ReRAM 소자 및 그의 제조 방법
    1.
    发明公开
    ReRAM 소자 및 그의 제조 방법 无效
    RERAM装置及其制造方法

    公开(公告)号:KR1020100107905A

    公开(公告)日:2010-10-06

    申请号:KR1020090026250

    申请日:2009-03-27

    CPC classification number: H01L45/04 G11C13/0004 H01L29/517

    Abstract: PURPOSE: A ReRAM device and a manufacturing method thereof are provided to improve the interfacial property and memory property of a ReRAM device by forming a second electrode layer pattern after forming an adhesive patter between the second electrode pattern and a metal oxide layer. CONSTITUTION: A substrate(100) comprises a substrate insulating layer(120) and a substrate body layer(110). A first electrode layer(200) is formed on the substrate. A metal oxide layer(300) is formed on the first electrode layer. A self-assembled monolayer, which includes an aperture pattern exposing the metal oxide layer, is formed on the metal oxide layer. A second electrode layer pattern(500) is formed on the metal oxide layer.

    Abstract translation: 目的:提供ReRAM器件及其制造方法,以通过在形成第二电极图案和金属氧化物层之间的粘合剂图案之后形成第二电极层图案来改善ReRAM器件的界面特性和存储特性。 构成:衬底(100)包括衬底绝缘层(120)和衬底主体层(110)。 在基板上形成第一电极层(200)。 在第一电极层上形成金属氧化物层(300)。 在金属氧化物层上形成包括露出金属氧化物层的孔径图案的自组装单层。 在金属氧化物层上形成第二电极层图案(500)。

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