Abstract:
A contact grid array interconnect (100) element for mounting an IC package (130) to a substrate. The interconnect comprises an insulating stand-off post (110) having opposing ends. An electrically conductive core (105) is embedded in and traverses the post. Conductive endplates (125, 127) are located on the opposing ends (117, 120) of the post and contact the core.
Abstract:
An IC assembly (10) having a die mounted on a substrate (16) with a gap therebetween, receives underfill material (12) through an aperture (32) provided in the substrate to fill the gap. This provides a favorable flow rate and improved underfilling, with less voiding. Embodiments of the invention are disclosed in which capillary action, a vacuum, or positive pressure, are used to assist the flow of underfill material.
Abstract:
A contact grid array interconnect (100) element for mounting an IC package (130) to a substrate. The interconnect comprises an insulating stand-off post (110) having opposing ends. An electrically conductive core (105) is embedded in and traverses the post. Conductive endplates (125, 127) are located on the opposing ends (117, 120) of the post and contact the core.
Abstract:
An IC assembly (10) having a die mounted on a substrate (16) with a gap therebetween, receives underfill material (12) through an aperture (32) provided in the substrate to fill the gap. This provides a favorable flow rate and improved underfilling, with less voiding. Embodiments of the invention are disclosed in which capillary action, a vacuum, or positive pressure, are used to assist the flow of underfill material.