公开(公告)号：DE69934457D1

公开(公告)日：2007-02-01

申请号：DE69934457

申请日：1999-08-03

Applicant: ARKRAY INC

Inventor： FURUSATO NORIAKI ,  MURAKAMI ATSUSHI ,  KISHIMOTO KEN ,  EGAWA KOUJI

IPC: G01N35/00 ,  G01N35/04 ,  G01N1/28

Abstract: An optical analyzing assembly for a test piece (A) having an obverse surface and a reverse surface, the obverse surface carrying at least one test pad. The analyzing assembly comprising a first illuminator (35) for illuminating the obverse surface of the test piece (A) and a light receiving device (36) for receiving light reflected on the obverse surface of the test piece (A). Characterized in that a second illuminator (39) is provided for illuminating the reverse surface of the test piece (A) for locating the test pad and wherein the light receiving device (36) also serves to receive light which is emitted from the second illuminator (39) and passes through the test piece (A).

公开(公告)号：DE69940579D1

公开(公告)日：2009-04-23

申请号：DE69940579

申请日：1999-08-03

Applicant: ARKRAY INC

Inventor： FURUSATO NORIAKI ,  MURAKAMI ATSUSHI ,  KISHIMOTO KEN ,  EGAWA KOUJI

IPC: G01N35/00 ,  G01N35/04 ,  G01N1/28 ,  G01N21/86

Abstract: An optical analyzing assembly for a test piece (A) having an obverse surface and a reverse surface, the obverse surface carrying at least one test pad. The analyzing assembly comprising a first illuminator (35) for illuminating the obverse surface of the test piece (A) and a light receiving device (36) for receiving light reflected on the obverse surface of the test piece (A). Characterized in that a second illuminator (39) is provided for illuminating the reverse surface of the test piece (A) for locating the test pad and wherein the light receiving device (36) also serves to receive light which is emitted from the second illuminator (39) and passes through the test piece (A).

公开(公告)号：DE69934457T2

公开(公告)日：2007-09-27

申请号：DE69934457

申请日：1999-08-03

Applicant: ARKRAY INC

Inventor： FURUSATO NORIAKI ,  MURAKAMI ATSUSHI ,  KISHIMOTO KEN ,  EGAWA KOUJI

IPC: G01N35/00 ,  G01N35/04 ,  G01N1/28

Abstract: An optical analyzing assembly for a test piece (A) having an obverse surface and a reverse surface, the obverse surface carrying at least one test pad. The analyzing assembly comprising a first illuminator (35) for illuminating the obverse surface of the test piece (A) and a light receiving device (36) for receiving light reflected on the obverse surface of the test piece (A). Characterized in that a second illuminator (39) is provided for illuminating the reverse surface of the test piece (A) for locating the test pad and wherein the light receiving device (36) also serves to receive light which is emitted from the second illuminator (39) and passes through the test piece (A).