公开(公告)号：KR1020090126052A

公开(公告)日：2009-12-08

申请号：KR1020080052202

申请日：2008-06-03

Applicant: 삼성전자주식회사

Inventor： 김범준 ,  이종환 ,  백범기 ,  김성만 ,  한혜리 ,  이종혁 ,  김유준

IPC: G02F1/133 ,  G02F1/136

CPC classification number: G02F1/136204 ,  G02F1/1309 ,  G02F1/1345 ,  G02F2001/136254 ,  H01L22/32 ,  H01L27/0248 ,  H01L27/12 ,  H01L27/124 ,  H01L2924/0002 ,  H01L2924/00

Abstract: PURPOSE: A TFT(Thin Film Transistor) in which a test process facilitates and a display device including the same are provided to easily perform a test process according to a structure of a shorting bar and a connection wire. CONSTITUTION: A first signal wiring is extended toward a first direction. A signal line pad is formed in one end of the first signal wiring. Shorting bars(50a, 50b) are formed in the other end of the signal wiring in order to decentralize the static electricity of the signal wiring and extended toward the first direction. A connection wiring(60) electrically connects the signal wiring and shorting bar. The first signal wiring comprises the even numbered turn and the odd numbered signal wiring and is electrically connected to the shorting bar'.

Abstract translation: 目的：提供一种其中测试过程有利的TFT（薄膜晶体管）和包括其的显示装置，以容易地根据短路棒和连接线的结构执行测试过程。 构成：第一个信号线路向第一个方向延伸。 信号线焊盘形成在第一信号布线的一端。 在信号线的另一端形成有短路棒（50a，50b），以分散信号线的静电并向第一方向延伸。 连接布线（60）电连接信号线和短路棒。 第一信号线包括偶数转和奇数信号线，并且电连接到短路棒'。