Abstract:
According to embodiments, a phase change memory (PCM) array includes a plurality of memory cells grouped into memory blocks. In the PCM array, each memory cell is a PCM cell. The PCM array also includes a plurality of erase flag cells. Each erase flag cell of the plurality of erase flag cells is associated with a memory block and indicates whether the memory block stores valid data or erased data.
Abstract:
According to embodiments, a phase change memory (PCM) array includes a plurality of memory cells grouped into memory blocks. In the PCM array, each memory cell is a PCM cell. The PCM array also includes a plurality of erase flag cells. Each erase flag cell of the plurality of erase flag cells is associated with a memory block and indicates whether the memory block stores valid data or erased data.
Abstract:
An avalance diode including, between two heavily-doped regions of opposite conductivity types arranged at the surface of a semiconductor region, a lightly-doped region, with length L of the lightly-doped region between the heavily-doped regions approximately ranging between 50 and 200 nm.
Abstract:
The present disclosure relates to a low consumption flip-flop circuit with data retention, comprising at least one flip-flop and at least one retention cell connected to the output of the flip-flop and configured so that during normal operation of the flip-flop circuit, the retention cell transmits the data or logic state present on the output terminal of the flip-flop to its own output terminal, while during low consumption operation of the flip-flop circuit a latch circuit of the retention cell suitable to memorize data or a logic state corresponding to the last data or logic state present on the output terminal of the flip-flop is activated.
Abstract:
The present disclosure relates to a low consumption flip-flop circuit with data retention, comprising at least one flip-flop and at least one retention cell connected to the output of the flip-flop and configured so that during normal operation of the flip-flop circuit, the retention cell transmits the data or logic state present on the output terminal of the flip-flop to its own output terminal, while during low consumption operation of the flip-flop circuit a latch circuit of the retention cell suitable to memorize data or a logic state corresponding to the last data or logic state present on the output terminal of the flip-flop is activated.
Abstract:
A device for a system on a chip (SOC), the device includes: a comparator that includes a first input port, a second input port, and an output port. A first input signal and a second input signal are split into N bit pairs that include one bit from the first input signal and one bit from the second input signal. The comparator is configured so a mismatch between the first input signal and the second input signal causes an output signal to assume a first expected state. The device further comprises a test controller to perform a first operability test by mismatching the N bit pairs and verifying that the output signal assumes the first expected state.
Abstract:
A laser diode projecting apparatus which comprises: at least two laser diodes each emitting radiation towards a respective focal point at a pre-defined wavelength, and wherein the at least two respective focal points are separated from each other by at least an offset distance; and a power controller operative to control the intensity of the radiation emitted from each of the at least two laser diodes; and wherein the aggregated value of the radiation intensity emitted by all of the at least two laser diodes within a predefined period of time, exceeds a threshold value allowed for the maximum permissible exposure to radiation.
Abstract:
A laser diode projecting apparatus which comprises: at least two laser diodes each emitting radiation towards a respective focal point at a pre-defined wavelength, and wherein the at least two respective focal points are separated from each other by at least an offset distance; and a power controller operative to control the intensity of the radiation emitted from each of the at least two laser diodes; and wherein the aggregated value of the radiation intensity emitted by all of the at least two laser diodes within a predefined period of time, exceeds a threshold value allowed for the maximum permissible exposure to radiation.