Abstract:
A quantum efficiency measurement method includes the steps of: disposing a sample at a predetermined position in an integrator having an integrating space; applying excitation light to the sample and measuring a spectrum in the integrating space as a first spectrum through a second window; configuring an excitation light incident portion so that excitation light after having passed through the sample is not reflected in the integrating space; applying the excitation light to the sample and measuring a spectrum in the integrating space as a second spectrum through the second window; and calculating a quantum efficiency of the sample based on a component constituting a part of the first spectrum and corresponding to a wavelength range of the excitation light, and a component constituting a part of the second spectrum and corresponding to a wavelength range of light generated by the sample from the received excitation light.
Abstract:
A quantum efficiency measurement method includes the steps of: disposing a sample at a predetermined position in an integrator having an integrating space; applying excitation light to the sample and measuring a spectrum in the integrating space as a first spectrum through a second window; configuring an excitation light incident portion so that excitation light after having passed through the sample is not reflected in the integrating space; applying the excitation light to the sample and measuring a spectrum in the integrating space as a second spectrum through the second window; and calculating a quantum efficiency of the sample based on a component constituting a part of the first spectrum and corresponding to a wavelength range of the excitation light, and a component constituting a part of the second spectrum and corresponding to a wavelength range of light generated by the sample from the received excitation light.
Abstract:
A first member including a plurality of contacting portions and an absorbing portion capable of absorbing displacement of the contacting portions, a second member provided capable of relatively displacing with respect to the first member by contacting with the plurality of contacting portions, and a pressing mechanism configured to press the first member against the second member are provided. Therefore, for example, since the absorbing portion is capable of absorbing the displacement of the contacting portion, it is possible to make friction performance appropriate by stabilizing an area of a friction place.
Abstract:
In a wave number region of measurement of a gas to be measured, an absorbance of the gas is found to calculate a concentration thereof, and the concentration is compared with a threshold value (FIG. 3; S8). When the concentration exceeds the threshold value, an absorbance of an interference-component gas is found to calculate a concentration thereof in a wave number region of measurement of the interference-component gas (S9). The concentration of the interference-component gas is compared with a threshold value of the concentration of the interference-component gas (S10) to generate information indicating that the concentration of the gas to be measured is high when the concentration of the interference-component gas is within the threshold value (S11).
Abstract translation:在要测量的气体的波数测量区域中,发现气体的吸光度计算其浓度,并将浓度与阈值进行比较(图3; S 8)。 当浓度超过阈值时,发现干扰成分气体的吸光度计算干涉成分气体的测量波数区域的浓度(S 9)。 将干扰成分气体的浓度与干扰成分气体的浓度的阈值进行比较(S10),以产生表示当干扰成分浓度的浓度时待测气体的浓度高的信息 气体在阈值内(S11)。
Abstract:
An optical measurement apparatus includes a hemispherical portion having a diffuse reflection layer on an inner wall, and a plane portion disposed to involve a substantial center of curvature of the hemispherical portion and close an opening of the hemispherical portion, and having a reflection layer on an inner surface side of the hemispherical portion. The plane portion includes: at least one of a window for introducing light to be homogenized in an integrating space formed between the hemispherical portion and the plane portion, and a window for extracting light homogenized in the integrating space; an outer portion formed of a first material chiefly causing specular reflection, and occupying at least a region of a predetermined width from an outermost circumference; and an inner portion formed of a second material chiefly causing diffuse reflection and having a higher reflectance for at least an ultraviolet region than the first material.
Abstract:
A disk brake apparatus that can suppress vibration and a brake noise phenomenon in a low deceleration range and increase braking force in a high deceleration range. In the low deceleration range a push surface at a tip of a small-diameter push portion of an inner piston pushes a back plate of a brake pad at a center of the push surface corresponding to a radial inside where deflection and inclination of a disk rotor is insignificant, thereby suppressing the vibration and brake noise phenomenon in the low deceleration range. In the high deceleration range the back plate of the brake pad is pushed at a radially outside push location of the disk rotor in an aperture-side end face of an outer piston, thereby making the braking force in the high deceleration range larger than the braking force in the low deceleration range.
Abstract:
An optical measurement apparatus includes a hemispherical portion having a diffuse reflection layer on an inner wall, and a plane portion disposed to involve a substantial center of curvature of the hemispherical portion and close an opening of the hemispherical portion, and having a reflection layer on an inner surface side of the hemispherical portion. The plane portion includes: at least one of a window for introducing light to be homogenized in an integrating space formed between the hemispherical portion and the plane portion, and a window for extracting light homogenized in the integrating space; an outer portion formed of a first material chiefly causing specular reflection, and occupying at least a region of a predetermined width from an outermost circumference; and an inner portion formed of a second material chiefly causing diffuse reflection and having a higher reflectance for at least an ultraviolet region than the first material.
Abstract:
An FTIR measurement is conducted on a background gas to obtain a single beam spectrum SB(BG) [C] and a synthetic single beam spectrum SSB(BG)[D], and an FTIR measurement is conducted on a sample gas to obtain a single beam spectrum SB(Samp)[E] and a synthetic single beam spectrum SSB(Samp)[F]. A double synthetic absorbance spectrum DSAbs of the sample gas as expressed by the following formula (Step T9) is calculated to obtain a concentration of a trace component (impurity) contained in the sample gas:DSAbs =−log[SB(Samp) SSB(BG)/SSB(Samp) SB(BG)]
Abstract:
An FTIR measurement is conducted on a background gas to obtain a single beam spectrum SB(BG) [C] and a synthetic single beam spectrum SSB(BG)[D], and an FTIR measurement is conducted on a sample gas to obtain a single beam spectrum SB(Samp)[E] and a synthetic single beam spectrum SSB(Samp)[F]. A double synthetic absorbance spectrum DSAbs of the sample gas as expressed by the following formula (Step T9) is calculated to obtain a concentration of a trace component (impurity) contained in the sample gas: DSAbs =−log[SB(Samp) SSB(BG)/SSB(Samp) SB(BG)]
Abstract:
A disk brake apparatus that can suppress vibration and a brake noise phenomenon in a low deceleration range and increase braking force in a high deceleration range. In the low deceleration range a push surface at a tip of a small-diameter push portion of an inner piston pushes a back plate of a brake pad at a center of the push surface corresponding to a radial inside where deflection and inclination of a disk rotor is insignificant, thereby suppressing the vibration and brake noise phenomenon in the low deceleration range. In the high deceleration range the back plate of the brake pad is pushed at a radially outside push location of the disk rotor in an aperture-side end face of an outer piston, thereby making the braking force in the high deceleration range larger than the braking force in the low deceleration range.