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公开(公告)号:US20240318311A1
公开(公告)日:2024-09-26
申请号:US18610654
申请日:2024-03-20
Applicant: ASM IP Holding B.V.
Inventor: Agung Setiadi , Hiroki Matsuda , Jun Kawahara
IPC: C23C16/455 , C23C16/34 , C23C16/515 , H01J37/32 , H01L21/02
CPC classification number: C23C16/45542 , C23C16/345 , C23C16/45534 , C23C16/515 , H01J37/32146 , H01J37/3244 , H01J37/32816 , H01L21/0217 , H01L21/02211 , H01L21/02274 , H01L21/0228 , H01L21/02315 , H01J2237/332
Abstract: Methods and systems for pretreating a surface prior to depositing silicon nitride on the surface are disclosed. Exemplary methods include pretreating the surface by exposing the surface to activated species formed from one or more gases comprising nitrogen and hydrogen under conditions that reduce incubation time for depositing the silicon nitride.
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2.
公开(公告)号:US20240014030A1
公开(公告)日:2024-01-11
申请号:US18218726
申请日:2023-07-06
Applicant: ASM IP Holding B.V.
Inventor: Agung Setiadi , Hiroki Matsuda , Jun Kawahara
CPC classification number: H01L21/0217 , H01J37/32816 , H01J37/32449 , H01L21/0228 , H01L21/02211 , H01L21/02274 , H01J2237/332 , H01J2237/182
Abstract: A method for selectively depositing silicon nitride on a first material relative to a second material is disclosed. An exemplary method includes performing one or more deposition cycles and performing a treatments process.
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