公开(公告)号：KR1020140067437A

公开(公告)日：2014-06-05

申请号：KR1020120134684

申请日：2012-11-26

Applicant: 삼성전자주식회사

Inventor： 류형선 ,  김장환 ,  용형중 ,  윤지녕 ,  이대희 ,  이성관 ,  장연봉 ,  정신기

IPC: G01R31/3183

CPC classification number: G01R31/2889

Abstract: According to the embodiment of the present invention, a test system includes: a test device configured to transmit an input signal and a control signal to at least one complementary metal-oxide semiconductor (CMOS) image sensor via a probe card, and an interface board configured to map the probe card and the test device, wherein the interface board includes an output receiver configured to receive an image signal from the CMOS image sensor and to transform the image signal into an image data.

Abstract translation: 根据本发明的实施例，一种测试系统包括：被配置为经由探针卡向至少一个互补金属氧化物半导体（CMOS）图像传感器传输输入信号和控制信号的测试装置，以及接口板 被配置为映射所述探针卡和所述测试装置，其中所述接口板包括被配置为从所述CMOS图像传感器接收图像信号并将所述图像信号变换为图像数据的输出接收器。