METHODS AND SYSTEMS FOR MICROSCOPY
    1.
    发明公开

    公开(公告)号:US20240280805A1

    公开(公告)日:2024-08-22

    申请号:US18112876

    申请日:2023-02-22

    CPC classification number: G02B27/0025 G02B13/0095 G02B21/02

    Abstract: The presently disclosed subject matter provides a method for aligning an objective and a pupil relay module of a microscope. The objective is configured to introduce an objective aberration component and the pupil relay module is configured to have a corresponding pupil relay module aberration component such that the pupil relay module aberration component compensates said objective aberration component when the pupil relay module is accurately aligned with the objective. The method comprises: (a) measuring a combined aberration indicator indicative of a combined aberration resulting from the optical combination of the objective and pupil relay module; (b) adjusting an optical alignment of the objective and pupil relay module based on the measured combined aberration indicator; (c) iterating (a) and (b) until the measured combined aberration indicator reaches a predetermined combined aberration indicator target thereby achieving accurate alignment.

Patent Agency Ranking