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    Measuring apparatus for emissivity and temperature of object
    81.
    发明专利
    Measuring apparatus for emissivity and temperature of object 失效
    测量装置对物体的辐射和温度

    公开(公告)号：JPS61110018A

    公开(公告)日：1986-05-28

    申请号：JP23213184

    申请日：1984-11-02

    Applicant: Chino Works Ltd

    Inventor： HISHIKARI ISAO ,  IDE TOSHIHIKO

    IPC: G01J5/00

    CPC classification number: G01J5/08 ,  G01J5/0022 ,  G01J5/0831 ,  G01J5/0896 ,  G01J2005/0051 ,  G01J2005/0074 ,  G01J2005/068

    Abstract: PURPOSE:To enable measurement handily and in a wide range, by determining the ratio and difference between contribution rates of radiation sources which are difined as the ratio of difference between detection values of a scan type radiation thermometer as given when two radiation energies are incident on the thermometer from the radiation sources and when none is. CONSTITUTION:A scan type radiation thermometer 2 scans over an object 1 to be measured and feeds a output signal to an arithmetic means 6 corresponding to measuring positions. Here, output signals of radiation sources 31 and 32 when radiation thereof is reflected from the object 1 being measured are represented by E1 and E2 and those below them E0. Output signals of a temperature detector 5 which detects temperature signals Tr of the radiation sources 31 and 32 and a temperature signal Ta of a background radiation plate 4 are also fed to the arithmetic means 6. Then, the arithmetic means 6 determines the ratio of contribution rates of the radiation sources from the signals E0 and E1 and E2 to match a specified formula and further the emissivity epsilon by computation. The emissivity epsilon is used to determine the temperature T of the object 1 being measured by computation. In this manner, the emissivity epsilonof the object 1 being measured is determined from the contribution rates of the radiation sources 31 and 32 to obtain temperatures T at points.

    Abstract translation: 目的：通过确定辐射源的贡献率之间的比率和差异，使两种辐射能量入射时给出的扫描型辐射温度计的检测值之间的差值相差很大，从而能够在宽范围内实现测量。 辐射源的温度计，何时没有。 构成：扫描型辐射温度计2扫描要测量的物体1，并将输出信号馈送到对应于测量位置的算术装置6。 这里，当从被测量物体1反射的辐射源31和32的输出信号由E1和E2以及它们之下的E0表示。 检测辐射源31,32的温度信号Tr和背景辐射板4的温度信号Ta的温度检测器5的输出信号也被馈送到算术装置6.然后算术装置6确定贡献率 来自信号E0和E1和E2的辐射源的速率与指定的公式匹配，并通过计算进一步发射率ε。 发射率ε被用于确定通过计算测量的物体1的温度T. 以这种方式，从辐射源31和32的贡献率确定被测量物体1的发射率ε，以获得点处的温度T.

    INFRARED IMAGING DEVICE AND FIXED PATTERN NOISE DATA GENERATION METHOD
    83.
    发明公开
    INFRARED IMAGING DEVICE AND FIXED PATTERN NOISE DATA GENERATION METHOD 审中-公开

    公开(公告)号：US20240244348A1

    公开(公告)日：2024-07-18

    申请号：US18558514

    申请日：2021-06-18

    Applicant: Mitsubishi Electric Corporation

    Inventor： Masaharu HATTORI

    IPC: H04N25/671 ,  G01J5/48 ,  G01J5/70 ,  H04N23/20 ,  H04N25/21 ,  G01J5/00

    CPC classification number: H04N25/671 ,  G01J5/48 ,  G01J5/70 ,  H04N23/20 ,  H04N25/21 ,  G01J2005/0074

    Abstract: Provided here are: an infrared imaging element that receives infrared light to capture a thermal image; an element temperature sensor that detects a temperature of the infrared imaging element; an FPN memory that stores therein FPN data at each of the temperatures; a frame memory that saves a plurality of pieces of frame data composed of thermal images captured by the infrared imaging element in a fixed period of time; and an FPN data generation unit that, when an imaging target is determined not to have changed on the basis of the frame data, acquires from the FPN memory, the FPN data corresponding to the temperature of the infrared imaging element at which said frame data were obtained; and performs averaging processing between average values AF of the plurality of pieces of frame data and the thus-acquired FPN data, to thereby regenerate the FPN data in an updated manner.

    Infrared contrasting color temperature measurement system
    85.
    发明授权
    Infrared contrasting color temperature measurement system 有权

    公开(公告)号：US10054495B2

    公开(公告)日：2018-08-21

    申请号：US14190739

    申请日：2014-02-26

    Applicant: Exergen Corporation

    Inventor： Jason N. Jarboe

    IPC: G01J5/00 ,  G01J5/06 ,  G01K7/00

    CPC classification number: G01K7/003 ,  G01J5/0003 ,  G01J5/061 ,  G01J2005/0051 ,  G01J2005/0074

    Abstract: Devices and corresponding methods can be provided to measure temperature and/or emissivity of a target. Emissivity of the target need not be known or assumed, and any temperature difference between a sensor and the target need not be zeroed or minimized. No particular bandpass filter is required. Devices can include one or two sensors viewing the same target as the target views different respective viewed temperatures. The respective viewed temperatures can be sensor temperatures, and a single sensor can be set to each of the respective viewed temperatures at different times. An analyzer can determine the temperature and/or emissivity of the target based on the respective viewed temperatures and on plural net heat fluxes detected by the sensors and corresponding to the respective viewed temperatures.

    METHOD AND APPARATUS FOR MEASURING EMISSIVITY AND DENSITY OF CRUDE OIL
    87.
    发明申请
    METHOD AND APPARATUS FOR MEASURING EMISSIVITY AND DENSITY OF CRUDE OIL 审中-公开
    用于测量原油的排放和密度的方法和装置

    公开(公告)号：US20150139273A1

    公开(公告)日：2015-05-21

    申请号：US14404160

    申请日：2013-05-15

    Applicant: AKER SUBSEA LIMITED

    Inventor： Philip Michael Bagley ,  Robin Slater

    IPC: G01J5/10

    CPC classification number: G01J5/10 ,  G01J3/0243 ,  G01J5/0037 ,  G01J5/026 ,  G01J5/0806 ,  G01J5/0846 ,  G01J5/0875 ,  G01J5/0893 ,  G01J5/12 ,  G01J5/522 ,  G01J2005/0048 ,  G01J2005/0074 ,  G01N33/2823

    Abstract: Apparatus for use in the measurement of the API gravity of crude oil, comprises a conduit (1)for the oil, a thermo-couple (4) in the conduit for measuring temperature of the oil in contact therewith, a sapphire window (3) in the conduit, an infrared thermometer (5,6) for the measurement of the temperature of the oil through the window, and means (20) for comparing the measurements of temperature made by the thermometers to obtain a measure of the emissivity of the crude oil and thereby its API gravity.

    Abstract translation: 用于测量原油API重力的装置包括用于油的管道（1），用于测量与其接触的油的温度的管道中的热电偶（4），蓝宝石窗口（3） 在管道中，用于测量通过窗口的油的温度的红外温度计（5,6）和用于比较由温度计制成的温度测量值的装置（20），以获得粗品的发射率的量度 油因此其API重力。

    APPARATUS AND METHOD TO MEASURE TEMPERATURE OF 3D SEMICONDUCTOR STRUCTURES VIA LASER DIFFRACTION
    89.
    发明申请
    APPARATUS AND METHOD TO MEASURE TEMPERATURE OF 3D SEMICONDUCTOR STRUCTURES VIA LASER DIFFRACTION 有权
    通过激光衍射测量三维半导体结构温度的装置和方法

    公开(公告)号：US20130120737A1

    公开(公告)日：2013-05-16

    申请号：US13672117

    申请日：2012-11-08

    Applicant: Heng Pan ,  Matthew Scott Rogers ,  Aaron Muir Hunter ,  Stephen Moffatt

    Inventor： Heng Pan ,  Matthew Scott Rogers ,  Aaron Muir Hunter ,  Stephen Moffatt

    IPC: G01J5/08

    CPC classification number: G01J5/08 ,  G01J5/0007 ,  G01J5/0803 ,  G01J2005/0074 ,  G01J2005/0077

    Abstract: Embodiments of the present invention generally relate to apparatus for and methods of measuring and monitoring the temperature of a substrate having a 3D feature thereon. The apparatus include a light source for irradiating a substrate having a 3D feature thereon, a focus lens for gathering and focusing reflected light, and an emissometer for detecting the emissivity of the focused reflected light. The apparatus may also include a beam splitter and an imaging device. The imaging device provides a magnified image of the diffraction pattern of the reflected light. The method includes irradiating a substrate having a 3D feature thereon with light, and focusing reflected light with a focusing lens. The focused light is then directed to a sensor and the emissivity of the substrate is measured. The reflected light may also impinge upon an imaging device to generate a magnified image of the diffraction pattern of the reflected light.

    Abstract translation: 本发明的实施例一般涉及用于测量和监测其上具有3D特征的基板的温度的方法的装置。 该装置包括用于照射其上具有3D特征的基板的光源，用于聚焦和聚焦反射光的聚焦透镜，以及用于检测聚焦反射光的发射率的发射计。 该装置还可以包括分束器和成像装置。 成像装置提供反射光的衍射图案的放大图像。 该方法包括用光照射具有3D特征的基板，并且将聚焦透镜聚焦在反射光上。 然后将聚焦的光导向传感器，并测量衬底的发射率。 反射光也可能撞击成像装置以产生反射光的衍射图案的放大图像。

    Method for an IR-radiation—based temperature measurement and IR-radiation—based temperature measuring device
    90.
    发明授权
    Method for an IR-radiation—based temperature measurement and IR-radiation—based temperature measuring device 有权
    用于基于IR辐射的温度测量和基于IR辐射的温度测量装置的方法

    公开(公告)号：US08368021B2

    公开(公告)日：2013-02-05

    申请号：US13073147

    申请日：2011-03-28

    Applicant: Martin Stratmann ,  Sabine Hinkel ,  Daniel Auer ,  Patrick Zahn ,  Andreas Messerschmid

    Inventor： Martin Stratmann ,  Sabine Hinkel ,  Daniel Auer ,  Patrick Zahn ,  Andreas Messerschmid

    IPC: G02F1/01

    CPC classification number: G01J5/522 ,  G01J5/02 ,  G01J5/025 ,  G01J5/0265 ,  G01J5/08 ,  G01J5/0859 ,  G01J5/089 ,  G01J2005/0074 ,  G01J2005/0077

    Abstract: In a temperature measuring device (1) an IR-radiation detector (2) and a reference element (3) are provided, connected to a surface (6) of an object (7) in a heat-conducting fashion, with a first area (4) with high emissivity and a second area (5) with high reflectivity formed at the reference element (3), and the IR-radiation detector (2) is equipped for a separate detection of IR-radiation (9, 10, 11) from the first and second areas (4, 5) and a surface area (12) of the object (7). A computer (13) in the IR-radiation detector (2) is equipped to deduct a temperature measurement for the object (7), corrected for emissions and reflections from the detected IR-radiations (9, 10, 11).

    Abstract translation: 在温度测量装置（1）中，设置有IR辐射检测器（2）和参考元件（3），其以导热方式连接到物体（7）的表面（6），第一区域 （4）具有高发射率和在参考元件（3）处形成的具有高反射率的第二区域（5），并且IR辐射检测器（2）被配备用于单独检测IR辐射（9,10,11 ）从物体（7）的第一和第二区域（4,5）和表面区域（12）移动。 IR辐射检测器（2）中的计算机（13）被配备为从检测到的IR辐射（9,10,11）中校正​​发射和反射的物体（7）的温度测量值。

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