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81.发明申请公开(公告)号：US20140253922A1
公开(公告)日：2014-09-11
申请号：US14263942
申请日：2014-04-28
Applicant: SpectraSensors, Inc.
Inventor： Xiang Liu , John Lewison , Wenhai Ji , Alfred Feitisch
CPC classification number: G01N21/274 , G01J3/28 , G01J3/42 , G01N21/031 , G01N21/31 , G01N21/3504 , G01N21/3518 , G01N21/39 , G01N2021/399
Abstract: A reference harmonic absorption curve of a laser absorption spectrometer can have a reference curve shape derived from a reference signal generated by the detector in response to light passing from the laser light source through a reference gas or gas mixture. The reference gas or gas mixture can include one or more of a target analyte and a background gas expected to be present during analysis of the target analyte. A test harmonic absorption curve having a test curve shape is compared with the reference harmonic absorption curve to detect a difference between the test curve shape and the reference curve shape. Operating and/or analytical parameters of the laser absorption spectrometer are adjusted to correct the test curve shape to reduce the difference between the test curve shape and the reference curve shape.
Abstract translation: 激光吸收光谱仪的参考谐波吸收曲线可以具有根据由检测器响应于从激光源通过参考气体或气体混合物的光而产生的参考信号导出的参考曲线形状。 参考气体或气体混合物可以包括目标分析物和预期在目标分析物的分析期间存在的背景气体中的一种或多种。 将具有测试曲线形状的测试谐波吸收曲线与参考谐波吸收曲线进行比较，以检测测试曲线形状与参考曲线形状之间的差异。 调整激光吸收光谱仪的操作和/或分析参数以校正测试曲线形状，以减小测试曲线形状与参考曲线形状之间的差异。
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公开(公告)号：US20040245471A1
公开(公告)日：2004-12-09
申请号：US10766327
申请日：2004-01-29
Applicant: SpectraSensors, Inc.
Inventor： Randy Dean May
IPC: G01N021/35
CPC classification number: G01N21/39 , G01N21/3504
Abstract: A system and method are disclosed for the detection of ethylene oxide in a sample of gas, such as air. The system includes a light source operating at a wavelength where molecules typically found within air absorb light at a substantially lower level than ethylene oxide molecules. Exemplary wavelengths are in the range of approximately 1.6-2.2 nullm, and in particular at 1.6 nullm, 1.645 nullm, 1.692 nullm, 2.195 nullm, 2.2 nullm, 2.216 nullm, passes through the sample of gas to be detected by a detector. In one embodiment, the light source is a tunable diode laser or a VCSEL and the ethylene oxide level is determined using harmonic spectroscopy.
Abstract translation: 公开了用于检测诸如空气的气体样品中的环氧乙烷的系统和方法。 该系统包括以通常在空气中发现的分子以比环氧乙烷分子基本上更低的水平吸收光的波长操作的光源。 示例性的波长在1.6-2.2μm的范围内，特别是1.6μm，1.645μm，1.692μm，2.195μm，2.2μm，2.216μm，通过检测器检测的气体样品。 在一个实施例中，光源是可调谐二极管激光器或VCSEL，并且使用谐波光谱确定环氧乙烷水平。
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公开(公告)号：WO2017040622A1
公开(公告)日：2017-03-09
申请号：PCT/US2016/049646
申请日：2016-08-31
Applicant: SPECTRASENSORS, INC.
Inventor： COHEN, Joshua , ST. JOHN, Nathan , FEITISCH, Alfred
CPC classification number: G01N21/01 , G01J3/0286 , G01J3/42 , G01N21/27 , G01N2201/0231 , G01N2201/0636 , G02B7/008 , G02B7/028 , H01S3/0071 , H01S3/1317 , H01S5/0071 , H01S5/06804
Abstract: An optical head assembly (160) for use in a spectrometer is provided that is configured to characterize one or more constituents within a sample gas. The assembly includes a thermoelectric cooler (TEC) (310) having a cold side on one end and a hot side on an opposite end, a cold plate (315) in thermal communication with the cold side of the TEC, a hot block (305) in thermal communication with the hot side of the TEC, a light source (105) in thermal communication with the cold plate such that a change in temperature of the TEC causes one or more properties of the light source (e.g., wavelength, etc.) to change, and an optical element (325) in thermal communication with the cold plate positioned to collimate light emitted by the light source through the sample gas (such that properties of the optical element vary based on a change in temperature of the TEC).
Abstract translation: 提供了一种用于光谱仪的光学头组件（160），其被配置为表征样品气体中的一种或多种组分。 该组件包括热电冷却器（TEC）（310），其在一端具有冷侧，另一端具有热侧，与TEC的冷侧热连通的冷板（315），热块（305） ）与TEC的热侧热连通，与冷板热连通的光源（105），使得TEC的温度变化导致光源的一个或多个属性（例如波长等） ）和与冷板热连通的光学元件（325），其被定位成准直由光源通过样品气体发射的光（使得光学元件的性质基于TEC的温度变化而变化） 。
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公开(公告)号：WO2016179318A1
公开(公告)日：2016-11-10
申请号：PCT/US2016/030833
申请日：2016-05-04
Applicant: SPECTRASENSORS, INC.
Inventor： FEITISCH, Alfred , DORN, Peter , TEDESCO, James , LIU, Xiang
IPC: G01N21/03 , G01J3/42 , G01N21/39 , G01N21/3504
CPC classification number: G01N21/39 , G01J3/0208 , G01N21/031 , G01N21/3504 , G01N2021/399 , G01N2201/0612 , G01N2201/0633
Abstract: A spectrometer includes a light source configured to emit a beam along a beam path through a sample volume comprising an analyte. Also included is at least one detector positioned to detect at least a portion of the beam emitted by the light source, and at least one reflector positioned along the beam path intermediate the light source and the at least one detector having a surface roughness greater than a predefined level such as 20 Å RMS.
Abstract translation: 光谱仪包括被配置为沿着光束路径发射通过包含分析物的样品体积的光束的光源。 还包括至少一个检测器，其被定位成检测由光源发射的光束的至少一部分，以及沿光束路径定位的至少一个反射器，其位于光源之间，并且至少一个检测器具有大于 预定义的水平，例如20？RMS。
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公开(公告)号：WO2016028401A1
公开(公告)日：2016-02-25
申请号：PCT/US2015/039668
申请日：2015-07-09
Applicant: SPECTRASENSORS, INC.
Inventor： FEITISCH, Alfred , LIU, Xiang , HELBLEY, Keith, Benjamin , BEYER, Douglas
CPC classification number: G01J3/0205 , G01J3/0237 , G01J3/027 , G01J3/0278 , G01J3/0291 , G01J3/42 , G01J2003/421 , G01N21/31 , G01N2201/06113 , G01N2201/062
Abstract: A spectrometer includes a light source that emits a beam into a sample volume comprising an absorbing medium. Thereafter, at least one detector detects at least a portion of the beam emitted by the light source. It is later determined, based on the detected at least a portion of the beam and by a controller, that a position and/or an angle of the beam should be changed. The beam emitted by the light source is then actively steered by an actuation element under control of the controller. In addition, a concentration of the absorbing media can be quantified or otherwise calculated (using the controller or optionally a different processor that can be local or remote). The actuation element(s) can be coupled to one or more of the light source, a detector or detectors, and a reflector or reflectors intermediate the light source and the detector(s).
Abstract translation: 光谱仪包括将光束发射到包括吸收介质的样品体积中的光源。 此后，至少一个检测器检测由光源发射的光束的至少一部分。 随后基于检测到的梁的至少一部分和由控制器确定梁的位置和/或角度应被改变。 然后在控制器的控制下由光源发射的光束被致动元件主动地导向。 此外，可以量化或以其他方式计算吸收介质的浓度（使用控制器或可选择地可以是本地或远程的不同处理器）。 致动元件可以耦合到光源，检测器或检测器中的一个或多个，以及在光源和检测器之间的反射器或反射器。
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Patent Agency Ranking
公开(公告)号：WO2010144870A3
公开(公告)日：2010-12-16
申请号：PCT/US2010/038417
申请日：2010-06-11
Applicant: SPECTRASENSORS, INC. , LIU, Xiang , FEITISCH, Alfred , ZHOU, Xin
Inventor： LIU, Xiang , FEITISCH, Alfred , ZHOU, Xin
Abstract: Detector data representative of an intensity of light that impinges on a detector after being emitted from a light source and passing through a gas over a path length can be analyzed using a first analysis method to obtain a first calculation of an analyte concentration in the volume of gas and a second analysis method to obtain a second calculation of the analyte concentration. The second calculation can be promoted as the analyte concentration upon determining that the analyte concentration is out of a first target range for the first analysis method.
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公开(公告)号：WO2009029876A4
公开(公告)日：2009-06-25
申请号：PCT/US2008074900
申请日：2008-08-29
Applicant: SPECTRASENSORS INC , BAUM MARC M , MOSS JOHN , FEITISCH ALFRED , ZHOU XIN , LIU XIANG , KWAN ALEX
Inventor： BAUM MARC M , MOSS JOHN , FEITISCH ALFRED , ZHOU XIN , LIU XIANG , KWAN ALEX
CPC classification number: B01D53/685 , B01D53/42 , B01D53/52 , B01D53/58 , B01D2251/512 , B01D2251/602 , B01D2251/606 , B01D2259/40
Abstract: Scrubber media for reactive gases, that can include but are not necessarily limited to hydrogen chloride (HCl), hydrogen sulfide (H2S), hydrogen fluoride (HF), and ammonia (NH3), can include reactive particles, potentially as small as nano-scale, that can optionally be suspended on macro-scale carrier particles. Reactive gases can be converted to non-volatile compounds by being passed through a bed of such scrubber media. Such scrubber media can be used to remove reactive gases from gas mixtures. Potential applications include differential absorption spectroscopy, air pollutant emission controls, and the like. Methods of preparing scrubber media are also described.
Abstract translation: 可以包括但不限于氯化氢（HCl），硫化氢（H 2 S），氟化氢（HF）和氨（NH 3））的反应性气体的洗涤介质可以包括可能小至纳米级的反应性颗粒， 可以任选地悬浮在大规模载体颗粒上。 反应性气体可以通过穿过这种洗涤介质的床而转化为不挥发性化合物。 这种洗涤介质可用于从气体混合物中除去反应性气体。 潜在应用包括差示吸收光谱，空气污染物排放控制等。 还描述了制备洗涤介质的方法。
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公开(公告)号：WO2008128114B1
公开(公告)日：2008-12-18
申请号：PCT/US2008060128
申请日：2008-04-11
Applicant: SPECTRASENSORS INC , ZHOU XIN , LIU XIANG , FEITISCH ALFRED , SANGER GREGORY M
Inventor： ZHOU XIN , LIU XIANG , FEITISCH ALFRED , SANGER GREGORY M
IPC: G01N21/35
CPC classification number: G01N21/3504 , G01N2021/3545 , G01N2021/399 , G01N2201/1215
Abstract: A differential absorption spectrum for a reactive gas in a gas mixture can be generated for sample absorption data by subtracting background absorption data set from the sample absorption data. The background absorption data can be characteristic of absorption characteristics of the background composition in a laser light scan range that includes a target wavelength. The differential absorption spectrum can be converted to a measured concentration of the reactive gas using calibration data. A determination can be made whether the background composition has substantially changed relative to the background absorption data, and new background absorption data can be used if the background composition has substantially changed. Related systems, apparatus, methods, and/or articles are also described..
Abstract translation: 通过从样品吸收数据中减去背景吸收数据，可以为样品吸收数据产生气体混合物中反应气体的差分吸收光谱。 背景吸收数据可以是包括目标波长的激光扫描范围中的背景组分的吸收特性的特征。 差分吸收光谱可以使用校准数据转换为测量的反应气体浓度。 可以确定背景组成是否相对于背景吸收数据有实质性改变，并且如果背景组成已经基本改变，则可以使用新的背景吸收数据。 还描述了相关的系统，设备，方法和/或物品。
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公开(公告)号：WO2007120931A1
公开(公告)日：2007-10-25
申请号：PCT/US2007/009648
申请日：2007-04-19
Applicant: SPECTRASENSORS, INC. , ZHOU, Xin
Inventor： ZHOU, Xin
CPC classification number: G01N21/3554 , G01J3/02 , G01J3/027 , G01J3/42 , G01J3/4338 , G01N21/031 , G01N21/0332 , G01N21/3504 , G01N21/39 , G01N33/0036 , G01N33/22
Abstract: Low concentrations of water vapor within a background of one or more hydrocarbon gases may be detected and quantified using a differential absorption spectrometer. A dehydrated sample of the gas is used as a background sample whose absorption spectrum allows elimination of absorption features not due to water vapor in the gas. Absorption spectra may recorded using tunable diode lasers as the light source, these lasers may have a wavelength bandwidth that is narrower than the water vapor absorption feature used for the differential absorption spectral analysis.
Abstract translation: 可以使用差示吸收光谱仪检测和定量在一种或多种烃气体背景下的低浓度水蒸汽。 将脱气的气体样品用作背景样品，其吸收光谱允许消除不是由于气体中的水蒸气引起的吸收特征。 可以使用可调谐二极管激光器作为光源记录吸收光谱，这些激光器可以具有比用于差分吸收光谱分析的水蒸汽吸收特征窄的波长带宽。
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公开(公告)号：WO2014066526A1
公开(公告)日：2014-05-01
申请号：PCT/US2013/066423
申请日：2013-10-23
Applicant: SPECTRASENSORS, INC.
Inventor： FEITISCH, Alfred , NEUBAUER, Gabi , SCHREMPEL, Mathias
CPC classification number: H01L24/83 , B23K20/023 , B23K20/24 , B23K2201/42 , H01L33/62 , H01L2224/73265 , H01L2224/83201 , H01L2224/8385 , H01L2924/12042 , H01S5/02212 , H01S5/02256 , H01S5/0226 , H01S5/02264 , H01S5/02476 , H01S5/0425
Abstract: A first contact surface (310) of a semiconductor laser chip (302) can be formed to a first target surface roughness and a second contact surface (312) of a carrier mounting (304) can be formed to a second target surface roughness. A first bond preparation layer (306) comprising a first metal can optionally be applied to the formed first contact surface, and a second bond preparation layer (308) comprising a second metal can optionally be applied to the formed second contact surface. Both preparation layers may be made of gold and diffusion bonding results from a heating of device under pressure. The first contact surface can be contacted with the second contact surface, and a solderless securing process can secure the semiconductor laser chip to the carrier mounting. Related systems, methods, articles of manufacture, and the like are also described.
Abstract translation: 半导体激光芯片（302）的第一接触表面（310）可以形成为第一目标表面粗糙度，并且载体安装件（304）的第二接触表面（312）可以形成为第二目标表面粗糙度。 包括第一金属的第一粘合制备层（306）可以任选地施加到形成的第一接触表面，并且包括第二金属的第二接合制备层（308）可以可选地施加到形成的第二接触表面。 两个制备层可以由金制成，并且在压力下由装置的加热产生扩散接合。 第一接触表面可以与第二接触表面接触，并且无焊接固定工艺可以将半导体激光器芯片固定到载体安装。 还描述了相关系统，方法，制品等。
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