公开(公告)号：US12298180B2

公开(公告)日：2025-05-13

申请号：US18205404

申请日：2023-06-02

Applicant: Apple Inc.

Inventor： Alfredo Bismuto ,  David I. Simon ,  Jason Pelc

IPC: G01J1/42 ,  G01J1/02 ,  G01J1/04

Abstract: A device including a plurality of epitaxial chips is disclosed. An epitaxial chip can have one or more of a light source and a detector, where the detector can be configured to measure the optical properties of the light emitted by a light source. In some examples, one or more epitaxial chips can have one or more optical properties that differ from other epitaxial chips. The epitaxial chips can be dependently operable. For example, the detector located on one epitaxial chip can be configured for measuring the optical properties of light emitted by a light source located on another epitaxial chip by way of one or more optical signals. The collection of epitaxial chips can also allow detection of a plurality of laser outputs, where two or more epitaxial chips can have different material and/or optical properties.

公开(公告)号：US11740126B2

公开(公告)日：2023-08-29

申请号：US17351067

申请日：2021-06-17

Applicant: Apple Inc.

Inventor： Trent D. Ridder ,  Mark Alan Arbore ,  Gary Shambat ,  Robert Chen ,  David I. Simon ,  Miikka M. Kangas

IPC: G01J3/427 ,  G01J3/10 ,  G01J3/28 ,  G01J3/42 ,  G01J3/06 ,  G01N21/25 ,  G01N21/35

CPC classification number: G01J3/427 ,  G01J3/06 ,  G01J3/10 ,  G01J3/108 ,  G01J3/2803 ,  G01J3/2846 ,  G01J3/42 ,  G01N21/25 ,  G01N21/35

Abstract: Methods and systems for measuring one or more properties of a sample are disclosed. The methods and systems can include multiplexing measurements of signals associated with a plurality of wavelengths without adding any signal independent noise and without increasing the total measurement time. One or more levels of encoding, where, in some examples, a level of encoding can be nested within one or more other levels of encoding. Multiplexing can include wavelength, position, and detector state multiplexing. In some examples, SNR can be enhanced by grouping together one or more signals based on one or more properties including, but not limited to, signal intensity, drift properties, optical power detected, wavelength, location within one or more components, material properties of the light sources, and electrical power. In some examples, the system can be configured for optimizing the conditions of each group individually based on the properties of a given group.

公开(公告)号：US11156497B2

公开(公告)日：2021-10-26

申请号：US16651901

申请日：2018-09-25

Applicant: Apple Inc.

Inventor： Alfredo Bismuto ,  David I. Simon ,  Jason Pelc

IPC: G01J1/42 ,  G01J1/02 ,  G01J1/04

Abstract: A device including a plurality of epitaxial chips is disclosed. An epitaxial chip can have one or more of a light source and a detector, where the detector can be configured to measure the optical properties of the light emitted by a light source. In some examples, one or more epitaxial chips can have one or more optical properties that differ from other epitaxial chips. The epitaxial chips can be dependently operable. For example, the detector located on one epitaxial chip can be configured for measuring the optical properties of light emitted by a light source located on another epitaxial chip by way of one or more optical signals. The collection of epitaxial chips can also allow detection of a plurality of laser outputs, where two or more epitaxial chips can have different material and/or optical properties.

公开(公告)号：US11041758B2

公开(公告)日：2021-06-22

申请号：US16095323

申请日：2017-04-13

Applicant: Apple Inc.

Inventor： Trent D. Ridder ,  Mark Alan Arbore ,  Gary Shambat ,  Robert Chen ,  David I. Simon ,  Miikka M. Kangas

IPC: G01J3/427 ,  G01J3/10 ,  G01J3/28 ,  G01J3/42 ,  G01N21/35

Abstract: Methods and systems for measuring one or more properties of a sample are disclosed. The methods and systems can include multiplexing measurements of signals associated with a plurality of wavelengths without adding any signal independent noise and without increasing the total measurement time. One or more levels of encoding, where, in some examples, a level of encoding can be nested within one or more other levels of encoding. Multiplexing can include wavelength, position, and detector state multiplexing. In some examples, SNR can be enhanced by grouping together one or more signals based on one or more properties including, but not limited to, signal intensity, drift properties, optical power detected, wavelength, location within one or more components, material properties of the light sources, and electrical power. In some examples, the system can be configured for optimizing the conditions of each group individually based on the properties of a given group.

公开(公告)号：US10323987B2

公开(公告)日：2019-06-18

申请号：US15873795

申请日：2018-01-17

Applicant: Apple Inc.

Inventor： Miikka M. Kangas ,  Michael J. Bishop ,  Robert Chen ,  David I. Simon ,  Harold L. Sontag, III ,  George Dee Skidmore

IPC: G01J4/00 ,  G01J5/08 ,  G01J5/02 ,  G01J5/20 ,  G01J4/04

Abstract: This relates to sensor systems, detectors, imagers, and readout integrated circuits (ROICs) configured to selectively detect one or more frequencies or polarizations of light, capable of operating with a wide dynamic range, or any combination thereof. In some examples, the detector can include one or more light absorbers; the patterns and/or properties of a light absorber can be configured based on the desired measurement wavelength range and/or polarization direction. In some examples, the detector can comprise a plurality of at least partially overlapping light absorbers for enhanced dynamic range detection. In some examples, the detector can be capable of electrostatic tuning for one or more flux levels by varying the response time or sensitivity to account for various flux levels. In some examples, the ROIC can be capable of dynamically adjusting at least one of the frame rate integrating capacitance, and power of the illumination source.

公开(公告)号：US11585749B2

公开(公告)日：2023-02-21

申请号：US17063483

申请日：2020-10-05

Applicant: Apple Inc.

Inventor： Miikka M. Kangas ,  Mark Alan Arbore ,  David I. Simon ,  Michael J. Bishop ,  James W. Hillendahl ,  Robert Chen

IPC: G01N21/27 ,  G01N21/35 ,  G01N21/47 ,  G01J3/32 ,  G01J3/36 ,  G01J3/433 ,  G01J3/447 ,  G01J3/02 ,  G01J3/42 ,  G01N21/49 ,  G01N21/21

Abstract: This relates to systems and methods for measuring a concentration and type of substance in a sample at a sampling interface. The systems can include a light source, optics, one or more modulators, a reference, a detector, and a controller. The systems and methods disclosed can be capable of accounting for drift originating from the light source, one or more optics, and the detector by sharing one or more components between different measurement light paths. Additionally, the systems can be capable of differentiating between different types of drift and eliminating erroneous measurements due to stray light with the placement of one or more modulators between the light source and the sample or reference. Furthermore, the systems can be capable of detecting the substance along various locations and depths within the sample by mapping a detector pixel and a microoptics to the location and depth in the sample.

公开(公告)号：US20210018432A1

公开(公告)日：2021-01-21

申请号：US17063483

申请日：2020-10-05

Applicant: Apple Inc.

Inventor： Miikka M. Kangas ,  Mark Alan Arbore ,  David I. Simon ,  Michael J. Bishop ,  James W. Hillendahl ,  Robert Chen

IPC: G01N21/27 ,  G01N21/35 ,  G01N21/47 ,  G01J3/32 ,  G01J3/36 ,  G01J3/433 ,  G01J3/447 ,  G01J3/02 ,  G01J3/42

Abstract: This relates to systems and methods for measuring a concentration and type of substance in a sample at a sampling interface. The systems can include a light source, optics, one or more modulators, a reference, a detector, and a controller. The systems and methods disclosed can be capable of accounting for drift originating from the light source, one or more optics, and the detector by sharing one or more components between different measurement light paths. Additionally, the systems can be capable of differentiating between different types of drift and eliminating erroneous measurements due to stray light with the placement of one or more modulators between the light source and the sample or reference. Furthermore, the systems can be capable of detecting the substance along various locations and depths within the sample by mapping a detector pixel and a microoptics to the location and depth in the sample.

公开(公告)号：US10199873B2

公开(公告)日：2019-02-05

申请号：US15279367

申请日：2016-09-28

Applicant: Apple Inc.

Inventor： Michael F. Culbert ,  Brett C. Bilbrey ,  David I. Simon ,  Peter M. Arnold

IPC: G06F1/26 ,  H02J5/00 ,  H02J7/02 ,  H02J7/34 ,  H04B5/00 ,  H02J50/12 ,  H02J50/80 ,  H02J17/00

Abstract: Various embodiments of a wirelessly powered local computing environment are described. The wireless powered local computing environment includes at least a near field magnetic resonance (NFMR) power supply arranged to wirelessly provide power to any of a number of suitably configured devices. In the described embodiments, the devices arranged to receive power wirelessly from the NFMR power supply must be located in a region known as the near field that extends no further than a distance D of a few times a characteristic size of the NFMR power supply transmission device. Typically, the distance D can be on the order of 1 meter or so.

公开(公告)号：US09565364B2

公开(公告)日：2017-02-07

申请号：US14828448

申请日：2015-08-17

Applicant: Apple Inc.

Inventor： Jason Hau-Ping Chen ,  Brandon Dean Slack ,  David I. Simon

IPC: H04N5/232

CPC classification number: H04N5/23261 ,  H04N5/23248 ,  H04N5/23293

Abstract: Methods and apparatuses are disclosed to correct for tilt and/or perspective distortion in image capture devices. In some embodiments, the method may include reading an orientation measurement associated with a relative position of an image capture device with respect to an object, determining if the orientation measurement is less than a threshold, and in the event that the orientation measurement is less than the threshold, correcting an image obtained by the image capture device. In some embodiments, the apparatus may include an image sensor, a memory coupled to the image sensor, an orientation measurement device coupled to the image sensor, and a distance measurement device coupled to the image sensor, where the image data may be stored in the memory along with a measurement from the accelerometer and along with a measurement from the distance measurement device.

Abstract translation: 公开了用于校正图像捕获装置中的倾斜和/或透视失真的方法和装置。 在一些实施例中，该方法可以包括读取与图像捕获装置相对于对象的相对位置相关联的取向测量，确定取向测量是否小于阈值，以及在取向测量小于 阈值，校正由图像捕获装置获得的图像。 在一些实施例中，该装置可以包括图像传感器，耦合到图像传感器的存储器，耦合到图像传感器的取向测量装置以及耦合到图像传感器的距离测量装置，其中可以将图像数据存储在 存储器以及来自加速度计的测量以及距离测量装置的测量值。

公开(公告)号：US09113078B2

公开(公告)日：2015-08-18

申请号：US14175752

申请日：2014-02-07

Applicant: Apple Inc.

Inventor： Jason Hau-Ping Chen ,  Brandon Dean Slack ,  David I. Simon

IPC: H04N5/232

CPC classification number: H04N5/23261 ,  H04N5/23248 ,  H04N5/23293

Abstract: Methods and apparatuses are disclosed to correct for tilt and/or perspective distortion in image capture devices. In some embodiments, the method may include reading an orientation measurement associated with a relative position of an image capture device with respect to an object, determining if the orientation measurement is less than a threshold, and in the event that the orientation measurement is less than the threshold, correcting an image obtained by the image capture device. In some embodiments, the apparatus may include an image sensor, a memory coupled to the image sensor, an orientation measurement device coupled to the image sensor, and a distance measurement device coupled to the image sensor, where the image data may be stored in the memory along with a measurement from the accelerometer and along with a measurement from the distance measurement device.

Abstract translation: 公开了用于校正图像捕获装置中的倾斜和/或透视失真的方法和装置。 在一些实施例中，该方法可以包括读取与图像捕获装置相对于对象的相对位置相关联的取向测量，确定取向测量是否小于阈值，以及在取向测量小于 阈值，校正由图像捕获装置获得的图像。 在一些实施例中，该装置可以包括图像传感器，耦合到图像传感器的存储器，耦合到图像传感器的取向测量装置以及耦合到图像传感器的距离测量装置，其中可以将图像数据存储在 存储器以及来自加速度计的测量以及距离测量装置的测量值。