Abstract:
Systeme und Verfahren zum Bestimmen von Positionen für Zweifachberührungsbedienungen, die an einem resistiven Berührungsbildschirm mit vier Drähten durchgeführt werden. Die Systeme und Verfahren können das Messen von Signalen von Elektrodenpaaren an jeder von einer ersten und zweiten resistiven Folie des resistiven Berührungsbildschirms in zwei Bedienungsphasen einschließen. Die Systeme und Verfahren können ferner das Bestimmen von Berührungsbildschirmsegmentwiderständen anhand der Signalmessungen einschließen. Die Systeme und Verfahren können anhand der Widerstände Positionen bestimmen, die den Zweifachberührungsbedienungen entsprechen. Die Systeme und Verfahren können auch anhand der Signalmessungen Positionen bestimmen.
Abstract:
Noise compensation techniques for capacitive touch screen systems. The techniques may include measurement operations that may measure coupled noise frequencies that may be induced on a capacitive touch screen. Noise measurement techniques may include driving a stimulus voltage(s) to a conductor(s) of a capacitive touch screen and sampling return signals from a touch screen conductor(s). Noise measurement techniques may further include sampling ambient return signals from a touch screen conductor(s) in the absence of a stimulus voltage(s). Coupled noise frequencies may also be calculated from a first measured noise frequency. A touch screen control system may use measured or calculated coupled noise frequencies to configure operational parameters that may compensate for the coupled noise during operation of the capacitive touch screen.
Abstract:
Systems and methods to determine locations for dual touch operations performed on a four-wire resistive touch screen. The systems and methods may include measuring signals from pairs of electrodes on each of a first and second resistive sheet of the resistive touch screen in two phases of operation. The systems and methods may further include determining touch screen segment resistances from the signal measurements. The systems and methods may determine locations corresponding to the dual touch operations from the resistances. The systems and methods may also determine locations from the signal measurements.