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    CONTAINER FOR NUCLEIC ACID EXTRACTION, METHOD OF CLEANING SOLID MATRIX AND RELEVANT CLEANING MECHANISM, AND METHOD OF PURIFYING NUCLEIC ACID
    1.
    发明申请
    CONTAINER FOR NUCLEIC ACID EXTRACTION, METHOD OF CLEANING SOLID MATRIX AND RELEVANT CLEANING MECHANISM, AND METHOD OF PURIFYING NUCLEIC ACID 审中-公开
    用于核酸提取的容器，清洁固体基质的方法和相关的清洁机理，以及净化核酸的方法

    公开(公告)号：WO2005118803A9

    公开(公告)日：2007-03-15

    申请号：PCT/JP2005010078

    申请日：2005-06-01

    Applicant: ARKRAY INC ,  KAMATA TATSUO ,  OHTA SHINICHI ,  EGAWA KOUJI

    Inventor： KAMATA TATSUO ,  OHTA SHINICHI ,  EGAWA KOUJI

    IPC: C12N15/09 ,  B01L3/00 ,  C12M1/00 ,  C12M1/34 ,  G01N1/34 ,  G01N1/40

    CPC classification number: B01L3/5085 ,  B01L3/502 ,  B01L2200/0631 ,  B01L2300/0609 ,  G01N1/34 ,  G01N1/405

    Abstract: Container for nucleic acid extraction (2) comprising nucleic acid extraction element (20) for extracting of a target nucleic acid from a sample and for adhesion of the extracted nucleic acid and, provided separate from the nucleic acid extraction element (20), a container frame equipped with accommodation vessel (27) for accommodating of the nucleic acid extraction element (20). The nucleic acid extraction element (20) is constructed so as to include, for example, solid matrix (23) for carrying of the target nucleic acid and holding member (20) for holding of the solid matrix (23). Preferably, the solid matrix (23) is held in a form sloping against the vertical axis of the holding member (20).

    Abstract translation: 用于核酸提取的容器（2），其包含用于从样品中提取靶核酸并用于粘附所提取的核酸的核酸提取元件（20），并且与所述核酸提取元件（20）分开提供容器 框架配备有用于容纳核酸提取元件（20）的容纳容器（27）。 核酸提取元件（20）被构造为包括例如用于携带用于保持固体基质（23）的靶核酸和保持构件（20）的固体基质（23）。 优选地，固体基质（23）以与保持构件（20）的垂直轴线倾斜的形式保持。

    2.
    发明专利
    未知

    公开(公告)号：DE69934457D1

    公开(公告)日：2007-02-01

    申请号：DE69934457

    申请日：1999-08-03

    Applicant: ARKRAY INC

    Inventor： FURUSATO NORIAKI ,  MURAKAMI ATSUSHI ,  KISHIMOTO KEN ,  EGAWA KOUJI

    IPC: G01N35/00 ,  G01N35/04 ,  G01N1/28

    Abstract: An optical analyzing assembly for a test piece (A) having an obverse surface and a reverse surface, the obverse surface carrying at least one test pad. The analyzing assembly comprising a first illuminator (35) for illuminating the obverse surface of the test piece (A) and a light receiving device (36) for receiving light reflected on the obverse surface of the test piece (A). Characterized in that a second illuminator (39) is provided for illuminating the reverse surface of the test piece (A) for locating the test pad and wherein the light receiving device (36) also serves to receive light which is emitted from the second illuminator (39) and passes through the test piece (A).

    Measuring method and instrument comprising image sensor
    3.
    发明专利
    Measuring method and instrument comprising image sensor 未知

    公开(公告)号：AU1275202A

    公开(公告)日：2002-05-21

    申请号：AU1275202

    申请日：2001-11-09

    Applicant: ARKRAY INC

    Inventor： WADA ATSUSHI ,  EGAWA KOUJI

    IPC: G01J1/18 ,  G01J1/20 ,  G01J3/28 ,  G01N21/27 ,  G01N21/59 ,  G01N21/17

    Abstract: A linearizing correction unit (104) carries out a linearizing correction process on the output of an image sensor (8) based upon linearizing correction data stored in a linearizing correction data holding unit (102), and a light-irregularity correction unit (108) carries out a light-irregularity correction process on the image sensor output that has been subjected to the linearizing correction process based upon light-irregularity correction data stored in a light-irregularity correction data holding unit (106). A refection factor calculation unit (110) calculates an integral value of the in-plane reflection factor of a test piece by using the output that has been subjected to the linearizing correction and light-irregularity correction with respect to pixel outputs of the image sensor (8) obtained when the test piece having in-plane density irregularities is measured. A quantifying unit (114) applies calibration curve data of a calibration-curve-data holding unit (112) to the integrated reflection factor obtained by the reflection factor calculation unit so that a sample density of the test piece is calculated.

    4.
    发明专利
    未知

    公开(公告)号：DE69940579D1

    公开(公告)日：2009-04-23

    申请号：DE69940579

    申请日：1999-08-03

    Applicant: ARKRAY INC

    Inventor： FURUSATO NORIAKI ,  MURAKAMI ATSUSHI ,  KISHIMOTO KEN ,  EGAWA KOUJI

    IPC: G01N35/00 ,  G01N35/04 ,  G01N1/28 ,  G01N21/86

    Abstract: An optical analyzing assembly for a test piece (A) having an obverse surface and a reverse surface, the obverse surface carrying at least one test pad. The analyzing assembly comprising a first illuminator (35) for illuminating the obverse surface of the test piece (A) and a light receiving device (36) for receiving light reflected on the obverse surface of the test piece (A). Characterized in that a second illuminator (39) is provided for illuminating the reverse surface of the test piece (A) for locating the test pad and wherein the light receiving device (36) also serves to receive light which is emitted from the second illuminator (39) and passes through the test piece (A).

    5.
    发明专利
    未知

    公开(公告)号：DE69934457T2

    公开(公告)日：2007-09-27

    申请号：DE69934457

    申请日：1999-08-03

    Applicant: ARKRAY INC

    Inventor： FURUSATO NORIAKI ,  MURAKAMI ATSUSHI ,  KISHIMOTO KEN ,  EGAWA KOUJI

    IPC: G01N35/00 ,  G01N35/04 ,  G01N1/28

    Abstract: An optical analyzing assembly for a test piece (A) having an obverse surface and a reverse surface, the obverse surface carrying at least one test pad. The analyzing assembly comprising a first illuminator (35) for illuminating the obverse surface of the test piece (A) and a light receiving device (36) for receiving light reflected on the obverse surface of the test piece (A). Characterized in that a second illuminator (39) is provided for illuminating the reverse surface of the test piece (A) for locating the test pad and wherein the light receiving device (36) also serves to receive light which is emitted from the second illuminator (39) and passes through the test piece (A).

    TOOL FOR ANALYZING SPECIMEN
    10.
    发明公开
    TOOL FOR ANALYZING SPECIMEN 有权
    工具进行试

    公开(公告)号：EP1586901A4

    公开(公告)日：2008-05-28

    申请号：EP04792597

    申请日：2004-10-19

    Applicant: ARKRAY INC

    Inventor： SAKAMOTO HISASHI ,  MATSUDA TAKESHI ,  EGAWA KOUJI ,  SAIJI TETSUAKI

    IPC: G01N33/52 ,  G01N33/543 ,  G06K19/06

    CPC classification number: G01N33/523

    Abstract: A tool for analyzing a specimen having a sufficient volume of information, and being capable of providing the information accurately and reading out that information without requiring any special mechanism. In the tool (1) for analyzing a specimen having a reagent layer (11) and an information recording layer (12) formed on a substrate (13), the information recording layer is divided into one or a plurality of regions and each region is colored with a single color. Information is recorded by at least one of a combination of gray levels of single color in the plurality of regions and the area of each region.

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