Abstract:
A document readout device reads out a document by forming an image of a linear area of the document on an unmagnification sensor through an image-forming optical system. The document readout device has a roof mirror array, a lens array, an optical-path separator, one or two mirror members, a housing, an unmagnification sensor, and one or two line illuminating devices. The housing has a pair of slits, one of which is covered by the unmagnification sensor, with the other slit being positioned for introducing light into the housing. The roof mirror array, the lens array, the optical-path separator, and the mirror member or members are retained in the housing in certain mutual positional relationship. The unmagnification sensor and the line illuminating unit or units are integrally mounted on the housing. The roof mirror array, the lens array, and the optical-path separator jointly constitute the image-forming optical system. An image-forming light ray from the image-forming optical system is guided by the mirror member or members toward the unmagnification sensor.
Abstract:
An imaging system employing an apparatus for evenly illuminating objects to be scanned. The apparatus includes first and second elliptical cylindrical sections which comprise an elliptical cylindrical mirror having first and second focal lines. A linear-type lamp is located at the first focal line and the scanning line of the imaging system is located at the second focal line. First and second planar mirrors are positioned in parallel relationship to each other at the top and bottom of the scanning line, and a non-reflecting surface on the second elliptical cylindrical section combines with the first elliptical section to provide an even distribution of light at the scanning line. The optical axis of the imaging system passes between the first and second elliptical cylindrical sections.
Abstract:
For forming an array or series of elementary beams of charged particles, a beam exposure device includes a mirror system having a matrix of sub-mirrors. Using such a composite mirror, a multiple beam image is formed in a location which deviates from the position of the cross-over of principal rays of the elementary beams. Consequently, the elementary beams, which may alternatively be ion beams, can be separated modulated and controlled. For suitable imaging, such as the writing of patterns for a micro-electronic circuit element, the images and the cross-over of the principal rays of the elementary beams are combined. For this purpose, use is made of a second mirror whose sub-mirrors have an optical effect which opposes that of the first mirror.
Abstract:
In a radiation scanning system, scanning is achieved by rotation of two drums about parallel axes. The first drum is rotated at an angular speed s.sub.1 and has n.sub.1 reflective surfaces at a distance r.sub.1 from a first axis of rotation. The second drum is rotated at an angular speed s.sub.2 and has n.sub.2 reflective surfaces at a distance r.sub.2 from a second axis of rotation. The axes are separated by a distance d. A detector is located a distance a from the first axis. The following conditions hold:2 a(n.sub.1 /n.sub.2 -1).sup.2 + 2 d(n.sub.1 /n.sub.2).sup.2 +r.sub.2 (n.sub.1 /n.sub.2).sup.2 =r.sub.1 (2n.sub.1 /n.sub.2 -1).sup.2 , (i)n.sub.1 s.sub.1 =n.sub.2 s.sub.2. (ii)
Abstract:
This invention is a reading head having a number of photo cells for cooperating with an optical grating to give a position signal. Light for illuminating the grating is also used to illuminate a part of the cells displaced from the part where the grating image appears for setting up the cells in the position of minimum illumination.
Abstract:
Disclosed are systems and methods for generating a beam of charged particles, such as an ion beam. Such a system may comprise an interaction chamber configured to support a target, one or more electromagnetic radiation sources, a sensor, and at least one processor. The one or more electromagnetic radiation sources may be configured to provide a probe beam at a first energy for determining orientation data of the target and a particle-generating beam at a second energy, which is greater than the first energy, for producing a beam of charged particles. The processor may be configured to receive feedback information from the sensor and to cause a change in a relative orientation between the particle-generating beam and the target.
Abstract:
A method of separating charged particles using an analyzer is provided, the method comprising: causing a beam of charged particles to fly through the analyzer and undergo within the analyzer at least one full oscillation in the direction of an analyzer axis (z) of the analyzer whilst orbiting about the axis (z) along a main flight path; constraining the arcuate divergence of the beam as it flies through the analyzer; and separating the charged particles according to their flight time. An analyzer for performing the method is also provided. At least one arcuate focusing lens is preferably used to constrain the divergence, which may comprise a pair of opposed electrodes located either side of the beam. An array of arcuate focusing lenses may be used which are located at substantially the same z coordinate, the arcuate focusing lenses in the array being spaced apart in the arcuate direction and the array extending at least partially around the z axis, thereby constraining the arcuate divergence of the beam a plurality of times as it flies through the analyzer.
Abstract:
With a multi-beam type charged particle beam apparatus, and a projection charged particle beam apparatus, in the case of off-axial aberration corrector, there is the need for preparing a multitude of multipoles, and power supply sources in numbers corresponding to the number of the multipoles need be prepared. In order to solve this problem as described, a charged particle beam apparatus is provided with at least one aberration corrector wherein the number of the multipoles required in the past is decreased by about a half by disposing an electrostatic mirror in an electron optical system.
Abstract:
A micro-reflectron for a time-of-flight mass spectrometer including a substrate and integrated with the volume of the substrate, means for application of a potential gradient in a volume suitable for constituting a flight zone of the ions. The means of application includes at least two polarization electrodes and a wall of at least one resistive material that can be polarized between these electrodes so as to generate a continuous potential gradient, itself providing the function of reflectron, this flight zone, these electrodes and this wall being obtained by the technology of microelectromechanical systems (MEMS) and this micro-reflectron having a thickness of less than 5 millimetres while its other dimensions are less than 10 times this thickness.
Abstract:
An optical backplane is provided that has at least first and second side walls that are generally parallel to one another and at least one optical relay element disposed on at least one of the parallel side walls. An optical signal is coupled into the optical backplane through an entrance facet of the backplane. The optical signal is maintained within the optical backplane by internal reflection at the parallel side walls of the backplane. The optical relay element receives the optical signal reflected off of one of the side walls and reflects and refocuses the optical signal to guide the optical signal and prevent it from diverging as it propagates through the backplane from the entrance facet to the exit facet.