公开(公告)号：WO2012122151A1

公开(公告)日：2012-09-13

申请号：PCT/US2012/027833

申请日：2012-03-06

Applicant: HORIBA INSTRUMENTS INCORPORATED ,  GILMORE, Adam M. ,  TONG, Xiaomei

Inventor： GILMORE, Adam M. ,  TONG, Xiaomei

IPC: G01N21/64 ,  G01N21/31

CPC classification number: G01N33/18 ,  G01J3/021 ,  G01J3/0294 ,  G01J3/12 ,  G01J3/18 ,  G01J3/42 ,  G01J3/4406 ,  G01N21/33 ,  G01N21/645 ,  G01N2021/1734 ,  G01N2021/6417 ,  G01N2021/6421 ,  G01N2021/6491 ,  G01N2201/061 ,  G01N2201/127

Abstract: A system or method for analyzing a sample include an input light source, a double subtractive monochromator positioned to receive light from the input light source and to sequentially illuminate the sample with each of a plurality of wavelengths, a multi-channel fluorescence detector positioned to receive and substantially simultaneously detect multiple wavelengths of light emitted by the sample for each of the plurality of excitation wavelengths, an absorption detector positioned to receive and detect light passing through the sample, and a computer in communication with the monochromator, the fluorescence detector, and the absorption detector, the computer controlling the monochromator to sequentially illuminate the sample with each of the plurality of wavelengths while measuring absorption and fluorescence of the sample based on signals received from the fluorescence and absorption detectors

Abstract translation: 用于分析样本的系统或方法包括输入光源，双减色单色仪，定位成接收来自输入光源的光，并以多个波长中的每一个顺序照射样品;多通道荧光检测器，定位成接收 并且基本上同时检测由所述样品对于所述多个激发波长中的每一个发射的多个波长的光;吸收检测器，定位成接收和检测通过所述样品的光;以及计算机，其与所述单色仪，所述荧光检测器和 吸收检测器，控制单色仪的计算机根据从荧光和吸收检测器接收的信号测量样品的吸收和荧光，顺序地照射多个波长中的每个波长的样品

公开(公告)号：WO2006116478A3

公开(公告)日：2007-06-21

申请号：PCT/US2006015776

申请日：2006-04-25

Applicant: HORIBA JOBIN YVON INC ,  GILMORE ADAM M ,  MATTHEIS JAMES R

Inventor： GILMORE ADAM M ,  MATTHEIS JAMES R

IPC: G06F19/00

CPC classification number: G01N21/6489 ,  B82Y30/00

Abstract: A method for identification of a material by analysis of a sample of the material is disclosed. The method comprises illuminating the sample with a plurality of excitation wavelengths, measuring a plurality of emission wavelengths for each excitation wavelengths to define a measured three-dimensional intensity contour. The values of maxima are located in the three-dimensional intensity contour and are compared to a library of values of known maxima associated with known species. A model of a three-dimensional intensity contour is generated and compared to the measured three-dimensional contour to determine residual errors. A comparison of errors between the generated and measured three-dimensional contours. Error minimization is used to determine the correct model of the three dimensional intensity contour.

Abstract translation: 公开了通过材料样品的分析来鉴定材料的方法。 该方法包括用多个激发波长照射样品，测量每个激发波长的多个发射波长以限定测量的三维强度轮廓。 最大值的值位于三维强度轮廓中，并与已知物种相关联的已知最大值的值进行比较。 产生三维强度轮廓的模型，并与测量的三维轮廓进行比较，以确定残差。 比较生成和测量的三维轮廓之间的误差。 误差最小化用于确定三维强度轮廓的正确模型。

公开(公告)号：WO2006116478A2

公开(公告)日：2006-11-02

申请号：PCT/US2006/015776

申请日：2006-04-25

Applicant: HORIBA JOBIN YVON, INC. ,  GILMORE, Adam, M. ,  MATTHEIS, James, R.

Inventor： GILMORE, Adam, M. ,  MATTHEIS, James, R.

IPC: G06F19/00

CPC classification number: G01N21/6489 ,  B82Y30/00

Abstract: A method for identification of a material by analysis of a sample of the material is disclosed. The method comprises illuminating the sample with a plurality of excitation wavelengths, measuring a plurality of emission wavelengths for each excitation wavelengths to define a measured three-dimensional intensity contour. The values of maxima are located in the three-dimensional intensity contour and are compared to a library of values of known maxima associated with known species. A model of a three-dimensional intensity contour is generated and compared to the measured three-dimensional contour to determine residual errors. A comparison of errors between the generated and measured three-dimensional contours. Error minimization is used to determine the correct model of the three dimensional intensity contour.

Abstract translation: 公开了通过材料样品的分析来鉴定材料的方法。 该方法包括用多个激发波长照射样品，测量每个激发波长的多个发射波长以限定测量的三维强度轮廓。 最大值的值位于三维强度轮廓中，并与已知物种相关联的已知最大值的值进行比较。 产生三维强度轮廓的模型，并与测量的三维轮廓进行比较，以确定残差。 比较生成和测量的三维轮廓之间的误差。 误差最小化用于确定三维强度轮廓的正确模型。