Lithographic apparatus and device manufacturing method
    1.
    发明专利
    Lithographic apparatus and device manufacturing method 有权
    LITHOGRAPHIC装置和装置制造方法

    公开(公告)号:JP2009231832A

    公开(公告)日:2009-10-08

    申请号:JP2009060345

    申请日:2009-03-13

    CPC classification number: G03F7/70891 G03F7/70533

    Abstract: PROBLEM TO BE SOLVED: To provide an additional technology for reducing and/or increasing a lens-heating action. SOLUTION: In the lithographic apparatus, a control system is provided so as to automatically reduce throughput of device manufacture when aberration of lens-heating exceeds a specific threshold value. Determination whether the aberration of lens-heating exceeds the threshold value, is obtained by, for example, prediction using a lens-heating model or measurement of a previously exposed substrate. Reduction of the throughput can be achieved by reducing beam power or duty-cycle of the apparatus. In a specific embodiment, time required for substrate transfer between exposed portions is increased. COPYRIGHT: (C)2010,JPO&INPIT

    Abstract translation: 要解决的问题:提供用于减少和/或增加镜片加热动作的附加技术。 解决方案:在光刻设备中,提供控制系统,以便在镜片加热的像差超过特定阈值时自动降低器件制造的吞吐量。 通过例如使用透镜加热模型的预测或先前曝光的基板的测量来确定透镜加热的像差是否超过阈值。 可以通过减小装置的光束功率或占空比来实现吞吐量的降低。 在具体实施例中,暴露部分之间的衬底转移所需的时间增加。 版权所有(C)2010,JPO&INPIT

Patent Agency Ranking