Abstract:
The invention relates to a test assembly (1) for inspecting an O-ring (100). Such an assembly comprises a support plane (30) on which said O-ring rests and two discs (10,11), which are coplanar on said support plane (30) and arranged in adjacent position. Such discs rotate on said support plane (30) independently about respective axes (50, 51). The test assembly further comprises image acquisition means (40', 40") of said O-ring arranged at least on one side of said support plane (30) to acquire images of said O-ring. The two discs are configured to rotate in synchronized manner in discordant sense according to at least one first deformed configuration. The image acquisition means (40',40") are configured instead to acquire at least one first image of said O-ring in said first deformed configuration.
Abstract:
The present invention relates to a device (1) for detecting surface defects in an object (100), for example an industrial gasket. The detection device comprises lighting means (2) configured to illuminate said object with a first light radiation (L1) having a first lighting direction (D1) or with a second light radiation (L2) having a second lighting direction (D2). According to the invention, the detection device comprises acquisition means (30) configured to acquire a plurality of B/W images of said object, when illuminated by said lighting means.
Abstract:
There is described an apparatus for obtaining images of an element (50) to be inspected, comprising first acquisition means (1 1 ) and second screening means (22) which can be activated according to a first activation mode, and deactivated according to a first deactivation mode; second acquisition means (21 ) and first screening means (12) which can be activated according to a second activation mode, and deactivated according to a second deactivation mode; the first acquisition means (1 1 ), the first screening means (12), the second acquisition means (21 ) and the second screening means (22) aligned along a common optical axis (100); wherein said first activation and deactivation mode and said second activation and deactivation mode occur in a predetermined sequence in order to obtain images of the first side (51 ) and of the second side (52) of the element (50), wherein said first screening means (12) and said second screening means (22) include an optical device (17), respectively, in turn containing a plate-like body (13) provided with colorless and light-diffusing impurities, said impurities adapted to modify the optical path of an input light beam which crosses said plate-like body (13), said plate-like body (13) also operatively coupled to at least one LED (120, 121, 122, 123).
Abstract:
The invention relates to a test assembly (1) for inspecting an O-ring (100). Such an assembly comprises a support plane (30) on which said O-ring rests and two discs (10,11), which are coplanar on said support plane (30) and arranged in adjacent position. Such discs rotate on said support plane (30) independently about respective axes (50, 51). The test assembly further comprises image acquisition means (40', 40") of said O-ring arranged at least on one side of said support plane (30) to acquire images of said O-ring. The two discs are configured to rotate in synchronized manner in discordant sense according to at least one first deformed configuration. The image acquisition means (40',40") are configured instead to acquire at least one first image of said O-ring in said first deformed configuration.
Abstract:
There is described an apparatus for obtaining images of an element (50) to be inspected, comprising first acquisition means (1 1 ) and second screening means (22) which can be activated according to a first activation mode, and deactivated according to a first deactivation mode; second acquisition means (21 ) and first screening means (12) which can be activated according to a second activation mode, and deactivated according to a second deactivation mode; the first acquisition means (1 1 ), the first screening means (12), the second acquisition means (21 ) and the second screening means (22) aligned along a common optical axis (100); wherein said first activation and deactivation mode and said second activation and deactivation mode occur in a predetermined sequence in order to obtain images of the first side (51 ) and of the second side (52) of the element (50), wherein said first screening means (12) and said second screening means (22) include an optical device (17), respectively, in turn containing a plate-like body (13) provided with colorless and light-diffusing impurities, said impurities adapted to modify the optical path of an input light beam which crosses said plate-like body (13), said plate-like body (13) also operatively coupled to at least one LED (120, 121, 122, 123).
Abstract:
There is described an apparatus for obtaining images of an element (50) to be inspected, comprising first acquisition means (1 1 ) and second screening means (22) which can be activated according to a first activation mode, and deactivated according to a first deactivation mode; second acquisition means (21 ) and first screening means (12) which can be activated according to a second activation mode, and deactivated according to a second deactivation mode; the first acquisition means (1 1 ), the first screening means (12), the second acquisition means (21 ) and the second screening means (22) aligned along a common optical axis (100); wherein said first activation and deactivation mode and said second activation and deactivation mode occur in a predetermined sequence in order to obtain images of the first side (51 ) and of the second side (52) of the element (50), wherein said first screening means (12) and said second screening means (22) include an optical device (17), respectively, in turn containing a plate-like body (13) provided with colorless and light-diffusing impurities, said impurities adapted to modify the optical path of an input light beam which crosses said plate-like body (13), said plate-like body (13) also operatively coupled to at least one LED (120, 121, 122, 123).