公开(公告)号：WO0111345A3

公开(公告)日：2002-03-28

申请号：PCT/US0021758

申请日：2000-08-09

Applicant: ABBOTT LAB

Inventor： OLSON JEFFREY A ,  JONES RONALD B ,  NIENABER VICKI L ,  MUCHMORE STEVEN W ,  PAN JEFFREY Y ,  GREER JONATHAN

IPC: G01N23/207 ,  G01N23/20 ,  G01N35/00

CPC classification number: G01N23/20 ,  Y10T436/25

Abstract: Method and apparatus for mounting a sample comprising a crystal for X-ray crystallographic analysis, a method for aligning a sample comprising a crystal for X-ray crystallographic analysis, which sample is mounted on a positioning device, and a method for determining the structure of a sample containing a crystal by means of X-ray crystallography.

Abstract translation: 用于安装包括用于X射线晶体学分析的晶体的样品的方法和装置，用于将包含用于X射线晶体学分析的晶体的样品对准的方法，该样品安装在定位装置上，以及用于确定 通过X射线晶体学包含晶体的样品。

公开(公告)号：CA2376073C

公开(公告)日：2014-10-21

申请号：CA2376073

申请日：2000-08-09

Applicant: ABBOTT LAB

Inventor： OLSON JEFFREY A ,  JONES RONALD B ,  NIENABER VICKI L ,  MUCHMORE STEVEN W ,  PAN JEFFREY Y ,  GREER JONATHAN

IPC: G01N23/20 ,  G01N23/207 ,  G01N35/00

Abstract: Method and apparatus for mounting a sample comprising a crystal for X-ray crystallographic analysis, a method for aligning a sample comprising a crystal for X-ray crystallographic analysis, which sample is mounted on a positioning device, and a method for determining the structure of a sample containing a crystal by means of X-ray crystallography.

公开(公告)号：CA2376073A1

公开(公告)日：2001-02-15

申请号：CA2376073

申请日：2000-08-09

Applicant: ABBOTT LAB

Inventor： JONES RONALD B ,  MUCHMORE STEVEN W ,  NIENABER VICKI L ,  PAN JEFFREY Y ,  GREER JONATHAN ,  OLSON JEFFREY A

IPC: G01N23/207 ,  G01N23/20 ,  G01N35/00

Abstract: Method and apparatus for mounting a sample comprising a crystal for X-ray crystallographic analysis, a method for aligning a sample comprising a cryst al for X-ray crystallographic analysis, which sample is mounted on a positionin g device, and a method for determining the structure of a sample containing a crystal by means of X-ray crystallography.