Abstract:
PROBLEM TO BE SOLVED: To provide a highly practical radiation sensitive resin composition which can simply and efficiently form a finer pattern, and can be applied to a process of manufacturing a semiconductor.SOLUTION: The radiation sensitive resin composition contains (A) a resin having a repeating unit represented by general formula (1), (D) an acid generator, and (E) a photodegradable base represented by general formula (8) (in general formula (1), Rrepresents a hydrogen atom or a methyl group, and Rrepresents a hydrocarbon group, and in the general formula (8), Rto Reach independently represents an alkyl group, an alkoxyl group, a hydroxyl group or a halogen atom, and Zrepresents anion such as OH, R-COOand R-SO).
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition suitably usable as a chemically amplified resist and excellent in storage stability. SOLUTION: The radiation-sensitive resin composition includes: (A) an acid generator represented by general formula (1-1) or general formula (1-2); (B) an acid diffusion inhibitor represented by general formula (2); and (C) a copolymer. In the general formulae (1-1) and (1-2), R 1 denotes alkyl or the like; M + denotes a monovalent cation; R 1a and R 1b each independently denote an organic group or the like; and Y denotes a divalent organic group or the like. In the general formula (2), R 2 , R 3 and R 4 are alkyl or the like. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To obtain a new substance which can be used as an acid-dissociating group-containing polymer having high transparency for radiations such as F2 excimer laser and satisfying basic performances required for resists, and to obtain a radiation-sensitive resin composition using the same. SOLUTION: The subject polyrotaxane comprises a fluorine-containing cyclodextrin represented by formula (1) and a linear polymer which passes through the cavity of this cyclic compound. The radiation-sensitive resin composition comprises the fluorine-containing cyclodextrin or the polyrotaxane as the acid-dissociating group-containing polymer, and a radiation-sensitive acid-producing agent. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a new polysiloxane that has high transparency to the radial rays of ≤200 nm wavelength, high resolution and excellent coating properties and is useful as a resin component for resists and bears a fluorine-containing norbornane skeleton and provide a radiation-sensitive resin composition including the same. SOLUTION: The polysiloxane comprises at least one of structural unit selected from a structural unit represented by formula (I) and a structural unit represented by formula (II) and at least one of structural unit selected from a structural unit represented by formula (III) and a structural unit represented by formula (IV) [wherein X 1 and X 2 are each H, a monovalent (halogenated) hydrocarbon, a halogen atom, or an amino; B is H or F; n and m are each 0 or 1, p is an integer of 1-10]. The radiation-sensitive resin composition includes the polysiloxane and the radiation-sensitive acid generator. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation sensitive resin composition which has high transparency to radiations, and has excellent basic properties as a resist, such as sensitivity, dry etching resistance and pattern shapes, more particularly excellent solubility in a resist solvent and reduces the roughness of pattern side walls after development. SOLUTION: The radiation sensitive resin composition contains an acid dissociative group-containing resin which is insoluble in an alkali or hardly soluble in the alkali and is made easily soluble in the alkali by the effect of an acid and a radiation sensitive acid forming agent. The dissociative group-containing resin includes the recursive unit expressed by formula (1) and the ratio (Mw/Mn) of the weight average molecular weight and number average molecular weight thereof is COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To obtain a radiation-sensitive resin composition which is useful as a chemical amplification type resist sensitive to far ultra-violet rays, has improved dry etching resistance, high resolution and high radiation transmissivity, to provide a copolymer useful as its component and a polymer mixture. SOLUTION: The radiation-sensitive resin composition comprises (A) a polymer component such as a copolymer having a (meth)acrylate repeating unit protected with a cycloalkyl-based acid dissociating group, a hydroxystyrene-based repeating unit and a hydroxystyrene-based repeating unit protected with a specific acid-dissociable group and (B) a radiation-sensitive acid generator. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an antireflection film forming composition especially high in an antireflection effect and not causing intermixing, to provide a polymer especially useful for the antireflection film forming composition, and to provide an acenaphthylene derivative especially useful as a raw material or an intermediate for the polymer. SOLUTION: The acenaphthylene derivative comprises acetoxymethylacenaphthylene and hydroxymethylacenaphthylene. The polymer has structural units represented by formula (3) (wherein R 1 is a hydrogen atom or a monovalent organic group; and R 2 and R 3 are each a monovalent atom or a monovalent organic group). The antireflection film forming composition contains a polymer having the structural units and/or structural units derived from a styrene or a vinylnaphthalene having a group: -CH 2 OR 4 (wherein R 4 is a hydrogen atom or a monovalent organic group) in a benzene ring and a solvent. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition having high transparency to a short-wavelength radiation typified by far UV, excellent in basic physical properties as a resist, such as sensitivity, resolution, dry etching resistance and pattern shape, and ensuring few development defects. SOLUTION: The radiation-sensitive resin composition comprises (A) a resin which becomes alkali-soluble by the action of an acid and is typified by a resin having a repeating unit derived from acrylic acid derivatives substituted by a perfluoroalkyl group in the α-position and typified by 2-methyladamantan-2- yl α-trifluoromethylacrylate and a repeating unit derived from a (meth)acrylic acid derivative having a lactone skeleton in a side chain ester structure and (B) a radiation-sensitive acid generator. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a new anthracene derivative as an additive for a radiation- sensitive resin composition useful for a chemical amplification resist optimally controlling the radiation transimmisivity and effectively suppressing a change in line breadth of a resist pattern due to fluctuation of film thickness of a resist film without especially deteriorating resolution performances and having excellent compatibility with other components in the composition with low sublimability. SOLUTION: The anthracene derivative is represented by general formula (1) [wherein, R 1 s denote each a hydroxy group or a 1-20C monovalent organic group; n denotes an integer of 0-9; X denotes a single bond or a 1-12C bivalent organic group; and R 2 denotes a monovalent acid-dissociable group]. The radiation-sensitive resin composition comprises (A) the anthracene derivative, (B) an alkali-insoluble or a sparingly alkali-soluble resin which becomes readily soluble in alkalis in the presence of an acid and (C) a radiation-sensitive acid generator. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition excellent in basic physical properties as a resist, such as transparency and sensitivity to radiations, resolution and dry etching resistance. SOLUTION: The radiation-sensitive resin composition comprises an acid- dissociable group-containing resin (A) including a repeating unit of formula (1-1) (where each R 1 is independently H or methyl and each R 2 is independently a 2-6C alkyl) and a radiation-sensitive acid generator (B) of formula (2) (where R 3 is a monovalent organic group and R 4 is a divalent organic group). COPYRIGHT: (C)2003,JPO