-
公开(公告)号:KR20180006387A
公开(公告)日:2018-01-17
申请号:KR20177033748
申请日:2016-03-30
Applicant: APPLE INC
Inventor: WANG CHAOHAO , TRIPATHI BRIJESH , TANN CHRISTOPHER PHILIP ALAN , ZALATIMO DAVID S , COTE GUY , NAN HAO , ALBRECHT MARC , SACCHETTO PAOLO , PINTZ SANDRO H
IPC: G09G3/36
CPC classification number: G09G3/3614 , G09G2320/0204 , G09G2320/0247 , G09G2320/0257 , G09G2320/046 , G09G2340/0435 , G09G2360/16
Abstract: 전자디바이스는디스플레이상에표시될콘텐츠를생성할수 있다. 디스플레이는콘텐츠의이미지프레임들을표시하기위한액정디스플레이픽셀들의어레이를가질수 있다. 이미지프레임들은전하축적효과의감소를돕기위하여양의극성및 음의극성으로표시될수 있다. 전하축적추적기는이미지프레임들을분석하여과도한전하축적의위험이존재하는시기를결정할수 있다. 전하축적추적기는그레이레벨, 프레임듀레이션, 및프레임극성에관한정보를분석할수 있다. 전하축적추적기는전체이미지프레임들에대한전하축적메트릭을계산할수 있거나또는각각의프레임의하위영역들을개별적으로처리할수 있다. 하위영역들이개별적으로처리되면, 각각의하위영역은과도한전하축적의위험에대하여개별적으로모니터될수 있다.
Abstract translation: 电子设备可以生成要在显示器上显示的内容。 显示器可以具有用于显示内容的图像帧的液晶显示像素的阵列。 图像帧可以显示正极性和负极性,以帮助减少电荷积累效应。 电荷累积追踪器可以分析图像帧以确定何时存在电荷过度累积的风险。 电荷累积跟踪器可以分析关于灰度级,帧持续时间和帧极性的信息。 电荷累积跟踪器可以计算整个图像帧的电荷累积度量,或者可以分别处理每个帧的子区域。 如果分开处理子区域,则可以单独监视每个子区域的过度电荷累积风险。
-
公开(公告)号:EP3286753A1
公开(公告)日:2018-02-28
申请号:EP16716128
申请日:2016-03-30
Applicant: APPLE INC
Inventor: WANG CHAOHAO , TRIPATHI BRIJESH , TANN CHRISTOPHER PHILIP ALAN , ZALATIMO DAVID S , COTE GUY , NAN HAO , ALBRECHT MARC , SACCHETTO PAOLO , PINTZ SANDRO H
IPC: G09G3/36
CPC classification number: G09G3/3614 , G09G2320/0204 , G09G2320/0247 , G09G2320/0257 , G09G2320/046 , G09G2340/0435 , G09G2360/16
Abstract: An electronic device may generate content that is to be displayed on a display. The display may have an array of liquid crystal display pixels for displaying image frames of the content. The image frames may be displayed with positive and negative polarities to help reduce charge accumulation effects. A charge accumulation tracker may analyze the image frames to determine when there is a risk of excess charge accumulation. The charge accumulation tracker may analyze information on gray levels, frame duration, and frame polarity. The charge accumulation tracker may compute a charge accumulation metric for entire image frames or may process subregions of each frame separately. When subregions are processed separately, each subregion may be individually monitored for a risk of excess charge accumulation.
-