자성 입자가 탐침 끝에 도입된 MFM용 캔틸레버 및 그 제조 방법
    1.
    发明公开
    자성 입자가 탐침 끝에 도입된 MFM용 캔틸레버 및 그 제조 방법 有权
    具有尖端磁性颗粒的磁力显微镜和其制造方法

    公开(公告)号:KR1020130060027A

    公开(公告)日:2013-06-07

    申请号:KR1020110126305

    申请日:2011-11-29

    CPC classification number: G01Q70/14 G01Q60/08 G01Q70/18 G01R1/06727

    Abstract: PURPOSE: A cantilever for MFM(Magnetic Force Microscopy) and a manufacturing method thereof are provided to offer resolution entered into one or more magnetic force elements. CONSTITUTION: A cantilever(1) for MFM includes a body(5), and a probe(10) formed at the end of the body. The probe includes a magnetic force element combined with the Dendron with a bonding agent and with a surface based on the Dendron.

    Abstract translation: 目的:提供用于MFM(磁力显微镜)的悬臂及其制造方法,以提供进入一个或多个磁力元件的分辨率。 构成:用于MFM的悬臂(1)包括主体(5)和形成在身体末端的探针(10)。 探头包括与Dendron与粘合剂组合的磁力元件,并具有基于Dendron的表面。

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