Abstract:
A high-speed differential comparator circuit is provided with an accurately adjustable threshold voltage. Differential reference voltage signals are provided to control the threshold voltage of the comparator. The common mode voltage of the reference signals preferably tracks the common mode voltage of the differential high-speed serial data signal being processed by the comparator circuit.
Abstract:
A transmitter circuit is operable to provide an output signal in response to a first periodic signal. A multiplexer circuit is operable to provide a second periodic signal as a selected signal during a first phase of operation. The multiplexer circuit is operable to provide the output signal of the transmitter circuit as the selected signal during a second phase of operation. A sampler circuit is operable to generate first samples of the selected signal during the first phase of operation. The sampler circuit is operable to generate second samples of the selected signal during the second phase of operation. A duty cycle control circuit is operable to adjust a duty cycle of the first periodic signal based on the first and the second samples.
Abstract:
An IC that includes an eye viewer and a BER checker coupled to the eye viewer, where the BER checker receives a serial data signal from the eye viewer, is provided. In one implementation, the BER checker receives the serial data signal from the eye viewer without the serial data signal passing through a deserializer. In one implementation, the BER checker compares the serial data signal against a reference data signal to determine the BER for the serial data signal. In one implementation, the IC includes an IC core coupled to the eye viewer and the BER checker, where the BER checker is outside the IC core. In one implementation, the BER checker is a dedicated BER checker. In one implementation, the BER checker includes an exclusive OR gate, a programmable delay circuit coupled to the exclusive OR gate, and an error counter coupled to the exclusive OR gate.
Abstract:
An integrated circuit ("IC") may include circuitry for use in testing a serial data signal. The IC may include circuitry for transmitting the serial data signal with optional jitter, optional noise, and/or controllably variable drive strength. The IC may also include circuitry for receiving the serial data signal and performing a bit error rate ("BER") analysis in such a signal. The IC may provide output signals indicative of results of its operations. The IC can operate in various modes to perform or at least emulate functions of an oscilloscope, a bit error rate tester, etc., for testing signals and circuitry with respect to jitter-tolerance, noise-tolerance, etc.
Abstract:
Integrated circuits with phase-locked loops are provided. Phase-locked loops may include an oscillator, a phase-frequency detector, a charge pump, a loop filter, a voltage-controlled oscillator, and a programmable divider. The voltage-controlled oscillator may include multiple inductors, an oscillator circuit, and a buffer circuit. A selected one of the multiple inductors may be actively coupled to the oscillator circuit. The voltage-controlled oscillators may have multiple oscillator circuits. Each oscillator circuit may be coupled to a respective inductor, may include a varactor, and may be powered by a respective voltage regulator. Each oscillator circuit may be coupled to a respective input transistor air in the buffer circuit through associated coupling capacitors. A selected one of the oscillator circuits may be turned on during normal operation by supplying a high voltage to the selected one of the oscillator circuit and by supply a ground voltage to the remaining oscillator circuits.
Abstract:
A method for improving analog circuits performance using a circuit design using forward bias and a modified mixed-signal process is presented. A circuit consisting plurality of NMOS and PMOS transistors is defined. The body terminal of the NMOS transistors are coupled to a first voltage source and the body terminal of the PMOS transistors are coupled a second voltage source. Transistors in the circuit are selectively biased by applying the first voltage source to the body terminal of each selected NMOS transistor and applying the second voltage source to the body terminal of each selected PMOS transistor. In one embodiment, the first voltage source and the second voltage source are modifiable to provide forward and reverse bias to the body terminal of the transistors.
Abstract:
An integrated circuit (e.g., a programmable integrated circuit such as a programmable microcontroller, a programmable logic device, etc.) includes programmable circuitry and 10 Gigabit Ethernet (10GbE) transceiver circuitry. The programmable circuitry and the transceiver circuitry may be configured to implement the physical (PHY) layer of the 10GbE networking specification. This integrated circuit may then be coupled to an optical transceiver module in order to transmit and receive 10GbE optical signals. The transceiver circuitry and interface circuitry that connects the transceiver circuitry with the programmable circuitry may be hard-wired or partially hard-wired.
Abstract:
PROBLEM TO BE SOLVED: To provide high-speed serial digital data signal transmitter driver circuitry. SOLUTION: The present invention relates to transmitter driver circuitry for outputting a high-speed serial data signal having a serial bit rate in the range of about 10 Gbps, including H-tree driver circuitry having only a main driver stage and a post-tap driver stage. At least one transistor forming a portion of the H-tree driver circuitry further provides electrostatic discharge protection for the circuitry. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide preferable and efficient data conversion processes between a high-speed serial data format and a parallel data format.SOLUTION: Receiver circuitry for receiving a high-speed serial data signal having a serial bit rate in the range of about 10 Gbps includes a two-stage continuous-time linear equalizer having only two stages connected in series. Each of the stages has a DC gain parameter which is variable, and a pole and/or a zero whose locations are variable in terms of the frequency. The DC gain parameter and the pole and/or zero locations of each stage are variable by programs.
Abstract:
PROBLEM TO BE SOLVED: To provide a data conversion process which can convert a serial data format to a parallel data format successfully and efficiently, and also to provide a data conversion process in the opposite direction. SOLUTION: The receiver circuitry for receiving high-speed serial data signals having serial bit rates in the range of about 10 Gbps includes a two-stage, continuous-time, linear equalizer having only two serially connected stages. Each of the stages has variable parameters of a DC gain, and a pole and/or zero whose location is variable with respect to frequency. The parameters of the DC gain at each stage and the locations of the pole and/or zero are variable by programs. COPYRIGHT: (C)2009,JPO&INPIT