公开(公告)号：KR100121300B1

公开(公告)日：1997-11-19

申请号：KR1019940016996

申请日：1994-07-14

Applicant: 한국과학기술연구원

Inventor： 김문상 ,  김승우 ,  최이배 ,  박현구

IPC: G01B11/24

Abstract: A method for automatically measuring three dimensional image using a multiple slit light is disclosed. The multiple slit light is made by projecting a light beam to a lattice formed by a number of straight lines. The multiple slit light is irradiated to a measuring object. And then, the contour of the light formed at the measuring object is captured. Finally, the captured contour is processed by an image algorithm to calculate three dimensional image.

Abstract translation: 公开了一种使用多重狭缝光自动测量三维图像的方法。 多个狭缝光通过将光束投射到由多条直线形成的格子而制成。 多个狭缝光被照射到测量对象。 然后，捕获在测量对象处形成的光的轮廓。 最后，通过图像算法处理捕获的轮廓，计算三维图像。

公开(公告)号：KR1019960005067A

公开(公告)日：1996-02-23

申请号：KR1019940016996

申请日：1994-07-14

Applicant: 한국과학기술연구원

Inventor： 김문상 ,  김승우 ,  최이배 ,  박현구

IPC: G01B11/24