Super heterojunction semiconductor device structure and its fabrication method
    2.
    发明授权
    Super heterojunction semiconductor device structure and its fabrication method 有权
    超级异质半导体器件结构及其制造方法

    公开(公告)号:KR101167530B1

    公开(公告)日:2012-07-20

    申请号:KR20120001306

    申请日:2012-01-05

    Abstract: PURPOSE: A super hetero-junction semiconductor device and a manufacturing method thereof are provided to regularly control impurity concentration filler by minimizing co-doping between p-filler and n-filler due to inter-diffusion. CONSTITUTION: A first conductive type silicon semiconductor substrate doped to high concentration is prepared. A first conductive epitaxial layer is formed at the upper side of the first conductive type silicon semiconductor substrate. A plurality of first conductive type fillers is formed by etching the first conductive epitaxial layer as a predetermined distance. A plurality of second conductive type fillers is composed of a SiGe single epitaxial layer having a single composition or a plurality of SiGe single epitaxial layers having a plurality of compositions in order to prevent co-doping of impurities.

    Abstract translation: 目的:提供超异质结半导体器件及其制造方法,以通过最小化由互扩散引起的p-填料和n-填料之间的共掺杂来规则地控制杂质浓度填料。 构成:制备掺杂高浓度的第一导电型硅半导体衬底。 第一导电外延层形成在第一导电型硅半导体衬底的上侧。 通过将第一导电外延层蚀刻为预定距离来形成多个第一导电型填料。 多个第二导电型填料由具有单一组成的SiGe单一外延层或具有多个组成的多个SiGe单一外延层组成,以防止杂质的共掺杂。

Patent Agency Ranking