Abstract:
PROBLEM TO BE SOLVED: To provide a positive-type radiation-sensitive resin composition capable of forming a cured film excellent in storage stability and in addition, sufficiently satisfying general characteristics such as sensitivity, developing adhesion, heat resistance, chemical resistance, transmittance and dielectric constant while retaining good surface hardness.SOLUTION: The positive-type radiation-sensitive resin composition comprises: [A] a polymer having a structural unit (I) containing at least one selected from the group comprising groups represented by formula (1) mentioned below and groups represented by formula (2) mentioned below and a structural unit (II) containing a cyclic ether structure or a cyclic carbonate structure; and [B] an acid generator. In the formula (1) mentioned below, Rand Rare each independently a hydrogen atom, a 1-4C alkyl group or a 1-4C fluorinated alkyl group. In the formula (2) mentioned below, Rand Rare each independently a hydrogen atom, a halogen atom, a 1-4C alkyl group or a 1-4C fluorinated alkyl group.
Abstract:
PROBLEM TO BE SOLVED: To provide a highly practical radiation sensitive resin composition which can simply and efficiently form a finer pattern, and can be applied to a process of manufacturing a semiconductor.SOLUTION: The radiation sensitive resin composition contains (A) a resin having a repeating unit represented by general formula (1), (D) an acid generator, and (E) a photodegradable base represented by general formula (8) (in general formula (1), Rrepresents a hydrogen atom or a methyl group, and Rrepresents a hydrocarbon group, and in the general formula (8), Rto Reach independently represents an alkyl group, an alkoxyl group, a hydroxyl group or a halogen atom, and Zrepresents anion such as OH, R-COOand R-SO).
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition suitably usable as a chemically amplified resist and excellent in storage stability. SOLUTION: The radiation-sensitive resin composition includes: (A) an acid generator represented by general formula (1-1) or general formula (1-2); (B) an acid diffusion inhibitor represented by general formula (2); and (C) a copolymer. In the general formulae (1-1) and (1-2), R 1 denotes alkyl or the like; M + denotes a monovalent cation; R 1a and R 1b each independently denote an organic group or the like; and Y denotes a divalent organic group or the like. In the general formula (2), R 2 , R 3 and R 4 are alkyl or the like. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To obtain a new substance which can be used as an acid-dissociating group-containing polymer having high transparency for radiations such as F2 excimer laser and satisfying basic performances required for resists, and to obtain a radiation-sensitive resin composition using the same. SOLUTION: The subject polyrotaxane comprises a fluorine-containing cyclodextrin represented by formula (1) and a linear polymer which passes through the cavity of this cyclic compound. The radiation-sensitive resin composition comprises the fluorine-containing cyclodextrin or the polyrotaxane as the acid-dissociating group-containing polymer, and a radiation-sensitive acid-producing agent. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a new polysiloxane that has high transparency to the radial rays of ≤200 nm wavelength, high resolution and excellent coating properties and is useful as a resin component for resists and bears a fluorine-containing norbornane skeleton and provide a radiation-sensitive resin composition including the same. SOLUTION: The polysiloxane comprises at least one of structural unit selected from a structural unit represented by formula (I) and a structural unit represented by formula (II) and at least one of structural unit selected from a structural unit represented by formula (III) and a structural unit represented by formula (IV) [wherein X 1 and X 2 are each H, a monovalent (halogenated) hydrocarbon, a halogen atom, or an amino; B is H or F; n and m are each 0 or 1, p is an integer of 1-10]. The radiation-sensitive resin composition includes the polysiloxane and the radiation-sensitive acid generator. COPYRIGHT: (C)2005,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation sensitive resin composition which has high transparency to radiations, and has excellent basic properties as a resist, such as sensitivity, dry etching resistance and pattern shapes, more particularly excellent solubility in a resist solvent and reduces the roughness of pattern side walls after development. SOLUTION: The radiation sensitive resin composition contains an acid dissociative group-containing resin which is insoluble in an alkali or hardly soluble in the alkali and is made easily soluble in the alkali by the effect of an acid and a radiation sensitive acid forming agent. The dissociative group-containing resin includes the recursive unit expressed by formula (1) and the ratio (Mw/Mn) of the weight average molecular weight and number average molecular weight thereof is COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To obtain a radiation-sensitive resin composition which is useful as a chemical amplification type resist sensitive to far ultra-violet rays, has improved dry etching resistance, high resolution and high radiation transmissivity, to provide a copolymer useful as its component and a polymer mixture. SOLUTION: The radiation-sensitive resin composition comprises (A) a polymer component such as a copolymer having a (meth)acrylate repeating unit protected with a cycloalkyl-based acid dissociating group, a hydroxystyrene-based repeating unit and a hydroxystyrene-based repeating unit protected with a specific acid-dissociable group and (B) a radiation-sensitive acid generator. COPYRIGHT: (C)2004,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide an antireflection film forming composition especially high in an antireflection effect and not causing intermixing, to provide a polymer especially useful for the antireflection film forming composition, and to provide an acenaphthylene derivative especially useful as a raw material or an intermediate for the polymer. SOLUTION: The acenaphthylene derivative comprises acetoxymethylacenaphthylene and hydroxymethylacenaphthylene. The polymer has structural units represented by formula (3) (wherein R 1 is a hydrogen atom or a monovalent organic group; and R 2 and R 3 are each a monovalent atom or a monovalent organic group). The antireflection film forming composition contains a polymer having the structural units and/or structural units derived from a styrene or a vinylnaphthalene having a group: -CH 2 OR 4 (wherein R 4 is a hydrogen atom or a monovalent organic group) in a benzene ring and a solvent. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition having high transparency to a short-wavelength radiation typified by far UV, excellent in basic physical properties as a resist, such as sensitivity, resolution, dry etching resistance and pattern shape, and ensuring few development defects. SOLUTION: The radiation-sensitive resin composition comprises (A) a resin which becomes alkali-soluble by the action of an acid and is typified by a resin having a repeating unit derived from acrylic acid derivatives substituted by a perfluoroalkyl group in the α-position and typified by 2-methyladamantan-2- yl α-trifluoromethylacrylate and a repeating unit derived from a (meth)acrylic acid derivative having a lactone skeleton in a side chain ester structure and (B) a radiation-sensitive acid generator. COPYRIGHT: (C)2004,JPO
Abstract:
PROBLEM TO BE SOLVED: To provide a new anthracene derivative as an additive for a radiation- sensitive resin composition useful for a chemical amplification resist optimally controlling the radiation transimmisivity and effectively suppressing a change in line breadth of a resist pattern due to fluctuation of film thickness of a resist film without especially deteriorating resolution performances and having excellent compatibility with other components in the composition with low sublimability. SOLUTION: The anthracene derivative is represented by general formula (1) [wherein, R 1 s denote each a hydroxy group or a 1-20C monovalent organic group; n denotes an integer of 0-9; X denotes a single bond or a 1-12C bivalent organic group; and R 2 denotes a monovalent acid-dissociable group]. The radiation-sensitive resin composition comprises (A) the anthracene derivative, (B) an alkali-insoluble or a sparingly alkali-soluble resin which becomes readily soluble in alkalis in the presence of an acid and (C) a radiation-sensitive acid generator. COPYRIGHT: (C)2004,JPO