IDENTIFICATION OF BROMINATED FLAME RETARDANT ADDITIVES IN POLYMERS BY INFRARED SPECTROSCOPY
    1.
    发明申请
    IDENTIFICATION OF BROMINATED FLAME RETARDANT ADDITIVES IN POLYMERS BY INFRARED SPECTROSCOPY 审中-公开
    通过红外光谱鉴定聚合物中阻燃阻燃添加剂

    公开(公告)号:WO2006019627A3

    公开(公告)日:2007-01-04

    申请号:PCT/US2005024345

    申请日:2005-07-08

    Abstract: An infrared spectrometry scan of a polymer sample is obtained (10). Using a first set of parameters, the obtained IR scan is compared to a first database (15), and a first hit score is calculated (20). Based on the results of the first hit score, a second database is selected (30) from among a number of databases (30a, 30b, , 30n) and the obtained infrared spectrometry scan is compared to the various scans contained in the selected database (35) using a parameter set that corresponds to the selected database, and a second hit score is calculated (40). Using the second hit score, another set of parameters (60a, 60b, , 60x)is selected (60), and the obtained infrared spectrometry scan is compared (65) to the various scans contained in the selected third database using this additional parameter set, and a third hit score is calculated (70). Based on the second and third hit scores, the identity of the brominated flame retardant in the polymer sample is determined (75).

    Abstract translation: 获得聚合物样品的红外光谱扫描(10)。 使用第一组参数,将获得的IR扫描与第一数据库(15)进行比较,并计算第一命中得分(20)。 基于第一命中得分的结果,从多个数据库(30a,30b,...,30n)中选择第二数据库(30),并将所获得的红外光谱扫描与包含在所选择的数据库中的各种扫描( 35),使用与所选数据库相对应的参数集,并计算第二命中得分(40)。 使用第二命中得分,选择另一组参数(60a,60b,,60x)(60),并且使用该附加参数集将获得的红外光谱扫描与包含在所选择的第三数据库中的各种扫描进行比较(65) ,并计算第三命中得分(70)。 基于第二和第三命中得分,确定聚合物样品中溴化阻燃剂的特性(75)。

    METHOD FOR DETERMINING CHEMICAL CONTENT OF COMPLEX STRUCTURES USING X-RAY MICROANALYSIS

    公开(公告)号:WO2006057744A3

    公开(公告)日:2006-06-01

    申请号:PCT/US2005/038033

    申请日:2005-10-21

    Abstract: A method for identifying hazardous substances in a printed wiring assembly having a plurality of discrete components, using micro X-ray fluorescence spectroscopy (Fig. 1). A micro X-ray fluorescence spectroscopy (µ-XRF) and/or X-ray Absorption Fine Structure (XAFS) spectroscopy are used as detecting analyzers, to identify materials of concern in an electronic device. The device or assembly to be examined is analyzed by moving it in the X, Y, and Z directions under a probe in response to information in a reference database (130), to determine elemental composition at selected locations on the assembly (125), the probe positioned at an optimum analytical distance from each selected location for analysis (120). The determined elemental composition at each selected location is then correlated to the reference database, and the detected elements are assigned to the various components in the assembly (140).

    IDENTIFICATION OF BROMINATED FLAME RETARDANT ADDITIVES IN POLYMERS BY INFRARED SPECTROSCOPY
    3.
    发明申请
    IDENTIFICATION OF BROMINATED FLAME RETARDANT ADDITIVES IN POLYMERS BY INFRARED SPECTROSCOPY 审中-公开
    通过红外光谱鉴定聚合物中阻燃阻燃添加剂

    公开(公告)号:WO2006019627A2

    公开(公告)日:2006-02-23

    申请号:PCT/US2005/024345

    申请日:2005-07-08

    Abstract: An infrared spectrometry scan of a polymer sample is obtained. Using a first set of parameters, the obtained IR scan is compared to a first database, and a first hit score is calculated. Based on the results of the first hit score, a second database is selected from among a number of databases, and the obtained infrared spectrometry scan is compared to the various scans contained in the selected database using a parameter set that corresponds to the selected database, and a second hit score is calculated. Using the second hit score, another set of parameters is selected, and the obtained infrared spectrometry scan is compared to the various scans contained in the selected third database using this additional parameter set, and a third hit score is calculated. Based on the second and third hit scores, the identity of the brominated flame retardant in the polymer sample is determined.

    Abstract translation: 获得聚合物样品的红外光谱扫描。 使用第一组参数,将获得的IR扫描与第一数据库进行比较,并计算第一命中得分。 基于第一命中得分的结果,从多个数据库中选择第二数据库,并使用与所选择的数据库相对应的参数集,将获得的红外光谱扫描与包含在所选数据库中的各种扫描进行比较, 并计算第二个命中得分。 使用第二命中得分,选择另一组参数,并且使用该附加参数集将所获得的红外光谱扫描与所选择的第三数据库中包含的各种扫描进行比较,并且计算第三命中得分。 基于第二和第三命中得分,确定聚合物样品中溴化阻燃剂的特性。

    METHOD OF QUANTITATIVELY MEASURING TRACE AMOUNTS OF METALS IN POLYMER SAMPLES
    4.
    发明申请
    METHOD OF QUANTITATIVELY MEASURING TRACE AMOUNTS OF METALS IN POLYMER SAMPLES 审中-公开
    在聚合物样品中定量测量痕量金属的方法

    公开(公告)号:WO2007103614A2

    公开(公告)日:2007-09-13

    申请号:PCT/US2007/061898

    申请日:2007-02-09

    CPC classification number: G01N23/223 G01N2223/076

    Abstract: A method of quantitatively measuring (50) trace amounts of metals in polymer samples using x-rays to fluoresce and detect metals that are present in the polymer sample is disclosed. The polymer sample is ground (10) to a powder and formed into a thin film (20) by heat and pressure. The film is then analyzed (30) using energy dispersive x-ray fluorescence spectrometry, and the data (40) representing the amounts of the various metals present in the sample is multiplied by one or more correlation factors that have been determined from measurement of characterized polymers that have similar composition to the polymer sample and that bracket a range of metal concentrations in the sample.

    Abstract translation: 公开了一种使用x射线发射荧光并检测存在于聚合物样品中的金属定量测量(50)聚合物样品中痕量金属的方法。 将聚合物样品研磨(10)成粉末并通过加热和加压形成薄膜(20)。 然后使用能量色散x射线荧光光谱法分析膜(30),并且表示样品中存在的各种金属的量的数据(40)乘以一个或多个相关因子,所述相关因子已经从表征 与聚合物样品具有相似组成的聚合物,并支持样品中一系列金属浓度。

    METHOD OF MEASURING HEXAVALENT CHROMIUM IN ELECTRONIC COMPONENTS AND ASSEMBLIES
    5.
    发明申请
    METHOD OF MEASURING HEXAVALENT CHROMIUM IN ELECTRONIC COMPONENTS AND ASSEMBLIES 审中-公开
    在电子元件和组件中测量六价铬的方法

    公开(公告)号:WO2007047209A3

    公开(公告)日:2007-06-14

    申请号:PCT/US2006039428

    申请日:2006-10-05

    CPC classification number: G01N33/20 G01N31/22 G01N2223/303

    Abstract: Hexavalent chromium in electronic components and assemblies is measured using x-ray fluorescence spectroscopy to analyze the sample to identify the matrix. Based on the ascertained matrix, a protocol is selected from a variety of extraction and analysis protocols, and the hexavalent chromium is extracted from the sample using the selected protocol. The extracted hexavalent chromium is reacted with 1,5 diphenylcarbazide and measured using ultraviolet spectroscopy using a unique calibration curve for each type of identified matrix. Based on the measured amount of hexavalent chromium, the concentration of hexavalent chromium is calculated as a function of a unit area of the sample.

    Abstract translation: 使用X射线荧光光谱法测量电子元件和组件中的六价铬以分析样品以鉴定基质。 基于确定的基质,从各种提取和分析方案中选择一种方案,并且使用所选择的方案从样品中提取六价铬。 提取的六价铬与1,5二苯卡巴肼反应,并使用紫外光谱法对每种类型的识别基质使用独特的校准曲线进行测量。 基于测量的六价铬的量,六价铬的浓度计算为样品单位面积的函数。

    METHOD FOR DETERMINING CHEMICAL CONTENT OF COMPLEX STRUCTURES USING X-RAY MICROANALYSIS
    6.
    发明申请
    METHOD FOR DETERMINING CHEMICAL CONTENT OF COMPLEX STRUCTURES USING X-RAY MICROANALYSIS 审中-公开
    使用X射线微观分析法确定复合结构化学成分的方法

    公开(公告)号:WO2006057744A2

    公开(公告)日:2006-06-01

    申请号:PCT/US2005038033

    申请日:2005-10-21

    Abstract: A method for identifying hazardous substances in a printed wiring assembly having a plurality of discrete components, using micro X-ray fluorescence spectroscopy. A micro X-ray fluorescence spectroscopy (µ-XRF) and/or X-ray Absorption Fine Structure (XAFS) spectroscopy are used as detecting analyzers, to identify materials of concern in an electronic device. The device or assembly to be examined is analyzed by moving it in the X, Y, and Z directions under a probe in response to information in a reference database, to determine elemental composition at selected locations on the assembly, the probe positioned at an optimum analytical distance from each selected location for analysis. The determined elemental composition at each selected location is then correlated to the reference database, and the detected elements are assigned to the various components in the assembly.

    Abstract translation: 一种使用微X射线荧光光谱法鉴定具有多个分立元件的印刷线路组件中的有害物质的方法。 使用微X射线荧光光谱(μ-XRF)和/或X射线吸收精细结构(XAFS)光谱作为检测分析仪,以识别电子设备中关注的材料。 要检查的设备或组件是通过在探针下在X,Y和Z方向上移动来响应于参考数据库中的信息来分析的,以确定组件上选定位置处的元素组成,探针定位在最佳状态 从每个选定位置的分析距离进行分析。 然后将确定的每个选定位置的元素组成与参考数据库相关联,并将检测到的元素分配给组件中的各种组件。

    METHOD OF MEASURING HEXAVALENT CHROMIUM IN ELECTRONIC COMPONENTS AND ASSEMBLIES
    8.
    发明申请
    METHOD OF MEASURING HEXAVALENT CHROMIUM IN ELECTRONIC COMPONENTS AND ASSEMBLIES 审中-公开
    测量电子元件和组件中的六价铬的方法

    公开(公告)号:WO2007047209A2

    公开(公告)日:2007-04-26

    申请号:PCT/US2006/039428

    申请日:2006-10-05

    CPC classification number: G01N33/20 G01N31/22 G01N2223/303

    Abstract: Hexavalent chromium in electronic components and assemblies is measured using x-ray fluorescence spectroscopy to analyze the sample to identify the matrix. Based on the ascertained matrix, a protocol is selected from a variety of extraction and analysis protocols, and the hexavalent chromium is extracted from the sample using the selected protocol. The extracted hexavalent chromium is reacted with 1,5 diphenylcarbazide and measured using ultraviolet spectroscopy using a unique calibration curve for each type of identified matrix. Based on the measured amount of hexavalent chromium, the concentration of hexavalent chromium is calculated as a function of a unit area of the sample.

    Abstract translation: 使用x射线荧光光谱法测量电子部件和组件中的六价铬,以分析样品以鉴定基质。 基于确定的矩阵,从各种提取和分析方案中选择方案,并且使用所选择的方案从样品中提取六价铬。 提取的六价铬与1,5二苯卡巴肼反应,并使用紫外光谱法,使用每种类型的鉴定基质的唯一校准曲线进行测量。 根据测定的六价铬量,计算六价铬的浓度作为样品单位面积的函数。

    METHOD OF QUANTITATIVELY MEASURING TRACE AMOUNTS OF METALS IN POLYMER SAMPLES
    9.
    发明申请
    METHOD OF QUANTITATIVELY MEASURING TRACE AMOUNTS OF METALS IN POLYMER SAMPLES 审中-公开
    定量测量聚合物样品中金属的追踪量的方法

    公开(公告)号:WO2007103614A3

    公开(公告)日:2007-12-13

    申请号:PCT/US2007061898

    申请日:2007-02-09

    CPC classification number: G01N23/223 G01N2223/076

    Abstract: A method of quantitatively measuring (50) trace amounts of metals in polymer samples using x-rays to fluoresce and detect metals that are present in the polymer sample is disclosed. The polymer sample is ground (10) to a powder and formed into a thin film (20) by heat and pressure. The film is then analyzed (30) using energy dispersive x-ray fluorescence spectrometry, and the data (40) representing the amounts of the various metals present in the sample is multiplied by one or more correlation factors that have been determined from measurement of characterized polymers that have similar composition to the polymer sample and that bracket a range of metal concentrations in the sample.

    Abstract translation: 公开了一种使用X射线定量测量(50)微量金属的聚合物样品中的荧光和检测存在于聚合物样品中的金属的方法。 将聚合物样品粉碎(10)到粉末中,并通过热和压力形成薄膜(20)。 然后使用能量色散X射线荧光光谱法分析膜(30),并且将表示样品中存在的各种金属的量的数据(40)乘以一个或多个相关因子,这些相关因子由已测定的特征 与聚合物样品具有相似组成并且包含样品中一定范围的金属浓度的聚合物。

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