-
公开(公告)号:US20250021022A1
公开(公告)日:2025-01-16
申请号:US18682883
申请日:2021-07-13
Applicant: ASML NETHERLANDS B.V.
Inventor: Tiannan GUAN , Zhuangxiong HUANG , Johannes Bernardus Charles ENGELEN , Günes NAKIBOGLU , Matthias KRUIZINGA , Petrus Jacobus Maria VAN GILS , Aldo TRALLI , Sjoerd Frans DE VRIES , Marcel Maria Cornelius Franciscus TEUNISSEN , Richard Joseph BRULS , Frits VAN DER MEULEN
IPC: G03F7/00
Abstract: The invention relates to an electrostatic holder comprising: a body, and a clamping element attached to the body, said clamping element comprising an electrode for applying an attractive force between the clamping element and a first to be clamped object, wherein an outer edge of the body is configured to provide a gap between the outer edge of the body and the first to be clamped object, which gap is configured for outputting a fluid for reducing dust particles reaching the first to be clamped object or a second to be clamped object on an opposite side of the holder.
-
公开(公告)号:US20170131643A1
公开(公告)日:2017-05-11
申请号:US15029565
申请日:2015-06-03
Applicant: ASML Netherlands B.V.
Inventor: Paul JANSSEN , Richard Joseph BRULS , Petrus Jacobus Maria VAN GILS
IPC: G03F7/20
CPC classification number: G03F7/70708 , G03F7/707 , G03F7/70783 , G03F7/70866 , G03F7/70916 , H01L21/6831 , H01L21/6875
Abstract: A lithographic apparatus includes a first object holder and a second object holder. The first object holder is arranged to hold an object at a holder-facing surface. The object has the holder-facing surface. The second object holder is arranged to hold the object at the holder-facing surface. The lithographic apparatus is arranged to deform a contaminating particle at the holder-facing surface more when the object is held at the second object holder than when the object is held at the first object holder.
-