Apparatus for integrally combining laser focusing and spot imaging for maldi
    1.
    发明专利
    Apparatus for integrally combining laser focusing and spot imaging for maldi 审中-公开
    用于整体组合激光聚焦和点状成像的装置

    公开(公告)号:JP2007127653A

    公开(公告)日:2007-05-24

    申请号:JP2006300109

    申请日:2006-11-06

    CPC classification number: H01J49/164 H01J49/0004

    Abstract: PROBLEM TO BE SOLVED: To provide an apparatus and method for integrally combining laser focusing and spot imaging for MALDI.
    SOLUTION: A MALDI ion source 10 includes a sample plate 15, a laser 30, a first optical element 32 arranged so as to direct the laser radiation along a first optical path toward the target area, and a second optical element 38 arranged along the first optical path to focus the laser radiation onto the target area. The first and second optical elements 32 and 38 are arranged so that light that is reflected from the target area travels along the first optical path through the first and second optical elements 32 and 38. The first optical element 32 reflects the laser radiation along a first direction and transmits the light reflected from the target area that has traversed the first optical path in a second direction. An imaging device 40 for viewing the plate surface may be arranged to receive the light that has been reflected from the target area and has traversed the first optical path through the first and second optical elements 32 and 38.
    COPYRIGHT: (C)2007,JPO&INPIT

    Abstract translation: 要解决的问题:提供用于将MALDI的激光聚焦和点成像整体组合的装置和方法。 解决方案:MALDI离子源10包括样品板15,激光器30,被布置成沿着第一光路朝向目标区域引导激光辐射的第一光学元件32和布置成 沿着第一光路将激光辐射聚焦到目标区域上。 第一和第二光学元件32和38被布置成使得从目标区域反射的光通过第一和第二光学元件32和38沿着第一光学路径行进。第一光学元件32沿着第一和第二光学元件32反射激光辐射 并且沿着第二方向透射从已经穿过第一光路的目标区域反射的光。 用于观察板表面的成像装置40可以布置成接收已经从目标区域反射并且穿过第一和第二光学元件32和38的第一光路的光。(C) 2007年,日本特许厅和INPIT

    Mehrkanalschnellabtastung von chromatographischen Spitzen durch ein Tandem-Massenspektrometer

    公开(公告)号:DE102007039970B4

    公开(公告)日:2014-02-27

    申请号:DE102007039970

    申请日:2007-08-23

    Abstract: Verfahren zum Analysieren von zwei oder mehr Verbindungsionen (105; A, B, C), die sich aus koeluierenden Vorläuferverbindungen ergeben, während eines Analysezyklus eines Tandem-Massenspektrometer-Systems (100), wobei das Verfahren folgende Schritte aufweist: Analysieren der Verbindungsionen (105; A, B, C) während einer Mehrzahl von Sätzen von Teilzyklen, wobei jedes Verbindungsion (105; A, B, C) während jedem der Sätze von Teilzyklen analysiert wird, wobei die Teilzyklen eines Satzes zeitlich aufeinanderfolgend stattfinden und wobei jeder Teilzyklus eine feste Stoßzellenenergie (CE1(A), CE1(B), CE1(C)) verwendet, wobei mehrere Verbindungsionen in den Teilzyklen eines Satzes nacheinander und separat voneinander analysiert werden, und wobei: ein erstes Verbindungsion (105; A, B, C) während eines Teilzyklus eines ersten Satzes von Teilzyklen unter Verwendung einer ersten Stoßzellenenergie (CE1(A), CE1(B), CE1(C)) analysiert wird; und das erste Verbindungsion (105; A, B, C) während eines Teilzyklus eines zweiten Satzes von Teilzyklen unter Verwendung einer zweiten Stoßzellenenergie (CE1(A), CE1(B) , CE1(C)), die sich von der ersten Stoßzellenenergie (CE1(A), CE1(B), CE1(C)) unterscheidet, analysiert wird.

    4.
    发明专利
    未知

    公开(公告)号:DE102007015542A1

    公开(公告)日:2007-10-11

    申请号:DE102007015542

    申请日:2007-03-30

    Abstract: An apparatus and method for generating analyte ions from a sample. An ion generating device is provided having a chamber with an outlet and a surface having a material and means for applying a high velocity gas flow through the chamber toward the outlet such that charged particles are produced by physical interaction between the high velocity gas and the material. The charged particles then induce the generation of primary ions by interaction with molecules of the high velocity gas. The primary ions are emitted from the outlet of the ion generating device toward a sample-bearing surface and analyte ions are generated by impact of the primary ions on the analyte sample on the surface.

    Mass spectrometry
    5.
    发明专利

    公开(公告)号:GB2446237B

    公开(公告)日:2011-04-06

    申请号:GB0716171

    申请日:2007-08-17

    Abstract: Systems and methods for optimizing the analysis of co-eluting compounds during a cycle of a tandem mass spectrometer system are provided. The tandem mass spectrometer system switches fast from analyzing one compound ion to analyzing another compound ion and from one collision cell energy to another. The fast switching allows complex sampling patterns that improve coverage of the ionic signal of the co-eluting compounds while allowing different collision cell energies to be analyzed.

    6.
    发明专利
    未知

    公开(公告)号:DE102007039970A1

    公开(公告)日:2008-03-13

    申请号:DE102007039970

    申请日:2007-08-23

    Abstract: Systems and methods for optimizing the analysis of co-eluting compounds during a cycle of a tandem mass spectrometer system are provided. The tandem mass spectrometer system switches fast from analyzing one compound ion to analyzing another compound ion and from one collision cell energy to another. The fast switching allows complex sampling patterns that improve coverage of the ionic signal of the co-eluting compounds while allowing different collision cell energies to be analyzed.

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