System for Monitoring a Device
    1.
    发明申请

    公开(公告)号:US20230026139A1

    公开(公告)日:2023-01-26

    申请号:US17868975

    申请日:2022-07-20

    Applicant: ABB Schweiz AG

    Abstract: A system and method includes at least one temperature sensor, a processing unit, and an output unit. The temperature sensor acquires a temperature measurement at a first location of an operational device, which first location is in thermal contact with a second location of the operational device. The processing unit selects a simulated temperature distribution of the first location of a simulated device from a plurality of simulated temperature distributions of the first location and compares the temperature measurement with simulated temperature distributions of the first location, and determines whether a hot spot exists or is developing at the second location. The determination comprises utilization of a correlation between the simulated temperature distribution of the first location and the second location for the selected simulated temperature distribution of the first location of the simulated device.

    APPARATUS FOR HOT SPOT SENSING
    2.
    发明申请

    公开(公告)号:US20220011164A1

    公开(公告)日:2022-01-13

    申请号:US17483834

    申请日:2021-09-24

    Applicant: ABB Schweiz AG

    Abstract: An apparatus for hot spot sensing where the apparatus includes an input unit, a processing unit,and an output unit. The input unit is configured to provide the processing unit with an image of an object that includes a hot spot. The image data of the image includes image data of the hot spot where the image was acquired by a camera. The processing unit is configured to determine a number of pixels in the image corresponding to a size of the hot spot, an average temperature for the hot spot, the determination comprising utilization of pixel values of the pixels in the image corresponding to the size of the hot spot and the number of pixels in the image corresponding to the size of the hot spot, a surrounding temperature in the image, and a corrected temperature for the hot spot.

    Apparatus for prediction of the residual lifetime of an electrical system

    公开(公告)号:US11520324B2

    公开(公告)日:2022-12-06

    申请号:US16511018

    申请日:2019-07-15

    Applicant: ABB Schweiz AG

    Abstract: An apparatus for prediction of the residual lifetime of an electrical system includes: an input unit; a processing unit; and an output unit. The input unit provides at least one sensor data from at least one sensor to the processing unit, the at least one sensor data including a measurement of at least one physical parameter of at least one component of an electrical system. Each sensor data is associated with a corresponding sensor and relates to a measurement of one physical parameter of a corresponding component of the electrical system. Each sensor data extends over a plurality of time windows and is assigned to a certain data class, such that sensor data at a particular time window has a value that falls into one of the data classes. For each sensor data the processing unit assigns the sensor data at each time window into a corresponding measurement window.

    SURFACE TEMPERATURE PROBE
    4.
    发明申请
    SURFACE TEMPERATURE PROBE 审中-公开
    表面温度探头

    公开(公告)号:US20170023415A1

    公开(公告)日:2017-01-26

    申请号:US15216722

    申请日:2016-07-22

    Applicant: ABB Schweiz AG

    CPC classification number: G01K1/14 G01K1/08 G01K1/143 G01K1/16

    Abstract: A surface temperature sensor has a first geometric contact surface for determining the temperature in a vessel and a second geometric contact surface, wherein the first geometric contact surface and the second geometric contact surface are in point and/or linear contact and at least partially spaced variably from this. For improvement of thermal contact an adapter between the first geometric contact surface and the second geometric contact surface may be made of metal, whereby the process vessel facing side has a polygonal surface structure and the temperature sensor facing side of a sack-shaped recess.

    Abstract translation: 表面温度传感器具有用于确定容器和第二几何接触表面中的温度的第一几何接触表面,其中第一几何接触表面和第二几何接触表面是点和/或线性接触并且可变地至少部分间隔 由此。 为了改善热接触,第一几何接触表面和第二几何接触表面之间的适配器可以由金属制成,由此处理容器面对侧具有多边形表面结构,并且温度传感器面向袋状凹部的侧面。

    SURFACE TEMPERATURE PROBE
    5.
    发明申请
    SURFACE TEMPERATURE PROBE 审中-公开
    表面温度探头

    公开(公告)号:US20170016775A1

    公开(公告)日:2017-01-19

    申请号:US15210922

    申请日:2016-07-15

    Applicant: ABB Schweiz AG

    CPC classification number: G01K1/08 G01K1/143 G01K1/16

    Abstract: A surface temperature sensor has a first geometric contact surface for determining the temperature in a vessel and a second geometric contact surface, wherein the first geometric contact surface and the second geometric contact surface are in point—and/or linear contact and at least partially spaced variably from this. For a long-term stability, low heat transfer resistance a metal foam is provided between the first geometric contact surface and the second geometric contact surface.

    Abstract translation: 表面温度传感器具有用于确定容器和第二几何接触表面中的温度的第一几何接触表面,其中所述第一几何接触表面和所述第二几何接触表面是点和/或线性接触并且至少部分间隔开 从这可变。 为了长期稳定性,传热阻力低,在第一几何接触表面和第二几何接触表面之间提供金属泡沫。

    Apparatus for hot spot sensing
    6.
    发明授权

    公开(公告)号:US12104960B2

    公开(公告)日:2024-10-01

    申请号:US17483834

    申请日:2021-09-24

    Applicant: ABB Schweiz AG

    Abstract: An apparatus for hot spot sensing where the apparatus includes an input unit, a processing unit, and an output unit. The input unit is configured to provide the processing unit with an image of an object that includes a hot spot. The image data of the image includes image data of the hot spot where the image was acquired by a camera. The processing unit is configured to determine a number of pixels in the image corresponding to a size of the hot spot, an average temperature for the hot spot, the determination comprising utilization of pixel values of the pixels in the image corresponding to the size of the hot spot and the number of pixels in the image corresponding to the size of the hot spot, a surrounding temperature in the image, and a corrected temperature for the hot spot.

    SYSTEM FOR MONITORING A SWITCHGEAR

    公开(公告)号:US20210065357A1

    公开(公告)日:2021-03-04

    申请号:US17005326

    申请日:2020-08-28

    Applicant: ABB Schweiz AG

    Abstract: A system for monitoring a switchgear includes: an infrared camera for acquiring at least one infrared image of the switchgear; a processing unit for determining a pixel in the at least one infrared image associated with a hottest temperature, determining e pixels in the at least one infrared image associated with a temperature that is within a threshold temperature of the hottest temperature, and determining that a hot spot exists in the switchgear as a determination, the determination being a utilization of the determined pixels in the at least one infrared image; and an output unit for outputting an indication of a fault in the switchgear based on the determined hot spot.

    APPARATUS FOR PREDICTION OF THE RESIDUAL LIFETIME OF AN ELECTRICAL SYSTEM

    公开(公告)号:US20200019152A1

    公开(公告)日:2020-01-16

    申请号:US16511018

    申请日:2019-07-15

    Applicant: ABB Schweiz AG

    Abstract: An apparatus for prediction of the residual lifetime of an electrical system includes: an input unit; a processing unit; and an output unit. The input unit provides at least one sensor data from at least one sensor to the processing unit, the at least one the sensor data including a measurement of at least one physical parameter of at least one component of an electrical system. Each sensor data is associated with a corresponding sensor and relates to a measurement of one physical parameter of a corresponding component of the electrical system. Each sensor data extends over a plurality of time windows and is assigned to a certain data class, such that sensor data at a particular time window has a value that falls into one of the data classes. For each sensor data the processing unit assigns the sensor data at each time window into a corresponding measurement window.

    Nonintrusive temperature measuring apparatus

    公开(公告)号:US10386246B2

    公开(公告)日:2019-08-20

    申请号:US15473683

    申请日:2017-03-30

    Applicant: ABB Schweiz AG

    Abstract: A nonintrusive temperature measuring apparatus for measuring the fluid temperature in at least partially thermally insulated tubes of installations in the processing industry, has the tube is completely sheathed by a thermal insulation layer at least at the measurement point, wherein a sensor electronics system with a temperature sensor is mounted onto the tube within the thermal insulation layer, a connecting electronics system is arranged outside the thermal insulation layer, and wherein the sensor electronics system and the connecting electronics system have one or more energy transmitters for wireless energy transmission for supplying the sensor electronics system and one or more temperature transmitters for wireless communication for transmitting the temperature measurement values from the sensor electronics system to the connecting electronics system.

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