-
公开(公告)号：NO20074246L
公开(公告)日：2007-10-22
申请号：NO20074246
申请日：2007-08-20
Applicant: ABB RESEARCH LTD
Inventor： NIAYESH KAVEH , BERTH MATTHIAS , DAHLQUIST ANDREAS , HEITZ CHRISTOPH , TIBERG MARTIN
IPC: G01R27/28
Abstract: A method and device for determining the linear response of an electrical multi-port component (1) has an "estimation procedure" in which an estimated admittance matrix is determined by applying voltages to the ports of the component and measuring the response of the component. The estimation procedure can e.g. consist of a conventional measurement of the admittance matrix. The method further has a "measurement procedure" in which several voltage patterns are applied to the port. The voltage patterns correspond to the eigenvectors of the estimated admittance matrix. For each applied voltage pattern, the response of the component is measured. This allows to measure the linear response of the component accurately even if the eigenvalues of the admittance matrix differ by several orders of magnitude.
-
公开(公告)号：NO20074246A
公开(公告)日：2007-10-22
申请号：NO20074246
申请日：2007-08-20
Applicant: ABB RESEARCH LTD
Inventor： NIAYESH KAVEH , BERTH MATTHIAS , DAHLQUIST ANDREAS , HEITZ CHRISTOPH , TIBERG MARTIN
IPC: G01R27/28
CPC classification number: G01R27/28
-
公开(公告)号：DE10135348A1
公开(公告)日：2003-01-30
申请号：DE10135348
申请日：2001-07-20
Applicant: ABB RESEARCH LTD
Inventor： BERTH MATTHIAS , KESER HELMUT
IPC: H01L23/538 , H01L23/14 , H01L25/07
Abstract: The semiconductor modules etc. are provided with at least one structure (8), consisting of electrically conductive layers (84,85), separated by dielectric (83) and forming at least one capacity .At least one conductive layer is formed by conductive tracks (840,840',840'',850,850'), separated by dielectric. Partial capacities are formed by the conductive layers and conductive tracks. Preferably. the structure is formed in the edge regions of the semiconductor modules, etc. Independent claims are included for semiconductor module and its use.
-
Patent Agency Ranking4.发明专利
公开(公告)号：ES2638765T3
公开(公告)日：2017-10-24
申请号：ES05405031
申请日：2005-01-21
Applicant: ABB RESEARCH LTD
Inventor： NIAYESH KAVEH , BERTH MATTHIAS , DAHLQUIST ANDREAS , TIBERG MARTIN , HEITZ CHRISTOPH
IPC: G01R27/28
Abstract: Procedimiento para caracterizar las propiedades lineales de un componente eléctrico (1) que tiene n > 1 puertos (p1, ..., pn), incluyendo dicho procedimiento un procedimiento de estimación que comprende la etapa de determinar una matriz de admitancia estimada Y' de dicho componente (1) aplicando tensiones (u1, ..., un) a dichos puertos (p1, ..., pn) y medir una respuesta de dicho componente eléctrico (1), estando caracterizado, además, dicho procedimiento por un procedimiento de medición que comprende la etapa de aplicar varios patrones de tensión uk a los puertos (p1, ..., pn) de dicho componente eléctrico (1), correspondiendo cada patrón de tensión uk a un vector propio calculado vk de dicha matriz de admitancia estimada Y', y determinar, en el procedimiento de medición para cada patrón de tensión aplicada uk, una respuesta de dicho componente eléctrico (1).
-
公开(公告)号：BRPI0606482A2
公开(公告)日：2009-06-30
申请号：BRPI0606482
申请日：2006-01-17
Applicant: ABB RESEARCH LTD
Inventor： NIAYESH KAVEH , BERTH MATTHIAS , DAHLQUIST ANDREAS , HEITZ CHRISTOPH , TIBERG MARTIN
IPC: G01R27/28
Abstract: A method and device for determining the linear response of an electrical multi-port component (1) has an "estimation procedure" in which an estimated admittance matrix is determined by applying voltages to the ports of the component and measuring the response of the component. The estimation procedure can e.g. consist of a conventional measurement of the admittance matrix. The method further has a "measurement procedure" in which several voltage patterns are applied to the port. The voltage patterns correspond to the eigenvectors of the estimated admittance matrix. For each applied voltage pattern, the response of the component is measured. This allows to measure the linear response of the component accurately even if the eigenvalues of the admittance matrix differ by several orders of magnitude.
-
公开(公告)号：CA2601321A1
公开(公告)日：2006-07-27
申请号：CA2601321
申请日：2006-01-17
Applicant: ABB RESEARCH LTD
Inventor： DAHLQUIST ANDREAS , TIBERG MARTIN , NIAYESH KAVEH , BERTH MATTHIAS , HEITZ CHRISTOPH
IPC: G01R27/28
Abstract: A method and device for determining the linear response of an electrical multi-port component (1) has an "estimation procedure" in which an estimated admittance matrix is determined by applying voltages to the ports of the component and measuring the response of the component. The estimation procedure can e.g. consist of a conventional measurement of the admittance matrix. The method further has a "measurement procedure" in which several voltage patterns are applied to the port. The voltage patterns correspond to the eigenvectors of the estimated admittance matrix. For each applied voltage pattern, the response of the component is measured. This allows to measure the linear response of the component accurately even if the eigenvalues of the admittance matrix differ by several orders of magnitude.
-
公开(公告)号：DE19952886A1
公开(公告)日：2001-05-10
申请号：DE19952886
申请日：1999-11-03
Applicant: ABB RESEARCH LTD
Inventor： BERTH MATTHIAS
Abstract: The current regulator has at least 2 current regulator units (20), each provided with a local earth (12), with each of the local earths coupled via an earthing impedance (XG), e.g. an earthing inductance, to a common line earth (3), which is separate from the installation earth (1) and connected to the latter via a central installation earthing point (2).
-
公开(公告)号：CA2601321C
公开(公告)日：2015-03-03
申请号：CA2601321
申请日：2006-01-17
Applicant: ABB RESEARCH LTD
Inventor： NIAYESH KAVEH , BERTH MATTHIAS , DAHLQUIST ANDREAS , HEITZ CHRISTOPH , TIBERG MARTIN
IPC: G01R27/28
Abstract: A method and device for determining the linear response of an electrical multi-port component (1) has an "estimation procedure" in which an estimated admittance matrix is determined by applying voltages to the ports of the component and measuring the response of the component. The estimation procedure can e.g. consist of a conventional measurement of the admittance matrix. The method further has a "measurement procedure" in which several voltage patterns are applied to the port. The voltage patterns correspond to the eigenvectors of the estimated admittance matrix. For each applied voltage pattern, the response of the component is measured. This allows to measure the linear response of the component accurately even if the eigenvalues of the admittance matrix differ by several orders of magnitude.
-
-
-
-
-
-
-
Search Results
8
records
(took 0.021 seconds)
