公开(公告)号：KR1020040094583A

公开(公告)日：2004-11-10

申请号：KR1020030028463

申请日：2003-05-03

Applicant: 송석호

Inventor： 안형주 ,  송석호

IPC: G01J3/28

CPC classification number: G01J3/433 ,  G01J2003/4332 ,  G01N21/59

Abstract: PURPOSE: An analyzer for analyzing a spectrum transmitting through an anisotropic dielectric thin film is provided to allow incident light to be easily incident into the anisotropic dielectric thin film by removing lateral portions of the anisotropic dielectric thin film surrounded by a holder. CONSTITUTION: An analyzer for analyzing a spectrum transmitting through an anisotropic dielectric thin film includes two rotation stages(4,5) for freely rotating the anisotropic dielectric thin film in theta and phi-directions. Two connection rods(3) are fixedly inserted into the rotation stage(4) and a sample holder(2) for fixing the anisotropic dielectric thin film is connected to the connection rods(3) in order to freely rotate the anisotropic dielectric thin film fixed to the sample holder(2). The rotation stage(4) is longitudinally installed on the rotation stage(5).

Abstract translation: 目的：提供一种用于分析通过各向异性介电薄膜传输的光谱的分析器，通过去除由保持器包围的各向异性介电薄膜的横向部分，允许入射光容易地入射到各向异性介电薄膜中。 构成：用于分析通过各向异性介电薄膜传输的光谱的分析仪包括用于以θ和phi方向自由旋转各向异性介电薄膜的两个旋转级（4,5）。 两个连接杆（3）固定地插入到旋转台（4）中，用于固定各向异性介电薄膜的样品架（2）连接到连接杆（3）上，以便使各向异性介电薄膜固定 到样品架（2）。 旋转台（4）纵向安装在旋转台（5）上。