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1.
公开(公告)号:JP2009302559A
公开(公告)日:2009-12-24
申请号:JP2009208849
申请日:2009-09-10
Applicant: Asml Holding Nv , Asml Netherlands Bv , エーエスエムエル ネザーランズ ビー.ブイ. , エーエスエムエル ホールディング エヌ.ブイ.
Inventor: LIPSON MATTHEW , DIERICHS MARCEL MATHIJS T M , DONDERS SJOERD NICOLAAS LAMBER , MULKENS JOHANNES CATHARINUS H , STREEFKERK BOB , WILKLOW RONALD , DE JONGE ROEL
IPC: H01L21/027 , G02B13/24 , G03F7/20
CPC classification number: G03F7/70341
Abstract: PROBLEM TO BE SOLVED: To provide a lithographic apparatus which includes an immersion liquid having a refractive index higher than that of water and has no possibility of agglomeration of contained particles during operation. SOLUTION: In a projection exposure type lithographic apparatus used as a stepper or a scanner, an aqueous solution of one or more alkali metal halides such as alkali metal fluoride, alkali metal chloride, and alkali metal bromide, is used as an immersion liquid having a refractive index higher than that of water. The refractive index is 1.5 or more. COPYRIGHT: (C)2010,JPO&INPIT
Abstract translation: 要解决的问题:提供一种光刻设备,其包括折射率高于水的浸液,并且在操作期间不具有所包含的颗粒的聚集的可能性。 解决方案:在用作步进器或扫描仪的投影曝光型光刻设备中,使用一种或多种碱金属卤化物如碱金属氟化物,碱金属氯化物和碱金属溴化物的水溶液作为浸渍 液体的折射率高于水的折射率。 折射率为1.5以上。 版权所有(C)2010,JPO&INPIT
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2.
公开(公告)号:JP2008131045A
公开(公告)日:2008-06-05
申请号:JP2007296177
申请日:2007-11-15
Applicant: Asml Holding Nv , Asml Netherlands Bv , エーエスエムエル ネザーランズ ビー.ブイ. , エーエスエムエル ホールディング エヌ.ブイ.
Inventor: HUBERTUS MULKENS JOHANNES C , LIPSON MATTHEW , SEWELL HARRY , MARKOYA LOUIS JOHN
IPC: H01L21/027 , G03F7/20
CPC classification number: H01L21/0274 , G03F7/70341
Abstract: PROBLEM TO BE SOLVED: To provide an immersion lithographic apparatus to be used with one or more immersion liquids from different sources. SOLUTION: A system for tuning the refractive index of immersion liquid in an immersion lithographic apparatus is disclosed. Two or more immersion liquids of different refractive index are mixed together in order to achieve a desired refractive index. Further, the fluids may be conditioned and treated to maintain optical characteristics. COPYRIGHT: (C)2008,JPO&INPIT
Abstract translation: 要解决的问题:提供一种用于来自不同来源的一种或多种浸液的浸没式光刻设备。 公开了一种用于调节浸没式光刻设备中浸没液的折射率的系统。 将两种或更多种不同折射率的浸液混合在一起以达到所需的折射率。 此外,流体可以被调节和处理以保持光学特性。 版权所有(C)2008,JPO&INPIT
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公开(公告)号:WO2016079051A3
公开(公告)日:2016-09-22
申请号:PCT/EP2015076687
申请日:2015-11-16
Applicant: ASML NETHERLANDS BV , ASML HOLDING NV
Inventor: KRUIZINGA MATTHIAS , JANSEN MAARTEN MATHIJS MARINUS , AZEREDO LIMA JORGE MANUEL , BOGAART ERIK WILLEM , BROUNS DERK SERVATIUS GERTRUDA , BRUIJN MARC , BRULS RICHARD JOSEPH , DEKKERS JEROEN , JANSSEN PAUL , KAMALI MOHAMMAD REZA , KRAMER RONALD HARM GUNTHER , LANSBERGEN ROBERT GABRIËL MARIA , LEENDERS MARTINUS HENDRIKUS ANTONIUS , LIPSON MATTHEW , LOOPSTRA ERIK ROELOF , LYONS JOSEPH H , ROUX STEPHEN , VAN DEN BOSCH GERRIT , VAN DEN HEIJKANT SANDER , VAN DER GRAAF SANDRA , VAN DER MEULEN FRITS , VAN LOO JÉRÔME FRANÇOIS SYLVAIN VIRGILE , VERBRUGGE BEATRIJS LOUISE MARIE-JOSEPH KATRIEN
CPC classification number: G03F7/70983 , G03F1/64 , G03F7/70825
Abstract: A mask assembly suitable for use in a lithographic process, the mask assembly comprising a patterning device; and a pellicle frame configured to support a pellicle and mounted on the patterning device with a mount; wherein the mount is configured to suspend the pellicle frame relative to the patterning device such that there is a gap between the pellicle frame and the patterning device; and wherein the mount provides a releasably engageable attachment between the patterning device and the pellicle frame.
Abstract translation: 适用于光刻过程的掩模组件,所述掩模组件包括图案形成装置; 以及被配置为支撑薄膜并用安装件安装在所述图案形成装置上的薄膜框架; 其中所述支架被构造成相对于所述图案形成装置悬挂所述薄膜框架,使得所述薄膜框架和所述图案形成装置之间存在间隙; 并且其中所述安装件在所述图案形成装置和所述薄膜框架之间提供可释放地接合的附接。
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公开(公告)号:WO2014122151A3
公开(公告)日:2014-11-20
申请号:PCT/EP2014052204
申请日:2014-02-05
Applicant: ASML HOLDING NV , ASML NETHERLANDS BV
Inventor: DELPUERTO SANTIAGO E , LIPSON MATTHEW , HENDERSON KENNETH , LAFARRE RAYMOND , MARKOYA LOUIS JOHN , UITTERDIJK TAMMO , VERMEULEN JOHANNES PETRUS MARTINUS BERNARDUS , DE GROOT ANTONIUS FRANCISCUS JOHANNES , VAN DER WILK RONALD
IPC: G03F7/20
CPC classification number: G03F7/70875 , G03F7/70708 , H01L21/67109 , H01L21/6831 , H01L21/6875
Abstract: A support such as a clamp (310) is configured to releasably hold a patterning device such as a reticle (300) to secure it and prevent heat-induced deformation of it. For example, an electrostatic clamp includes a first substrate (312) having opposing first (313) and second (315) surfaces, a plurality of burls (316) located on the first surface and configured to contact the reticle, a second substrate (314) having opposing first (317) and second (319) surfaces. The first surface of the second substrate is coupled to the second surface of the first substrate. A plurality of cooling elements (318) are located between the first surface of the second substrate and the second surface of the first substrate. The cooling elements are configured to cause electrons to travel from the second surface of the first substrate to the first surface of the second substrate. Each cooling element is substantially aligned with a respective burl.
Abstract translation: 诸如夹具(310)的支撑件构造成可释放地保持诸如掩模版(300)的图案形成装置以将其固定并防止其热引起的变形。 例如,静电夹具包括具有相对的第一(313)和第二(315)表面的第一基底(312),位于第一表面上并被构造成接触光罩的多个毛刺(316),第二基底 )具有相对的第一(317)和第二(319)表面。 第二衬底的第一表面耦合到第一衬底的第二表面。 多个冷却元件(318)位于第二基板的第一表面和第一基板的第二表面之间。 冷却元件构造成使电子从第一衬底的第二表面移动到第二衬底的第一表面。 每个冷却元件基本上与相应的毛刺对齐。
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公开(公告)号:NL2012204A
公开(公告)日:2014-12-18
申请号:NL2012204
申请日:2014-02-05
Applicant: ASML HOLDING NV , ASML NETHERLANDS BV
Inventor: DEL PUERTO SANTIAGO , LIPSON MATTHEW , HENDERSON KENNETH , LAFARRE RAYMOND , MARKOYA LOUIS , VERMEULEN JOHANNES , GROOT ANTONIUS FRANCISCUS JOHANNES , WILK RONALD
IPC: G03F7/20
Abstract: A lithographic apparatus is provided. The lithographic apparatus includes a reticle and an electrostatic clamp configured to releasably hold the reticle. The electrostatic clamp includes a first substrate having opposing first and second surfaces, a plurality of burls located on the first surface and configured to contact the reticle, a second substrate having opposing first and second surfaces. The first surface of the second substrate is coupled to the second surface of the first substrate. A plurality of cooling elements are located between the first surface of the second substrate and the second surface of the first substrate. The cooling elements are configured to cause electrons to travel from the second surface of the first substrate to the first surface of the second substrate. Each cooling element is substantially aligned with a respective burl.
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公开(公告)号:CA2968151A1
公开(公告)日:2016-05-26
申请号:CA2968151
申请日:2015-11-16
Applicant: ASML HOLDING NV , ASML NETHERLANDS BV
Inventor: KRUIZINGA MATTHIAS , JANSEN MAARTEN MATHIJS MARINUS , AZEREDO LIMA JORGE MANUEL , BOGAART ERIK WILLEM , BROUNS DERK SERVATIUS GERTRUDA , BRUIJN MARC , BRULS RICHARD JOSEPH , DEKKERS JEROEN , JANSSEN PAUL , KAMALI MOHAMMAD REZA , KRAMER RONALD HARM GUNTHER , LANSBERGEN ROBERT GABRIEL MARIA , LEENDERS MARTINUS HENDRIKUS ANTONIUS , LIPSON MATTHEW , LOOPSTRA ERIK ROELOF , LYONS JOSEPH H , ROUX STEPHEN , VAN DEN BOSCH GERRIT , VAN DEN HEIJKANT SANDER , VAN DER GRAAF SANDRA , VAN DER MEULEN FRITS , VAN LOO JEROME FRANCOIS SYLVAIN VIRGILE , VERBRUGGE BEATRIJS LOUISE MARIE-JOSEPH KATRIEN
Abstract: A mask assembly suitable for use in a lithographic process, the mask assembly comprising a patterning device; and a pellicle frame configured to support a pellicle and mounted on the patterning device with a mount; wherein the mount is configured to suspend the pellicle frame relative to the patterning device such that there is a gap between the pellicle frame and the patterning device; and wherein the mount provides a releasably engageable attachment between the patterning device and the pellicle frame.
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公开(公告)号:JP2007165934A
公开(公告)日:2007-06-28
申请号:JP2007057545
申请日:2007-03-07
Applicant: Asml Netherlands Bv , エーエスエムエル ネザーランズ ビー.ブイ.
Inventor: LOOPSTRA ERIK ROELOF , DIERICHS MARCLE MATHIJS T M , JASPER JOHANNES CHRISTIAN MARI , MEIJER HENDRICUS JOHANNE MARIA , MICKAN UWE , MULKENS JOHANNES CATHARINUS HU , LIPSON MATTHEW , UITTERDIJK TAMMO , BASELMANS JOHANNES JACOBUS MAT
IPC: H01L21/027 , G03F7/20
CPC classification number: G03F7/70866 , G03F7/7015 , G03F7/70341 , Y10S430/162
Abstract: PROBLEM TO BE SOLVED: To provide a lithographic apparatus and a method of manufacturing a device. SOLUTION: A lithogrophic projection apparatus for use with an immersion liquid placed between the final element of a projection system and a substrate W is disclosed. A plurality of methods for protecting the components of the projection system, a substrate table, and a liquid confinement system are disclosed. These methods include a step of applying a protective coating on the final element 20 of the projection system and a step of providing sacrificial bodies to an upstream side of the components. Further, a final optical element composed of two components made from CaF 2 is disclosed. COPYRIGHT: (C)2007,JPO&INPIT
Abstract translation: 解决的问题:提供一种光刻设备及其制造方法。 解决方案:公开了一种用于放置在投影系统的最终元件和基板W之间的浸没液体的光栅投影装置。 公开了用于保护投影系统,衬底台和液体限制系统的组件的多种方法。 这些方法包括在投影系统的最终元件20上施加保护涂层的步骤以及向部件的上游侧提供牺牲体的步骤。 此外,公开了由由CaF 2 SBB制成的两个部件组成的最终光学元件。 版权所有(C)2007,JPO&INPIT
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公开(公告)号:JP2012151513A
公开(公告)日:2012-08-09
申请号:JP2012111485
申请日:2012-05-15
Applicant: Asml Netherlands Bv , エーエスエムエル ネザーランズ ビー.ブイ.
Inventor: LOOPSTRA ERIK ROELOF , DIERICHS MARCLE MATHIJS T M , JASPER JOHANNES CHRISTIAN MARIA , MEIJER HENDRICUS JOHANNE MARIA , MICKAN UWE , MULKENS JOHANNES CATHARINUS HUBERTUS , LIPSON MATTHEW , UITTERDIJK TAMMO , BASELMANS JOHANNES JACOBUS MATHEUS
IPC: H01L21/027 , G02B21/00 , G02B21/26 , G03F7/20
CPC classification number: G03F7/70866 , G03F7/7015 , G03F7/70341 , Y10S430/162
Abstract: PROBLEM TO BE SOLVED: To provide a lithographic apparatus and a method of manufacturing a device.SOLUTION: A lithographic projection apparatus for using with immersion liquid placed between a final element of a projection system and a substrate W is disclosed. A plurality of methods for protecting the projection system, a substrate table, and components of a liquid constraint system are disclosed. These methods include: a step of applying a protective coating on the final element 20 of the projection system; and a step of providing sacrificial bodies to an upstream side of the components. A two-component final optical element of CaFis also disclosed.
Abstract translation: 解决的问题:提供一种光刻设备及其制造方法。 公开了一种用于使用放置在投影系统的最终元件和基板W之间的浸没液体的光刻投影装置。 公开了用于保护投影系统,衬底台和液体约束系统的组件的多种方法。 这些方法包括:将保护涂层施加在投影系统的最终元件20上的步骤; 以及向组件的上游侧提供牺牲体的步骤。 还公开了CaF
2 SB>的双组分最终光学元件。 版权所有(C)2012,JPO&INPIT -
公开(公告)号:JP2010153923A
公开(公告)日:2010-07-08
申请号:JP2010081728
申请日:2010-03-31
Applicant: Asml Netherlands Bv , エーエスエムエル ネザーランズ ビー.ブイ.
Inventor: LOOPSTRA ERIK ROELOF , DIERICHS MARCLE MATHIJS T M , JASPER JOHANNES CHRISTIAN MARIA , MEIJER HENDRICUS JOHANNE MARIA , MICKAN UWE , MULKENS JOHANNES CATHARINUS HUBERTUS , LIPSON MATTHEW , UITTERDIJK TAMMO , BASELMANS JOHANNES JACOBUS MATHEUS
IPC: H01L21/027 , G03F7/20
CPC classification number: G03F7/70866 , G03F7/7015 , G03F7/70341 , Y10S430/162
Abstract: PROBLEM TO BE SOLVED: To provide a lithographic apparatus and a method of manufacturing a device. SOLUTION: There is disclosed a lithographic projection apparatus for use with an immersion liquid placed between the final element of a projection system and a substrate W. There are disclosed a plurality of methods for protecting components of the projection system, a substrate table, and a liquid confinement system are disclosed. These methods include a step of applying a protective coating on the final element 20 of the projection system and a step of providing sacrificial bodies to an upstream side of the components. Further, there is disclosed a final optical element composed of two components made from CaF 2 . COPYRIGHT: (C)2010,JPO&INPIT
Abstract translation: 解决的问题:提供一种光刻设备及其制造方法。 解决方案:公开了一种与放置在投影系统的最终元件和基板W之间的浸没液体一起使用的光刻投影装置。公开了用于保护投影系统的元件的多种方法,基板台 ,以及液体封闭系统。 这些方法包括在投影系统的最终元件20上施加保护涂层的步骤以及向部件的上游侧提供牺牲体的步骤。 此外,公开了由两个由CaF 2 SBB制成的部件组成的最终光学元件。 版权所有(C)2010,JPO&INPIT
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10.
公开(公告)号:JP2006140449A
公开(公告)日:2006-06-01
申请号:JP2005290623
申请日:2005-10-04
Applicant: Asml Holdings Nv , Asml Netherlands Bv , エイエスエムエル ネザランドズ ベスローテン フエンノートシャップ , エイエスエムエル ホールディング ナムローゼ フエンノートシャップ
Inventor: LIPSON MATTHEW , DIERICHS MARCEL MATHIJS T M , DONDERS SJOERD NICOLAAS LAMBER , MULKENS JOHANNES CATHARINUS H , STREEFKERK BOB , WILKLOW RONALD , DE JONGE ROEL
IPC: H01L21/027 , G03F7/038
CPC classification number: G03F7/70341
Abstract: PROBLEM TO BE SOLVED: To provide a lithographic apparatus which includes an immersion liquid having a refractive index higher than that of water and has no possibility of agglomeration of contained particles during operation.
SOLUTION: In a projection exposure type lithographic apparatus used as a stepper or a scanner, an aqueous solution of one or more alkali metal halides such as alkali metal fluoride, alkali metal chloride, and alkali metal bromide, is used as an immersion liquid having a refractive index higher than that of water. The refractive index is 1.5 or more.
COPYRIGHT: (C)2006,JPO&NCIPIAbstract translation: 要解决的问题:提供一种光刻设备,其包括折射率高于水的浸液,并且在操作期间不具有所包含的颗粒的聚集的可能性。 解决方案:在用作步进器或扫描仪的投影曝光型光刻设备中,使用一种或多种碱金属卤化物如碱金属氟化物,碱金属氯化物和碱金属溴化物的水溶液作为浸渍 液体的折射率高于水的折射率。 折射率为1.5以上。 版权所有(C)2006,JPO&NCIPI
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