公开(公告)号：KR1020070092411A

公开(公告)日：2007-09-13

申请号：KR1020060022516

申请日：2006-03-10

Applicant: 삼성전자주식회사

Inventor： 김재완 ,  유석인 ,  김창효 ,  전형조 ,  강지훈 ,  최규남 ,  이원희 ,  엄용훈 ,  이재원 ,  박노갑

IPC: G01N21/896

Abstract: A method of inspecting a panel and a system of inspecting the panel are provided to perform objective quality management by automatically operating the inspection system. A method of inspecting a panel includes the steps of setting a point where difference of brightness gets out of a predetermined range as a spot point in a sample panel, extracting numerical information corresponding to a defective region in the sample panel from the spot point(S70), calculating statistically accuracy of defective decision in the sample panel(S80), outputting a function showing a defective rate of the sample panel based on statistically calculated value, and the numerical information extracted from the spot point, and discriminating whether the panel to be inspected is bad by inputting the numerical information of the panel to be inspected into the function and by comparing the numerical information with a predetermined reference value.

Abstract translation: 提供检查面板和检查面板的系统的方法，以通过自动操作检查系统来进行客观的质量管理。 一种检查面板的方法包括以下步骤：将亮度差作为样品面板中的点的预定范围的点设定为从点（S70）提取与样品面板中的缺陷区域相对应的数值信息 ），计算样本面板中的故障判定的统计学准确度（S80），根据统计计算值输出示出样本面板的缺陷率的功能，以及从点点提取的数值信息，以及判别面板是否 通过将要检查的面板的数字信息输入到功能中并通过将数字信息与预定的参考值进行比较来检查是不好的。