Abstract:
A point-contact heterojunction silicon solar cell having a passivation layer on a p-n junction interface is provided to reduce an interfacial defect by minimizing a contact area between amorphous silicon and crystalline silicon. A passivation layer(305) is formed on an interface between a crystalline silicon wafer(300) of a first type and an amorphous silicon layer(310) of a second type wherein a plurality of voids penetrating the front and back surfaces of the passivation layer are formed in the passivation layer. The crystalline silicon wafer of the first type comes in contact with the amorphous silicon layer of the second type only by the voids. The passivation layer can be selected from SiO2, SiC, SiNx and intrinsic amorphous silicon.