公开(公告)号：US11290026B2

公开(公告)日：2022-03-29

申请号：US16658911

申请日：2019-10-21

Applicant: ABB Schweiz AG

Inventor： Sandeep Bala ,  Arun Kumar Kadavelugu

IPC: H02M7/219 ,  H02M1/088

Abstract: A converter system includes a DC bus for each phase of an input AC power signal; a first switching cell for each phase, including first two active switches coupled in series across the DC bus and forming a first switching cell AC pole therebetween, the first switching cell AC pole being coupled to a respective phase; and a second switching cell for each phase, including second two active switches coupled in series across the DC bus and forming a second switching cell AC pole therebetween. The second switching cell AC poles are coupled to each other to form a flying neutral. One of the first switching cell and the second switching cell switches at a frequency at least an order of magnitude greater than the line frequency. The other of the first switching cell and the second switching cell switches at a frequency approximately equal to the line frequency.

公开(公告)号：US20200052608A1

公开(公告)日：2020-02-13

申请号：US16658911

申请日：2019-10-21

Applicant: ABB Schweiz AG

Inventor： Sandeep Bala ,  Arun Kumar Kadavelugu

IPC: H02M7/219 ,  H02M1/088

Abstract: A converter system includes a DC bus for each phase of an input AC power signal; a first switching cell for each phase, including first two active switches coupled in series across the DC bus and forming a first switching cell AC pole therebetween, the first switching cell AC pole being coupled to a respective phase; and a second switching cell for each phase, including second two active switches coupled in series across the DC bus and forming a second switching cell AC pole therebetween. The second switching cell AC poles are coupled to each other to form a flying neutral. One of the first switching cell and the second switching cell switches at a frequency at least an order of magnitude greater than the line frequency. The other of the first switching cell and the second switching cell switches at a frequency approximately equal to the line frequency.

公开(公告)号：US11128290B2

公开(公告)日：2021-09-21

申请号：US16520532

申请日：2019-07-24

Applicant: ABB Schweiz AG

Inventor： Eddy Aeloiza ,  Arun Kumar Kadavelugu

IPC: H02H5/00 ,  H03K17/082 ,  G01R19/165 ,  G01R31/26 ,  H02H1/00 ,  H03K5/24

Abstract: Systems, methods, techniques and apparatuses of short circuit protection are disclosed. One exemplary embodiment is a method for protecting a semiconductor switch comprising receiving a measurement corresponding to an electrical characteristic of the semiconductor switch; determining a semiconductor switch resistance value using the received measurement; estimating a junction temperature of the semiconductor switch using the semiconductor switch resistance value; determining a short circuit voltage threshold using the estimated junction temperature; comparing the short circuit voltage threshold to a test voltage corresponding to a drain-source voltage of the semiconductor switch; determining a short circuit condition is occurring in response to comparing the short circuit voltage threshold and the test voltage; and opening the semiconductor switch in response to determining the short circuit condition is occurring.

公开(公告)号：US20210028778A1

公开(公告)日：2021-01-28

申请号：US16520532

申请日：2019-07-24

Applicant: ABB Schweiz AG

Inventor： Eddy Aeloiza ,  Arun Kumar Kadavelugu

IPC: H03K17/082 ,  H02H1/00 ,  H03K5/24 ,  G01R19/165 ,  G01R31/26

Abstract: Systems, methods, techniques and apparatuses of short circuit protection are disclosed. One exemplary embodiment is a method for protecting a semiconductor switch comprising receiving a measurement corresponding to an electrical characteristic of the semiconductor switch; determining a semiconductor switch resistance value using the received measurement; estimating a junction temperature of the semiconductor switch using the semiconductor switch resistance value; determining a short circuit voltage threshold using the estimated junction temperature; comparing the short circuit voltage threshold to a test voltage corresponding to a drain-source voltage of the semiconductor switch; determining a short circuit condition is occurring in response to comparing the short circuit voltage threshold and the test voltage; and opening the semiconductor switch in response to determining the short circuit condition is occurring.