公开(公告)号：KR1020140009641A

公开(公告)日：2014-01-23

申请号：KR1020120075891

申请日：2012-07-12

Applicant: 서울대학교산학협력단

Inventor： 김명수 ,  배용진 ,  박경만 ,  안성희

IPC: G01N27/62

CPC classification number: H01J49/0468 ,  H01J49/164

Abstract: The present invention relates to a method of measuring a mass spectrum of ions produced at a specific temperature. More specifically, the present invention relates to a method of measuring a mass spectrum of ions produced at a specific temperature, which is characterized in including a step of selecting spectra in which the decomposition pattern of a reagent ion, a matrix ion, or a third material ion is the same among multiple mass spectra obtained from ions formed by applying energy to a sample in which the matrix and the reagent are mixed, or a sample in which the matrix and the reagent, and the third material are mixed.

Abstract translation: 本发明涉及测量在特定温度下产生的离子质谱的方法。 更具体地说，本发明涉及一种测定在特定温度下产生的离子的质谱的方法，其特征在于包括选择其中试剂离子，基质离子或第三个离子的分解模式的光谱的步骤 从通过向混合有基质和试剂的样品施加能量而形成的离子或将基质和试剂与第三种材料混合的样品获得的多个质谱中的材料离子相同。