Abstract:
Provided is a polarization analysis apparatus that can quickly measure the polarization properties of a sample. The polarization analysis apparatus includes a light source configured to emit light in a predetermined wavelength region, a polarizer configured to transmit the light emitted from the light source, a spatial phase modulator configured to transmit the light from the sample, an analyzer configured to transmit the light that has passed through the spatial phase modulator, and an imaging spectrometer configured to receive the light that has passed through the analyzer. The spatial phase modulator is formed of a birefringent material, and is configured to have different phase differences at respective positions in a first direction in a plane orthogonal to an optical axis. The imaging spectrometer disperses the received light in a second direction that is different from the first direction in the plane orthogonal to the optical axis.
Abstract:
An adaptive optics apparatus includes a light modulation unit configured to modulate each of two polarization components of light at a position that is optically conjugate to an object, the light being emitted by a light source; and an irradiation unit configured to irradiate the object with light that is modulated by the light modulation unit.
Abstract:
An apparatus includes a light source configured to emit an electromagnetic wave; a spatial light modulator configured to modulate a wavefront of the electromagnetic wave to irradiate a sample; a plate with an aperture; a lens unit configured to set a focal point in the sample; a detector configured to detect light coming from the focal point of the sample through the aperture; and a controller configured to control the spatial light modulator based on the detected light by the detector.
Abstract:
A microscopy imaging system is disclosed that includes a light source system, a spectral shaper, a modulator system, an optics system, an optical detector and a processor. The light source system is for providing a first train of pulses and a second train of pulses. The spectral shaper is for spectrally modifying an optical property of at least some frequency components of the broadband range of frequency components such that the broadband range of frequency components is shaped producing a shaped first train of pulses to specifically probe a spectral feature of interest from a sample, and to reduce information from features that are not of interest from the sample. The modulator system is for modulating a property of at least one of the shaped first train of pulses and the second train of pulses at a modulation frequency. The optical detector is for detecting an integrated intensity of substantially all optical frequency components of a train of pulses of interest transmitted or reflected through the common focal volume. The processor is for detecting a modulation at the modulation frequency of the integrated intensity of substantially all of the optical frequency components of the train of pulses of interest due to the non-linear interaction of the shaped first train of pulses with the second train of pulses as modulated in the common focal volume, and for providing an output signal for a pixel of an image for the microscopy imaging system.
Abstract:
In an inspection system for planar objects having periodic structures, programmable optical Fourier filtering in the focal plane of a telecentric lens system is used to directly identify physical phenomena indicative of non-periodic defects. Lens assemblies and a coherent optical source are used to generate and observe a spatial Fourier transform of a periodic structure in the Fourier plane. Optical Fourier filtering (OFF) is performed in the focal plane using an electrically programmable and electrically alignable spatial light modulator. The spatial light modulator with high signal to noise ratio is electrically reconfigurable according to a feedback-driven, filter construction and alignment algorithm. The OFF enhances any non-periodic components present in the Fourier plane and final image plane of the object. A system having a plurality of inspection channels provides high-throughput inspection of objects with small non-periodic defects while maintaining high detection sensitivity.
Abstract:
In an inspection system for planar objects having periodic structures, programmable optical Fourier filtering in the focal plane of a telecentric lens system is used to directly identify physical phenomena indicative of non-periodic defects. Lens assemblies and a coherent optical source are used to generate and observe a spatial Fourier transform of a periodic structure in the Fourier plane. Optical Fourier filtering (OFF) is performed in the focal plane using an electrically programmable and electrically alignable spatial light modulator. The spatial light modulator with high signal to noise ratio is electrically reconfigurable according to a feedback-driven, filter construction and alignment algorithm. The OFF enhances any non-periodic components present in the Fourier plane and final image plane of the object. A system having a plurality of inspection channels provides high-throughput inspection of objects with small non-periodic defects while maintaining high detection sensitivity.
Abstract:
The invention relates to an assembly for a multispectral light emission, comprising at least one wide-band light source (1), a filter array (4) of multiple spectral filters, and an optical switch device (2) for controlling the passage of the light emitted from the light source (1) through the filter array (4). In one embodiment, the optical switch device (2) is made of an array of micromirrors (16) or micro-diaphragms and is designed and arranged such that the optical switch can guide light emitted from the light source (1) only through one or more arbitrarily specifiable spectral filters of the filter array (4) in a controlled manner. The invention also relates to a multispectral sensor comprising such an assembly for a multispectral light emission. The assembly allows a multispectral sensor to be provided inexpensively in a miniaturized design with a plurality of spectral channels.
Abstract:
In described examples, a spatial light modulator includes groups of pixels. Each group is arranged to transmit only a respective portion of a light spectrum. The respective portion has a respective dominant color. The respective portions of the light spectrum are distinct from one another, according to their respective dominant colors. Each group is controlled by a respective reset signal. The spatial light modulator is coupled to receive a selection from the integrated circuit and in response to the selection: cause a selected one of the groups to transmit its respective portion of the light spectrum; and cause an unselected one of the groups to block transmission of its respective portion of the light spectrum. A photodetector is coupled to: receive the respective portion of the light spectrum transmitted by the selected group; and output a signal indicating an intensity thereof.
Abstract:
A stimulated Raman scattering tomography system includes means for generating a first input light beam, means for generating a second input light beam, an objective, a condenser and a detector. The first input light beam is phase-modulated while the second input light beam is amplitude-modulated. The objective is configured to direct the first and second input light beams onto a sample. The condenser is configured to collect an output light beam from the sample. The is detector configured to detect at least a portion of the output light beam corresponding to the first input light beam. The system further includes means for forming a depth-resolved image of the sample from the detected portion of the output light beam.
Abstract:
An apparatus for detecting a material within a sample includes a light emitting unit for directing at least one light beam through the sample. A plurality of units receive the light beam that has passed through the sample and performs a spectroscopic analysis of the sample based on the received light beam. Each of the plurality of units analyze a different parameter with respect to the sample and provide a separate output signal with respect to the analysis. A processor detects the material with respect each of the provided separate output signals.