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1.

发明公开
DATA CORRUPTION TRACKING FOR MEMORY RELIABILITY 审中-公开

公开(公告)号：EP4473413A1

公开(公告)日：2024-12-11

申请号：EP23750057.4

申请日：2023-01-12

Applicant: Apple Inc.

Inventor： NEMATI, Farid , HUTSELL, Steven R. , MATHEWS, Gregory S. , CHEN, Yi Chun , WONG, Kevin C. , BANSAL, Kalpana , KUMAR, Derek R. , SEMERIA, Bernard J. , VASH, James , NANGIA, Era K.

IPC: G06F11/10 , G06F13/16 , G06F9/30

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