公开(公告)号：KR1020080065784A

公开(公告)日：2008-07-15

申请号：KR1020070002867

申请日：2007-01-10

Applicant: 조선대학교산학협력단

Inventor： 김경석 ,  장호섭 ,  정성욱 ,  정현철 ,  강명구 ,  곽재호

IPC: G01B11/24 ,  G01B9/02 ,  G01B11/25

Abstract: A quantitative measurement method of out-of-plane deformation using shearography is provided to enhance industrial application of the shearography by quantitatively measuring the out-of-plane deformation generated at an article. A quantitative measurement method of out-of-plane deformation using shearography includes the steps of: obtaining an image before deformation of an article by the shearography; obtaining an image after the deformation of the article by the shearography; and measuring the out-of-deformation by numerically integrating with parallel translation values of the images before/after the deformation after subtracting the images before/after the deformation. ESPI(Electronic Speckle Pattern Interferometry) is stably applied in a non-destructive measurement method by using the shearography.

Abstract translation: 提供使用剪切法的平面外变形的定量测量方法，以通过定量测量在物品处产生的平面外变形来增强剪切力的工业应用。 使用剪切法的平面外变形的定量测量方法包括以下步骤：通过剪切获得制品变形前的图像; 通过剪切获得物品变形后的图像; 并且通过在变形之前/之后减去图像之前/之后的图像的平行平移值通过数值积分来测量失真变形。 通过使用剪切方法，以非破坏性测量方法稳定地应用ESPI（电子斑点图案干涉测量）。