公开(公告)号：KR101395695B1

公开(公告)日：2014-05-16

申请号：KR1020120147419

申请日：2012-12-17

Applicant: 세종대학교산학협력단

Inventor： 이재홍 ,  안남식 ,  윤광섭 ,  김영빈

IPC: G01B21/32

Abstract: A system for measuring the behavior of a structure according to the present invention comprises a displacement extracting part extracting the angular displacements and the vertical length displacements of the structure based on the sensing values of multiple sensors arranged at constant positions on the structure; a storing part storing data for the extracted angular displacements and length displacements; and a displacement calculating part calculating horizontal displacements based on the angular displacements, and calculating the entire displacement of the structure by accumulating the horizontal displacements and the length displacements separately.

Abstract translation: 根据本发明的用于测量结构的行为的系统包括基于布置在结构上的恒定位置处的多个传感器的感测值来提取结构的角位移和垂直长度位移的位移提取部分; 存储部分，用于存储提取的角位移和长度位移的数据; 以及位移计算部分，基于角位移来计算水平位移，并且通过分别累积水平位移和长度位移来计算结构的整体位移。