A SEMICONDUCTOR DEVICE AND METHOD OF MEASUREMENT OF PHYSICAL PARAMETERS OF A SEMICONDUCTOR DEVICE

    公开(公告)号:EP3435543A1

    公开(公告)日:2019-01-30

    申请号:EP17460046.0

    申请日:2017-07-27

    Applicant: ABB Schweiz AG

    Abstract: A semiconductor device (1) including a power switch packaging (3) and a gate control unit (2) connected together. The power switch packaging (3) includes semiconductor power switch (4) equipped with current terminals (C, E) and a switch control terminal (G). The power switch packaging (3) includes an auxiliary circuit (5) that is equipped with a sensor (6). The sensor (6) is adapted for measuring physical parameters of the semiconductor power switch (4) and for transforming the physical parameters into electrical signal S. The sensor (6) is connected in series with a transmitter circuit (7) for transmitting electrical signal S to the gate control unit (2). The transmitter circuit (7) is connected in series with a power supply circuit (8) adapted for harvesting electrical energy for supplying the auxiliary circuit (5).

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