobility spectrometer through a heated inlet.