METHOD FOR MEASURING SKEW OF TAPE-SHAPED OPTICAL FIBER

    公开(公告)号:JP2000206003A

    公开(公告)日:2000-07-28

    申请号:JP271899

    申请日:1999-01-08

    Abstract: PROBLEM TO BE SOLVED: To provide a method for highly accurately measuring a skew of a tape-shaped optical fiber. SOLUTION: A sine wave modulation light is passed through each optical fiber of a tape-shaped optical fiber. A phase θ of the sine wave modulation light propagating each optical fiber is measured. A light propagation time at each optical fiber of the tape-shaped optical fiber is calculated from the measured phase. A skew of the tape-shaped optical fiber is thus measured according to the method. In the method, the phase is measured for a plurality of sine wave frequencies (f), and a proportional relation 6 between the frequency and phase is obtained from phases 5 to the measured plurality of sine wave frequencies. The light propagation time of each optical fiber of the tape-shaped optical fiber is calculated from a proportional constant, whereby the skew of the tape- shaped optical fiber is measured.

    WAVELENGTH DISPERSION MEASURING DEVICE AND POLARIZATION DISPERSION MEASURING DEVICE

    公开(公告)号:JP2000193557A

    公开(公告)日:2000-07-14

    申请号:JP36685998

    申请日:1998-12-24

    Applicant: ANRITSU CORP

    Abstract: PROBLEM TO BE SOLVED: To enable measuring devices to accurately measure the wavelength dispersion and polarization dispersion of each of devices under test of short and long lengths, for example, from 2 m to 20 m. SOLUTION: The wavelength dispersion measuring device is constituted of a pulse light source 42 to emit optical pulses of variable wavelength with a predetermined cycle period, an optical demultiplexer 44 to demultiplex the optical pulses emitted from the pulse light source 42 into reference optical pulses and incident optical pulses to be incident onto a device under test, a spatial optical delay means 48 to change the amount of relative delay of the reference optical pulses to the incident optical pulses, a sampling means 46 to receive the incident optical pulses transmitted through the device under test and the reference light pulses delayed by the optical delay means 48 and to obtain an autocorrelation intensity signal proportional to the optical intensity of the emergent optical pulses at the location every time the amount of relative delay of the reference optical pulses is changed at the optical delay means 48, and a signal processing means 53 to obtain the autocorrelation waveform of the emergent optical pulses from the autocorrelation intensity signals sequentially obtained at the sampling means 46.

    X-RAY TRANSMISSION WINDOW AND PRODUCTION THEREOF

    公开(公告)号:JPH03170033A

    公开(公告)日:1991-07-23

    申请号:JP30970189

    申请日:1989-11-29

    Applicant: NEC CORP

    Abstract: PURPOSE:To improve the transmittance of X-rays and to lower the transmittance of UV rays and visible light by laminating the thin film of metal beryllium on the thin film of the diamond polycrystal in a window part. CONSTITUTION:Resist patterns are formed by a pattern forming stage using a photoresistor 13 in order to partially remove a substrate 12 except the diamond polycrystalline film 11 which is made to remain. The substrate 12 is removed by etching to a desired shape and size to form a window part 12a by using a mask. The thin film 10 of the metal beryllium is formed by vapor deposition or sputtering on the film 11. The high transmittance is thereby exhibited in an X-ray region and the low transmittance is obtd. in a visible light region.

    INFRARED ELEMENT
    74.
    发明专利

    公开(公告)号:JPS60253827A

    公开(公告)日:1985-12-14

    申请号:JP11001184

    申请日:1984-05-30

    Inventor: BABA HIROYUKI

    Abstract: PURPOSE:To enhance reliability with high sensitivity, by adhering a high-molecular pyroelectric film having metal layers vapor deposited to both surfaces thereof to a metal ring under tension and increasing the thickness of the vapor deposition film in the vicinity of the adhesion part of the metal ring as compared with that in the vicinity of the central part of said vapor deposition film. CONSTITUTION:Metal vapor deposition films 3, 4 are formed to a high-molecular pyroelectric film 1 comprising PVF2 and a metal ring 2 is adhered to the circular ridge 3a of the film 3 made thicker than the vicinity of the central part of said film 3 to constitute an infrared element. By this constitution, continuity resistance due to the fixation of the ring 2 by an adhesive can be reduced and the delamination of the ring 2 is prevented and sensitivity can be enhanced because the vapor deposition film in the vicinity of the central part thereof is thin.

    MEASURING DEVICE FOR LIGHT DISPERSION

    公开(公告)号:JPS56100324A

    公开(公告)日:1981-08-12

    申请号:JP287280

    申请日:1980-01-14

    Abstract: PURPOSE:To enable to measure the dispersion in 1-mum band with good accuracy, by using nonlinear crystal for wave conversion and picosecond shutter. CONSTITUTION:Referencing optical pulses are directly fed to a nonlinear crystal 11 without passing through an optical fiber 3. It is known that a single mode fiber having only one mode possible for propagation among optical fibers is different from the propagation speed depending on the direction of polarized plane, but this speed difference is theoretically as small as 10-20 picoseconds/km and it is impossible to measure by means of the fiber of a short length and this can be measured by using this device. Further, even with the use of this short length fiber, the elongation rate of this optical fiber due to tension can accurately be measured through this device.

    RADIATION MEASURING APPARATUS
    76.
    发明专利

    公开(公告)号:JPS54143687A

    公开(公告)日:1979-11-09

    申请号:JP5201478

    申请日:1978-04-28

    Inventor: SAITOU TOSHIMASA

    Abstract: PURPOSE:To perform measurement of high accuracy continuously over a long period of time by protrusively providing a detector storage well is the cavity within a chamber for passing the fluid to be measured. CONSTITUTION:A chamber 1 which is mounted with radiation shielding lead 6 on its circumference and is provided with the inlet tube 4 and discharge tube 5 for the fluid to be measured is protrusively provided with a well 3 through the lead 6 in the cavity 2 in its upper part. While the spece 10 formed is being heermetically sealed with an O-ring 12, it is connected to a filter 13, air piping 15 with a valve 14, vacuum gauge 18, valve 19, and air piping 17 with a vacuum pump 20. The valves 14, 19 are opened and closed by the operation of an operator 22 and the vacuum pump 20 is operated to evacuate the space 10 to a specified vacuum degree, after which the fluid to be measured is introduced in the cavity 2 and the measurement of radiations is accomplished. Thereby, the temperature of the detector in the detector case 8 may be maintained at a desired temperature range and the measurement free from measurement errors may be continuously performed over a long period of time even for the fluid to be measured of high temperature or large temperature change.

    Method and system utilizing absolute velocity to improve the performance of electromagnetic devices

    公开(公告)号:US12061122B2

    公开(公告)日:2024-08-13

    申请号:US17175178

    申请日:2021-02-12

    Applicant: Qian Chen

    Inventor: Qian Chen

    CPC classification number: G01J7/00 G01M11/335 G09B23/22

    Abstract: The method and system utilized the measurement of the “absolute” velocities or equivalent parameters of the electromagnetic devices and objects, which are defined as the velocities relative to the real origin of the electromagnetic wave, to accurately picture their impacts on the propagation and measurement of the electromagnetic wave and compensate for these impacts correspondingly. The comprehensive information of the “absolute” velocities, including both the measured values and the calculated right timings, is utilized to calibrate and control the electromagnetic device and calculate the results to improve performance and accuracy. The method and system include the absolute velocity measurement, the calibration and control of the device, and the computation of the right timings and results.

    Device, system and method for measuring the dilaton particle
    80.
    发明申请
    Device, system and method for measuring the dilaton particle 审中-公开
    用于测量稀释颗粒的装置,系统和方法

    公开(公告)号:US20050206902A1

    公开(公告)日:2005-09-22

    申请号:US11125544

    申请日:2005-05-09

    Applicant: George Soli

    Inventor: George Soli

    CPC classification number: G01J7/00

    Abstract: A device, system and method for measuring the sidereal or one-way “superluminal” photon group velocity is presented, in which the measurement of said “superluminal” photon group velocity may be used as a research and educational tool to explore astronomical and physical quantities as well as the dilaton fundamental particle.

    Abstract translation: 提出了一种用于测量恒星或单向“超光速”光子组速度的装置,系统和方法,其中所述“超光速”光子组速度的测量可以用作探索天文和物理量的研究和教育工具 以及稀释基本粒子。

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