公开(公告)号：KR1020110061401A

公开(公告)日：2011-06-09

申请号：KR1020090118028

申请日：2009-12-01

Applicant: 고려대학교 산학협력단

Inventor： 정성우 ,  이준희 ,  공준호

IPC: G06F1/04 ,  G06F1/08

Abstract: PURPOSE: A CPU frequency selection device and a method thereof are provided to select an optimal CPU frequency by repeating a stability test. CONSTITUTION: A frequency control module(210) receives CPU frequency information and increases or decreases the CPU clock by the set frequency value. A stability test module(220) inspects the stability about the changed CPU frequency. A frequency extracting module(230) selects an optimal CPU frequency by controlling the stability test module and the frequency control module. If a problem is detected in a CPU host frequency upscaling process, the frequency extracting module selects the previous frequency as a CPU host frequency.

Abstract translation: 目的：提供CPU频率选择装置及其方法，通过重复稳定性测试来选择最佳CPU频率。 构成：频率控制模块（210）接收CPU频率信息，并将CPU时钟增加或减少设定的频率值。 稳定性测试模块（220）检查关于改变的CPU频率的稳定性。 频率提取模块（230）通过控制稳定性测试模块和频率控制模块来选择最佳CPU频率。 如果在CPU主机升频过程中检测到问题，则频率提取模块选择先前的频率作为CPU主机频率。

公开(公告)号：KR102057724B1

公开(公告)日：2019-12-19

申请号：KR1020180059843

申请日：2018-05-25

Applicant: 고려대학교 산학협력단

Inventor： 이준희 ,  홍성준 ,  오학주

IPC: G06F11/07

公开(公告)号：KR101104471B1

公开(公告)日：2012-01-12

申请号：KR1020090118028

申请日：2009-12-01

Applicant: 고려대학교 산학협력단

Inventor： 정성우 ,  이준희 ,  공준호

IPC: G06F1/04 ,  G06F1/08

Abstract: 본 발명은 효과적인 CPU(Central Processing Unit) 오버클럭킹(Overclocking)을 위한 CPU 주파수 선택 장치 및 그 방법에 관한 것으로, 더욱 상세하게는 CPU 전압은 유지하면서 일정하게 CPU 주파수를 증가시키고 안정성 검사를 반복적으로 수행함으로써 시스템 환경에서 안정성을 보장하는 최고 성능의 CPU 주파수를 선택하여 성능 향상 및 에너지 효율적인 CPU 오버클럭킹이 가능한 CPU 주파수 선택 장치 및 그 방법에 관한 것이다.

CPU 주파수, 오버클록킹, 안정성

公开(公告)号：KR1020130113072A

公开(公告)日：2013-10-15

申请号：KR1020120035364

申请日：2012-04-05

Applicant: 고려대학교 산학협력단

Inventor： 서성규 ,  백세환 ,  이준희

IPC: G01N21/31

Abstract: PURPOSE: An absorbance measuring device using a complementary metal-oxide semiconductor (CMOS) image sensor is provided to measure the absorbance with higher sensitivity and precision than an existing absorbance measuring device. CONSTITUTION: An absorbance measuring device (100) comprises an RGB light emitting diode (LED)(110), a pin hole (120), a well plate (130), a film mask cover (131), a CMOS image sensor (140), a distance control part (150), a temperature control part (160), and a support part (170). The RGB LED radiates light to a sample injected in the well plate. The pin hole is coupled to the bottom of the RGB LED. The pin hole collects emitted light and radiates the collected light to the well plate. The well plate is positioned under the RGB LED and comprises multiple wells. The mask film cover is arranged above the well plate to constantly radiate the light emitted from the RGB LED. The CMOS image sensor is positioned under the well plate to detect the absorbance of the sample injected in the wells. The distance control part is coupled to the CMOS image sensor to control a distance between the CMOS image sensor and the well plate. The temperature control part surrounds the well plate to control the temperature of the sample injected in the wells. The support part is coupled to the RGB LED to support the RGB LED.

Abstract translation: 目的：提供使用互补金属氧化物半导体（CMOS）图像传感器的吸光度测量装置，以比现有的吸光度测量装置更高的灵敏度和精度来测量吸光度。 构成：吸光度测量装置（100）包括RGB发光二极管（LED）（110），针孔（120），孔板（130），膜掩模罩（131），CMOS图像传感器（140） ），距离控制部（150），温度控制部（160）和支撑部（170）。 RGB LED将光照射到在孔板中注入的样品。 针孔耦合到RGB LED的底部。 针孔收集发射的光并将收集的光辐射到孔板。 井板位于RGB LED下方，包括多个井。 掩模膜盖布置在孔板上方，以恒定地辐射从RGB LED发出的光。 CMOS图像传感器位于孔板下面以检测注入孔中的样品的吸光度。 距离控制部分耦合到CMOS图像传感器以控制CMOS图像传感器和阱板之间的距离。 温度控制部分围绕井板以控制注入井中的样品的温度。 支撑部分耦合到RGB LED以支持RGB LED。