公开(公告)号：DE19810551C2

公开(公告)日：2000-11-30

申请号：DE19810551

申请日：1998-03-11

Applicant: AGENCY IND SCIENCE TECHN

Inventor： KAWASHIMA HITOSHI ,  SASAKI FUMIO ,  KOBAYASHI SHUNSUKE ,  TANI TOSHIRO

IPC: G01R27/26 ,  G01J1/00 ,  G01J11/00 ,  G01N21/41 ,  G02F1/35

公开(公告)号：DE19810551A1

公开(公告)日：1998-09-24

申请号：DE19810551

申请日：1998-03-11

Applicant: AGENCY IND SCIENCE TECHN

Inventor： KAWASHIMA HITOSHI ,  SASAKI FUMIO ,  KOBAYASHI SHUNSUKE ,  TANI TOSHIRO

IPC: G01R27/26 ,  G01J1/00 ,  G01J11/00 ,  G01N21/41

Abstract: The measuring method uses two optical pulses incident on a crystal sample where they generate a transitory grating. A third visible pulse is diffracted by the grating. The diffracted light is detected function of time.A Fourier transform is applied to the signal detected. An equation that gives the variation of the dielectric coefficient function of frequency is used to calculate the refraction index

公开(公告)号：FR2760839B1

公开(公告)日：1999-09-17

申请号：FR9802763

申请日：1998-03-06

Applicant: AGENCY IND SCIENCE TECHN

Inventor： KAWASHIMA HITOSHI ,  SASAKI FUMIO ,  KOBAYASHI SHUNSUKE ,  TANI TOSHIRO

IPC: G01R27/26 ,  G01J1/00 ,  G01J11/00 ,  G01N21/41 ,  G01N21/00

公开(公告)号：FR2760839A1

公开(公告)日：1998-09-18

申请号：FR9802763

申请日：1998-03-06

Applicant: AGENCY IND SCIENCE TECHN

Inventor： KAWASHIMA HITOSHI ,  SASAKI FUMIO ,  KOBAYASHI SHUNSUKE ,  TANI TOSHIRO

IPC: G01R27/26 ,  G01J1/00 ,  G01J11/00 ,  G01N21/41 ,  G01N21/00

公开(公告)号：JPH10253446A

公开(公告)日：1998-09-25

申请号：JP5613997

申请日：1997-03-11

Applicant: AGENCY IND SCIENCE TECHN

Inventor： KAWASHIMA HITOSHI ,  SASAKI FUMIO ,  KOBAYASHI SHUNSUKE ,  TANI TOSHIAKI

IPC: G01R27/26 ,  G01J1/00 ,  G01J11/00 ,  G01N21/41

Abstract: PROBLEM TO BE SOLVED: To determine the dielectric constant in the tetrahertz area of a nonlinear optical crystal with a specific equation without using an optical system for far infrared rays by introducing the dielectric constant in the tetrahertz area from the transient response induced by pulses of ultra-short visible light. SOLUTION: The response of a sample is observed by the transient diffraction grating method. A well-known optical system used by the grating method can be used for the optical system. When two ultra-short light pulses are crossed in the sample, the sample is excited in a spatially periodic structure. When another ultra-short light pulse is fed, it is diffracted by the grating. The intensity of the diffracted light is recorded while the incidence time of this ultra-short light pulse is changed through a delay optical path, and the aging effect (responsiveness) of the grating is outputted. Such a vibration wave-form b(t) is determined that the square b(t) of its responsiveness reproduces the observed vibration component. The vibration wave-form b(t) is Fourier-transformed into b(ω). When b(ω) is substituted in the left side of the equation (1), the frequency dependency ε(ω) of the dielectric constant is obtained.