公开(公告)号：US20240255441A1

公开(公告)日：2024-08-01

申请号：US18418249

申请日：2024-01-20

Applicant: UTPVISION S.R.L.

Inventor： Roberto Finazzi ,  Sergio Sigala

IPC: G01N21/952 ,  G01M13/005 ,  G01N21/88

CPC classification number: G01N21/952 ,  G01N21/8806 ,  G01M13/005 ,  G01N2201/0634

Abstract: An apparatus for detecting surface defects in objects comprises one or more illuminating devices configured to emit at least a light radiation and illuminate an object to be inspected. The detection apparatus is further configured to measure the light radiation received by the object, and also comprises one or more image acquisition devices configured to acquire one or more images of the object, when illuminated by the illuminating device, and a data processor configured to process the images acquired by the image acquisition device and provide detection data indicative of the presence of surface defects on the object.

公开(公告)号：US20230049391A1

公开(公告)日：2023-02-16

申请号：US17795139

申请日：2021-02-11

Applicant: UTPVISION S.R.L.

Inventor： Roberto Finazzi ,  Sergio Sigala

IPC: G01N21/88 ,  G06T7/00 ,  G06V10/141

Abstract: The present invention relates to a device (1) for detecting surface defects in an object (100), for example an industrial gasket. The detection device comprises lighting means (2) configured to illuminate said object with a first light radiation (L1) having a first lighting direction (D1) or with a second light radiation (L2) having a second lighting direction (D2). According to the invention, the detection device comprises acquisition means (30) configured to acquire a plurality of B/W images of said object, when illuminated by said lighting means.

公开(公告)号：WO2015056186A1

公开(公告)日：2015-04-23

申请号：PCT/IB2014/065328

申请日：2014-10-15

Applicant: UTPVISION S.R.L.

Inventor： FINAZZI, Roberto

IPC: G01M13/00 ,  G01N21/95

CPC classification number: G01N21/9515 ,  G01M13/005 ,  G01N33/445

Abstract: The invention relates to a test assembly (1) for inspecting an O-ring (100). Such an assembly comprises a support plane (30) on which said O-ring rests and two discs (10,11), which are coplanar on said support plane (30) and arranged in adjacent position. Such discs rotate on said support plane (30) independently about respective axes (50, 51). The test assembly further comprises image acquisition means (40', 40") of said O-ring arranged at least on one side of said support plane (30) to acquire images of said O-ring. The two discs are configured to rotate in synchronized manner in discordant sense according to at least one first deformed configuration. The image acquisition means (40',40") are configured instead to acquire at least one first image of said O-ring in said first deformed configuration.

Abstract translation: 本发明涉及一种用于检查O型圈（100）的测试组件（1）。 这种组件包括在其上安置有所述O形环的支撑平面（30）和在所述支撑平面（30）上共面并布置在相邻位置的两个盘（10,11）。 这种盘片围绕相应的轴线（50,51）独立地在所述支撑平面（30）上旋转。 测试组件还包括设置在所述支撑平面（30）的至少一侧上的所述O形环的图像获取装置（40'，40“），以获取所述O形环的图像。 根据至少一个第一变形构型，以不一致的方式同步方式，将图像获取装置（40'，40“）配置成在所述第一变形构造中获取所述O形环的至少一个第一图像。

公开(公告)号：WO2021160709A1

公开(公告)日：2021-08-19

申请号：PCT/EP2021/053271

申请日：2021-02-11

Applicant: UTPVISION S.R.L

Inventor： FINAZZI, Roberto ,  SIGALA, Sergio

IPC: G01N21/88 ,  G01N21/95

Abstract: The present invention relates to a device (1) for detecting surface defects in an object (100), for example an industrial gasket. The detection device comprises lighting means (2) configured to illuminate said object with a first light radiation (L1) having a first lighting direction (D1) or with a second light radiation (L2) having a second lighting direction (D2). According to the invention, the detection device comprises acquisition means (30) configured to acquire a plurality of B/W images of said object, when illuminated by said lighting means.

公开(公告)号：WO2015121803A1

公开(公告)日：2015-08-20

申请号：PCT/IB2015/051020

申请日：2015-02-11

Applicant: UTPVISION S.R.L.

Inventor： FINAZZI, Roberto ,  MONTAGNA, Alessandro

IPC: G01B11/24 ,  G01N21/88 ,  G01N21/95

CPC classification number: G01B11/04 ,  G01B2210/44 ,  G01N21/8806 ,  G01N21/9515 ,  G01N2021/8841

Abstract: There is described an apparatus for obtaining images of an element (50) to be inspected, comprising first acquisition means (1 1 ) and second screening means (22) which can be activated according to a first activation mode, and deactivated according to a first deactivation mode; second acquisition means (21 ) and first screening means (12) which can be activated according to a second activation mode, and deactivated according to a second deactivation mode; the first acquisition means (1 1 ), the first screening means (12), the second acquisition means (21 ) and the second screening means (22) aligned along a common optical axis (100); wherein said first activation and deactivation mode and said second activation and deactivation mode occur in a predetermined sequence in order to obtain images of the first side (51 ) and of the second side (52) of the element (50), wherein said first screening means (12) and said second screening means (22) include an optical device (17), respectively, in turn containing a plate-like body (13) provided with colorless and light-diffusing impurities, said impurities adapted to modify the optical path of an input light beam which crosses said plate-like body (13), said plate-like body (13) also operatively coupled to at least one LED (120, 121, 122, 123).

Abstract translation: 描述了一种用于获得要检查的元件（50）的图像的装置，包括可以根据第一激活模式被激活的第一获取装置（11）和第二屏蔽装置（22），并且根据第一 停用模式; 第二获取装置（21）和第一屏蔽装置（12），其可以根据第二激活模式被激活，并且根据第二去激活模式被去激活; 第一采集装置（11），第一屏蔽装置（12），第二采集装置（21）和第二屏蔽装置（22）沿共同的光轴（100）排列; 其中所述第一激活和去激活模式以及所述第二激活和去激活模式以预定顺序发生，以便获得元件（50）的第一侧（51）和第二侧（52）的图像，其中所述第一屏蔽 装置（12）和所述第二屏蔽装置（22）分别包括一个光学装置（17），它们又分别包含一个具有无色和光漫射杂质的板状体（13），所述杂质适于改变光路 穿过所述板状体（13）的输入光束，所述板状体（13）还可操作地耦合到至少一个LED（120,121,122,123）。

公开(公告)号：EP3865863A1

公开(公告)日：2021-08-18

申请号：EP20179900.4

申请日：2020-06-15

Applicant: UTPVision S.r.l.

Inventor： Finazzi, Roberto ,  Sigala, Sergio

IPC: G01N21/88 ,  G01N21/95

Abstract: The present invention relates to a device (1) for detecting surface defects in an object (100), for example an industrial gasket.
The detection device comprises lighting means (2) configured to illuminate said object with a first light radiation (L1) having a first lighting direction (D1) or with a second light radiation (L2) having a second lighting direction (D2).
According to the invention, the detection device comprises acquisition means (3) configured to acquire a plurality of B/W images (I1, I2) of said object at respective acquisition times, when illuminated by said lighting means. Wherein the B/W images are made available to data processing means (7) for further processing each at a time interval which is partially overlapped with a subsequent acquisition time.

公开(公告)号：EP3058330A1

公开(公告)日：2016-08-24

申请号：EP14806413.2

申请日：2014-10-15

Applicant: UTPVision S.r.l.

Inventor： FINAZZI, Roberto

IPC: G01M13/00 ,  G01N21/95

CPC classification number: G01N21/9515 ,  G01M13/005 ,  G01N33/445

Abstract: The invention relates to a test assembly (1) for inspecting an O-ring (100). Such an assembly comprises a support plane (30) on which said O-ring rests and two discs (10,11), which are coplanar on said support plane (30) and arranged in adjacent position. Such discs rotate on said support plane (30) independently about respective axes (50, 51). The test assembly further comprises image acquisition means (40', 40") of said O-ring arranged at least on one side of said support plane (30) to acquire images of said O-ring. The two discs are configured to rotate in synchronized manner in discordant sense according to at least one first deformed configuration. The image acquisition means (40',40") are configured instead to acquire at least one first image of said O-ring in said first deformed configuration.

公开(公告)号：EP2280270B1

公开(公告)日：2015-09-02

申请号：EP10171195.0

申请日：2010-07-29

Applicant: UTPVision S.r.l.

Inventor： Finazzi, Roberto

IPC: G01N21/88 ,  G01N21/95

CPC classification number: G01N21/8806 ,  G01N21/952 ,  G01N2021/8816 ,  G01N2021/8845 ,  G01N2201/0626 ,  G01N2201/0627

公开(公告)号：EP4411352A1

公开(公告)日：2024-08-07

申请号：EP23218502.5

申请日：2023-12-20

Applicant: UTPVision S.r.l.

Inventor： Finazzi, Roberto ,  Sigala, Sergio

IPC: G01N21/952 ,  G01N21/958 ,  G01N21/88 ,  G01N21/95 ,  G01N21/94

CPC classification number: G01N21/958 ,  G01N21/9515 ,  G01N21/952 ,  G01N21/8806 ,  G01N21/94

Abstract: Apparatus for detecting surface defects in objects comprising illuminating means configured to emit at least a light radiation and illuminate an object to be inspected. The detection apparatus according to the invention comprises a measuring device of the light radiation received by said object.
According to an aspect of the invention, the detection apparatus also comprises image acquisition means configured to acquire one or more images of said object, when illuminated by said illuminating means, and data processing means configured to process the images acquired by said image acquisition means and provide detection data indicative of the presence of surface defects on said object.

公开(公告)号：EP3105542B1

公开(公告)日：2020-03-11

申请号：EP15711837.3

申请日：2015-02-11

Applicant: UTPVision S.r.l.

Inventor： FINAZZI, Roberto ,  MONTAGNA, Alessandro

IPC: G01N21/952 ,  G01B11/04 ,  G01N21/95 ,  G01N21/88

Abstract: There is described an apparatus for obtaining images of an element (50) to be inspected, comprising first acquisition means (1 1 ) and second screening means (22) which can be activated according to a first activation mode, and deactivated according to a first deactivation mode; second acquisition means (21 ) and first screening means (12) which can be activated according to a second activation mode, and deactivated according to a second deactivation mode; the first acquisition means (1 1 ), the first screening means (12), the second acquisition means (21 ) and the second screening means (22) aligned along a common optical axis (100); wherein said first activation and deactivation mode and said second activation and deactivation mode occur in a predetermined sequence in order to obtain images of the first side (51 ) and of the second side (52) of the element (50), wherein said first screening means (12) and said second screening means (22) include an optical device (17), respectively, in turn containing a plate-like body (13) provided with colorless and light-diffusing impurities, said impurities adapted to modify the optical path of an input light beam which crosses said plate-like body (13), said plate-like body (13) also operatively coupled to at least one LED (120, 121, 122, 123).