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    PULSED LASER ATOM PROBE AND ASSOCIATED METHODS
    2.
    发明申请
    PULSED LASER ATOM PROBE AND ASSOCIATED METHODS 审中-公开
    脉冲激光原子探针和相关方法

    公开(公告)号：WO2008109875A1

    公开(公告)日：2008-09-12

    申请号：PCT/US2008/056326

    申请日：2008-03-07

    Applicant: IMAGO SCIENTIFIC INSTRUMENTS CORPORATION ,  BUNTON, Joseph, Hale

    Inventor： BUNTON, Joseph, Hale

    IPC: G01N23/00

    CPC classification number: H01J49/0004 ,  B82Y15/00 ,  H01J49/164

    Abstract: The present invention is directed generally toward atom probe specimen shape, atom probe control, data and associated systems and methods. Aspects of the invention are directed toward improving mass resolution by utilizing a pulsed laser system configured to reduce the laser spot size to 5 microns or less.

    Abstract translation: 本发明通常涉及原子探针样品形状，原子探针控制，数据和相关系统和方法。 本发明的方面旨在通过利用被配置为将激光光斑尺寸减小到5微米或更小的脉冲激光系统来改善质量分辨率。

    ATOM PROBE EVAPORATION PROCESSES
    3.
    发明申请
    ATOM PROBE EVAPORATION PROCESSES 审中-公开
    原子探针蒸发过程

    公开(公告)号：WO2007016299A2

    公开(公告)日：2007-02-08

    申请号：PCT/US2006/029324

    申请日：2006-07-28

    Applicant: IMAGO SCIENTIFIC INSTRUMENTS CORPORATION ,  OLSON, Jesse, D. ,  LENZ, Daniel, R. ,  PAYNE, Timothy, R.

    Inventor： OLSON, Jesse, D. ,  LENZ, Daniel, R. ,  PAYNE, Timothy, R.

    IPC: G01N27/00

    CPC classification number: H01J37/285 ,  H01J37/265 ,  H01J2237/2852 ,  H01J2237/2855

    Abstract: The present invention relates to atom probe evaporation processes. For example, certain aspects are directed toward methods for controlling an evaporation process in an atom probe that includes initiating the atom probe evaporation process and monitoring a parameter associated with material being evaporated from a specimen. The method can further include controlling at least one characteristic of the atom probe evaporation process to attain a desired evaporation rate or characteristic. In selected embodiments, monitoring a parameter associated with material being evaporated can include monitoring an evaporation rate, mass-to- charge ratios of evaporated ions, a mass resolution, a composition of material being evaporated, and/or the like. In certain embodiments, controlling at least one characteristic can include controlling a pulse energy, a pulse frequency, a bias energy, and/or the like. In other embodiments, various portions of the above process can be computer implemented.

    Abstract translation: 本发明涉及原子探针蒸发方法。 例如，某些方面涉及用于控制原子探针中的蒸发过程的方法，其包括引发原子探针蒸发过程并监测与样品蒸发的材料相关的参数。 该方法还可以包括控制原子探针蒸发过程的至少一个特性以获得所需的蒸发速率或特性。 在所选择的实施例中，监测与被蒸发的材料相关联的参数可以包括监测蒸发速率，蒸发离子的质量 - 电荷比，质量分辨率，被蒸发的材料的组成和/或类似物。 在某些实施例中，控制至少一个特性可包括控制脉冲能量，脉冲频率，偏置能量等。 在其他实施例中，可以计算机实现上述过程的各个部分。

    ATOM PROBE
    4.
    发明申请
    ATOM PROBE 审中-公开
    ATOM探索

    公开(公告)号：WO2006134380A2

    公开(公告)日：2006-12-21

    申请号：PCT/GB2006/002209

    申请日：2006-06-16

    Applicant: IMAGO SCIENTIFIC INSTRUMENTS CORPORATION ,  PANAYI, Peter

    Inventor： PANAYI, Peter

    IPC: H01J49/40

    CPC classification number: H01J49/405 ,  H01J49/0004

    Abstract: Aspects of the present invention are directed generally toward atom probe and three-dimensional atom probe microscopes. For example, certain aspects of the invention are directed -toward an atom probe or a three-dimensional atom probe that includes a sub-nanosecond laser to evaporate ions from a specimen under analysis and a reflectron for reflecting the ions. In further aspects of the invention, the reflectron can include a front electrode and a back electrode. At least one of the front and back electrodes can be capable of generating a curved electric field. Additionally, the front electrode and back electrodes can be configured to perform time focusing and resolve an image of a specimen.

    Abstract translation: 本发明的方面通常涉及原子探针和三维原子探针显微镜。 例如，本发明的某些方面涉及原子探针或三维原子探针，该原子探针或三维原子探针包括用于蒸发分析中的样品的离子的亚纳秒激光和用于反射离子的反射器。 在本发明的其它方面，反射器可以包括前电极和后电极。 前电极和后电极中的至少一个能够产生弯曲的电场。 此外，前电极和背电极可以被配置为执行时间聚焦并且解析样本的图像。

    SPECIMENS FOR MICROANALYSIS PROCESSES
    7.
    发明申请
    SPECIMENS FOR MICROANALYSIS PROCESSES 审中-公开
    微观分析方法样本

    公开(公告)号：WO2008057066A2

    公开(公告)日：2008-05-15

    申请号：PCT/US2006/029323

    申请日：2006-07-28

    Applicant: IMAGO SCIENTIFIC INSTRUMENTS CORPORATION ,  GOODMAN, Steven, L. ,  KELLY, Tomas, F. ,  TOMICKI, Terri, J.

    Inventor： GOODMAN, Steven, L. ,  KELLY, Tomas, F. ,  TOMICKI, Terri, J.

    IPC: H01J49/02

    CPC classification number: G01N1/36 ,  Y10T436/2525

    Abstract: The present invention relates to specimens for use in microanalysis processes. One aspect of the invention is directed toward using a mold to form specimens for a microanalysis process (e.g., including an atom probe and/or transmission electron microscope processes). Other aspects of the invention are directed towards embedding specimen material (e.g., including nanoparticles) in an embedment material to produce a specimen suitable for use in a microanalysis process. Still other aspects include combining specimen material with an embedment material to enhance a microanalysis process. Yet other embodiments of the invention are directed toward combining a specimen material with multiple embedment materials to produce specimens suitable for a microanalysis process. Further aspects of the invention are directed toward analyzing at least a portion of a specimen produced by one or more of the processes discussed above.

    Abstract translation: 本发明涉及用于微量分析方法的试样。 本发明的一个方面涉及使用模具来形成用于微量分析方法的样品（例如，包括原子探针和/或透射电子显微镜方法）。 本发明的其它方面涉及将样品材料（例如，包括纳米颗粒）嵌入到嵌入材料中以产生适合用于微量分析过程的试样。 还有一些方面包括将样品材料与嵌入材料组合以增强微量分析过程。 本发明的其它实施方案涉及将样品材料与多种嵌入材料组合以产生适于微量分析工艺的试样。 本发明的另外方面涉及分析由上述一个或多个过程产生的样本的至少一部分。

    ATOM PROBES, ATOM PROBE SPECIMENS, AND ASSOCIATED METHODS
    8.
    发明申请
    ATOM PROBES, ATOM PROBE SPECIMENS, AND ASSOCIATED METHODS 审中-公开
    原子探针，原子探针样本和相关方法

    公开(公告)号：WO2007022265A2

    公开(公告)日：2007-02-22

    申请号：PCT/US2006/031982

    申请日：2006-08-15

    Applicant: IMAGO SCIENTIFIC INSTRUMENTS CORPORATION ,  KELLY, Thomas, F. ,  BUNTON, Joseph, Hale ,  WIENER, Scott, Albert

    Inventor： KELLY, Thomas, F. ,  BUNTON, Joseph, Hale ,  WIENER, Scott, Albert

    IPC: G01N23/00

    CPC classification number: G01N23/22

    Abstract: The present invention relates generally to atom probes, atom probe specimens, and associated methods. For example, certain aspects are directed toward methods for analyzing a portion of a specimen that includes selecting a region of interest and moving a portion of material in a border region proximate to the region of interest so that at least a portion of the region of interest protrudes relative to at least a portion of the border region. The method further includes analyzing a portion of the region of interest. Other aspects of the invention are directed toward a method for applying photonic energy in an atom probe process by passing photonic energy through a lens system separated from a photonic device and spaced apart from the photonic device. Yet other aspects of the invention are directed toward a method for reflecting photonic energy off an outer surface of an electrode onto a specimen.

    Abstract translation: 本发明一般涉及原子探针，原子探针样本和相关方法。 例如，某些方面针对用于分析样本的一部分的方法，该方法包括选择感兴趣区域并移动靠近感兴趣区域的边界区域中的材料的一部分，使得感兴趣区域的至少一部分 相对于边界区域的至少一部分突出。 该方法还包括分析感兴趣区域的一部分。 本发明的其它方面涉及一种用于通过使光子能量穿过从光子器件分离并与光子器件间隔开的透镜系统而在原子探针过程中施加光子能量的方法。 本发明的其他方面涉及用于将光子能量从电极外表面反射到样品上的方法。

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