Abstract:
동기식 반도체 메모리 장치에서 라스 액티브 레이턴시 기능을 수행하는 회로가 개시된다. 라스 액티브 레이턴시 기능 수행 회로는 동기회로와 파이프라인을 구비한다. 동기 회로는 라스 뱅크 액티브 커맨드를 생성하는 제어 신호들 및 라스 뱅크 액티브 커맨드에 대응되는 어드레스 신호를 내부 클락 신호에 동기시켜 전송한다. 파이프라인은 동기 회로를 통해 전송되는 제어 신호들과 어드레스 신호를 소정의 지연 시간만큼 지연하여 지연 제어 신호들과 지연 어드레스 신호를 발생한다. 동기 회로를 통해 전송되는 제어 신호들과 상기 파이프라인을 통해 발생되는 지연 제어 신호들의 논리 조합 및 지연 어드레스 신호에 의해 상기 라스 뱅크 액티브 커맨드에 대응되는 동작이 수행된다. 라스 액티브 레이턴시 기능 수행 회로는 리플레쉬 타임을 유지하면서 커맨드와 어드레스를 전송하는 버스의 사용 효율을 향상시킬 있다.
Abstract:
A power up signal generator includes a signal converter for converting an applied external source voltage to a voltage applied at a trigger node when the external source voltage rises to a first threshold, and a current source for flowing a reference current from the trigger node. A first inverter connected to the trigger node outputs a low level signal when the trigger node voltage reaches a second threshold. A second inverter outputs a power up signal after receiving the low level signal from the first inverter. The signal converter may include a PMOS transistor configuration, such that the trip voltage of the power up signal generator is dependent only on a single MOSFET transistor threshold voltage.
Abstract:
PURPOSE: A semiconductor memory device is provided to be capable of easily controlling a bit line sensing operation without increasing a layout area. CONSTITUTION: A cell bit line precharge circuit(40) precharges a cell bit line pair(BLcell,BLBcell) by a voltage lower than the first voltage in response to a cell bit line precharge control signal(BLPRE). An SA(Sense Amplifier) bit line precharge circuit(44) precharges an SA bit line pair(BLsa,BLBsa) by the first voltage in response to an SA bit line precharge control signal(SAPRE). A charge transfer circuit(42,50) transfers charges between the cell bit line pair and the SA bit line pair in response to a control signal. The first sense amplifier circuit(46) amplifies a voltage of the SA bit line pair by the first voltage. The second sense amplifier circuit(48) amplifies a voltage of the SA bit line pair by the second voltage in response to an SA enable signal.
Abstract:
PURPOSE: A circuit for generating an internal voltage is provided to control accurately a level of the internal voltage when an overshooting phenomenon is generated from the internal voltage. CONSTITUTION: A discharge current circuit(30) including the first and the second NMOS transistors(N4,N5) and a variable resistance(R1) is installed between a node(B) and ground voltage. The first NMOS transistor(N4) of the discharge current circuit(30) includes a drain connected with the node(B) and a gate. The second NMOS transistor(N5) includes a drain connected with the node(B), a source connected with the ground voltage, and a gate connected with a source of the first NMOS transistor(N4). The variable resistance(R1) is connected between the gate of the second NMOS transistor(N5) and the ground voltage.
Abstract:
A device according to the invention includes memory cells and a current sense amplifier. It also includes a feedback circuit to adjust a gain of the current sense amplifier. The gain is adjusted depending on relative delays of data stored in different ones of the memory cells to be read on the current sense amplifier.
Abstract:
An input buffer circuit simultaneously supports a low voltage interface and a general low voltage transistor-transistor logic (LVTTL) interface and operates at high speed. In the input buffer circuit, a self bias voltage generated by a self biased differential amplification circuit is used not only for tracking a common mode input voltage in the differential amplification circuit but also for controlling the current of a current source and/or sink that controls the current used in the differential amplification circuit. Accordingly, the self bias voltage remains at a substantially uniform level. Therefore, the entire transconductance gain gm of the differential amplification circuit is substantially uniform regardless of the change in a reference voltage input to the differential amplification circuit. As a result, a low voltage interface characteristic is improved. The input buffer circuit can further include a swing width control circuit that responds to an inverted signal generated from the output signal of the differential amplification circuit and prevents the voltage swing of the output signal from becoming excessively large. This reduces skew and thus improves the operating speed of the input buffer.
Abstract:
여기에 개시되는 퓨즈 회로는 제 1 및 제 2 노드들에 각각 연결된 퓨즈 소자들과, 상기 퓨즈 소자들을 통해 흐르는 전류들의 차를 감지하는 감지 회로 및, 감지 회로는 그렇게 감지된 전류차에 따라 상기 제 1 및 제 2 노드들의 전압들을 설정하며, 상기 제 1 및 제 2 노드들의 전압들을 레일-레일 전압들로 각각 증폭하는 증폭 회로를 포함한다. 이러한 구성에 의하면, 퓨즈 소자들의 저항차를 전류차로 감지함으로써, 상기 노드들 각각의 용량성 기생 로딩의 크기에 관계없이 퓨즈 소자의 프로그램 유무를 정확하게 감지할 수 있다.
Abstract:
PURPOSE: A reference voltage generating circuit is provided to improve the credibility of a semiconductor memory device by generating a reference voltage which is independent of the increase of power voltage and increases depending on the temperature rise. CONSTITUTION: A bias current generating unit(20) is connected between a power source voltage and a ground voltage and generates a bias current that is increased according to the rising of temperature. A current generating unit is connected between a reference voltage generating terminal and the ground voltage and generates a reference voltage which is independent of the increase of power source voltage and increases depending on the temperature rise. The bias current generating unit(20) includes a starting circuit for generating a starting voltage and a bias current generating circuit for generating the bias current in response to the starting voltage.
Abstract:
PURPOSE: A high-speed input buffer circuit is provided to satisfy a low-voltage interface and a low-voltage transistor-transistor logic interface at the same time. CONSTITUTION: A high-speed input buffer circuit comprises a differential amplifier(41) which supplies an internal self bias signal to an internal node(O1) and an output signal to an output node(O2) on the basis of a voltage difference between a reference voltage(VREF) and an input signal(IN). In order to maintain a voltage level of the self bias signal from the internal node(O1), a current adjusting circuit(43) supplies current to the differential amplifier and sinks current from the amplifier, in response to the self bias signal. A swing amplitude controller(45) prevents a swing amplitude of the output signal from the differential amplifier from being increased excessively in response to an inverted version of an output signal of the output node(O2).
Abstract:
A reference voltage generating circuit of the present invention includes a start-up circuit connected between a power supply voltage and a ground voltage for generating a start-up voltage, a bias current generating circuit connected between the power supply voltage and the ground voltage for generating a bias current in response to the start-up voltage, the bias current increasing in response to an increase in temperature, a current generator connected between the power supply voltage and a reference voltage generating terminal for generating a mirrored current of the bias current, and a load connected between the reference voltage generating terminal and the ground voltage for generating a reference voltage that increases in response to any increase in temperature regardless of variations in the level of the power supply voltage. Accordingly, the level of reference voltage generated increases in response to increases in temperature regardless of variations in the level of the power supply voltage.